Patents by Inventor Bradley D. Pace

Bradley D. Pace has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for testing integrated circuit devices
    Patent number: 6392423
    Abstract: The present invention is directed to a method and apparatus for testing integrated circuit package devices using automatic testing equipment. The automatic testing equipment may be provided with a light source to enable the testing of image capture type integrated circuit devices. Alternatively, the automatic testing equipment may be provided with an imaging device, e.g., a camera, or both an imaging device and a light source to additionally enable the testing of display type integrated circuit devices.
    Type: Grant
    Filed: March 21, 2001
    Date of Patent: May 21, 2002
    Assignee: Agilent Technologies, Inc.
    Inventors: Bradley D. Pace, Durbin L. Seidel, William Richard Lawrence
  • Method for testing integrated circuit devices
    Publication number: 20010019275
    Abstract: The present invention is directed to a method and apparatus for testing integrated circuit package devices using automatic testing equipment. The automatic testing equipment may be provided with a light source to enable the testing of image capture type integrated circuit devices. Alternatively, the automatic testing equipment may be provided with an imaging device, e.g., a camera, or both an imaging device and a light source to additionally enable the testing of display type integrated circuit devices.
    Type: Application
    Filed: March 21, 2001
    Publication date: September 6, 2001
    Inventors: Bradley D. Pace, Durbin L. Seidel, William Richard Lawrence
  • Apparatus and method for testing integrated circuit devices
    Patent number: 6285200
    Abstract: The present invention is directed to a method and apparatus for testing integrated circuit package devices using automatic testing equipment. The automatic testing equipment may be provided with a light source to enable the testing of image capture type integrated circuit devices. Alternatively, the automatic testing equipment may be provided with an imaging device, e.g., a camera, or both an imaging device and a light source to additionally enable the testing of display type integrated circuit devices.
    Type: Grant
    Filed: March 2, 1998
    Date of Patent: September 4, 2001
    Assignee: Agilent Technologies, Inc.
    Inventors: Bradley D. Pace, Durbin L. Seidel, William Richard Lawrence
  • Differential CMOS logic family
    Patent number: 6008670
    Abstract: Disclosed herein is a differential CMOS cell that achieves faster switching speeds than conventional CMOS logic by 1) biasing a differential pair of output nodes to a relatively high logic low voltage threshold, and 2) pulling up the differential pair of output nodes to a logic high voltage level. The differential CMOS cell is designed such that the difference between logic low and logic high voltage thresholds is much less than in traditional CMOS circuits (i.e., approximately 0.8 V-1.0 V as compared to 2.6 V). A lower voltage swing allows for fast switching of a differential output signal. In a preferred embodiment, the differential CMOS cell receives a primary differential input signal, and respective first and second secondary differential input signals.
    Type: Grant
    Filed: August 19, 1997
    Date of Patent: December 28, 1999
    Assignee: Hewlett-Packard
    Inventors: Bradley D. Pace, Barbara J. Duffner, Holger Engelhard