Patents by Inventor Brad Van Roosendaal

Brad Van Roosendaal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for testing a memory for a memory failure exhibited by a failing memory
    Patent number: 7484142
    Abstract: A system and method for testing a memory under test on automated test equipment (ATE) that includes capturing operating conditions for a memory exhibiting a memory failure in a sequence of records corresponding the operating conditions over a period of time that includes the occurrence of the memory failure and further includes executing a software translation module to generate a file of test vectors from the sequence of records that when executed by the ATE reproduce the operating condition over the sampled period of time. The memory under test is tested according to the file of test vectors for the ATE.
    Type: Grant
    Filed: May 11, 2006
    Date of Patent: January 27, 2009
    Assignee: Micron Technology, Inc.
    Inventors: Valerie Crump, Brad Van Roosendaal
  • System and method for testing a memory for a memory failure exhibited by a failing memory
    Patent number: 7353437
    Abstract: A system and method for testing a memory under test on automated test equipment (ATE) that includes capturing operating conditions for a memory exhibiting a memory failure in a sequence of records corresponding the operating conditions over a period of time that includes the occurrence of the memory failure and further includes executing a software translation module to generate a file of test vectors from the sequence of records that when executed by the ATE reproduce the operating condition over the sampled period of time. The memory under test is tested according to the file of test vectors for the ATE.
    Type: Grant
    Filed: October 29, 2004
    Date of Patent: April 1, 2008
    Assignee: Micron Technology, Inc.
    Inventors: Valerie Crump, Brad Van Roosendaal
  • System and method for testing a memory for a memory failure exhibited by a failing memory
    Publication number: 20060107132
    Abstract: A system and method for testing a memory under test on automated test equipment (ATE) that includes capturing operating conditions for a memory exhibiting a memory failure in a sequence of records corresponding the operating conditions over a period of time that includes the occurrence of the memory failure and further includes executing a software translation module to generate a file of test vectors from the sequence of records that when executed by the ATE reproduce the operating condition over the sampled period of time. The memory under test is tested according to the file of test vectors for the ATE.
    Type: Application
    Filed: October 29, 2004
    Publication date: May 18, 2006
    Inventors: Valerie Crump, Brad Van Roosendaal