Patents by Inventor Bradley C. Dodrill

Bradley C. Dodrill has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Magnetic property characterization system employing a single sensing coil arrangement to measure both AC susceptibility and DC magnetization
    Patent number: 5506500
    Abstract: A coil arrangement having a primary and two balanced secondaries is used to measure ac susceptibility and, using sample movement, also to perform absolute dc moment measurements. Since the same coil arrangement is used for both AC and DC measurements, the measurements can be made successively within a cryogenic chamber without removing the sample. This is a big advantage, because the changed conditions associated with removing and replacing a sample between measurements can cause confusing, uncorrelated results. A high speed voltmeter is used to perform the signal analysis for the moment measurement. The system can be configured to yield high resolution dc moment measurements to 25 ppm and sensitivities to better than 5.times.10.sup.-5 emu.
    Type: Grant
    Filed: April 22, 1994
    Date of Patent: April 9, 1996
    Assignee: Lake Shore Cryotronics, Inc.
    Inventors: John K. Krause, Victor Wang, Bradley C. Dodrill
  • Magnetic property characterization system employing a single sensing coil arrangement to measure AC susceptibility and DC moment of a sample
    Patent number: 5311125
    Abstract: A sensing coil arrangement including a pair of sensing coils connected in opposition is used to measure AC susceptibility and, using sample movement and a DC magnetization field source, also to sense signals for absolute DC moment measurements. Since the same sensing coil arrangement is used for both AC and DC measurements, the measurements can be made successively in situ without removing the sample from a sample space (e.g., within a cryogenic chamber). This is a big advantage, because the changed conditions associated with removing and replacing a sample between measurements can cause confusing, uncorrelated results. A high speed voltmeter is used to perform the signal analysis for the moment measurement. The system can be configured to yield high resolution DC moment measurements to 25 ppm and sensitivities to better than 5.times.10.sup.-5 emu.
    Type: Grant
    Filed: March 18, 1992
    Date of Patent: May 10, 1994
    Assignee: Lake Shore Cryotronics, Inc.
    Inventors: John K. Krause, Victor Wang, Bradley C. Dodrill
  • Thermometry employing gallium aluminum arsenide diode sensor
    Patent number: 4643589
    Abstract: A thermometer is described having a broad voltage-temperature characteristic rendering it useful in making temperature measurements from below 1.degree. K. to above 500.degree. K. The thermometer employs a gallium aluminum arsenide diode and displays improved sensitivity over more conventional diode devices. In addition to providing for improved polynomial fitting for calibration curve purposes, the diode also exhibits an advantageously low magnetic field dependence.
    Type: Grant
    Filed: August 9, 1985
    Date of Patent: February 17, 1987
    Assignee: Lake Shore Cryotronics, Inc.
    Inventors: John K. Krause, Bradley C. Dodrill