Patents by Inventor Bradley D. Pepper

Bradley D. Pepper has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Real-time rule engine for adaptive testing of integrated circuits
    Patent number: 9336109
    Abstract: A method of testing a device is disclosed. Test data is obtained for a device testing program that tests the device. An adaptation command for testing the device is determined at an adaptive testing engine using obtained test data. The adaptation command is sent from the adaptive testing engine to a tool control application. The tool control application uses the adaptation command to control an operation related to the testing of the device.
    Type: Grant
    Filed: February 26, 2013
    Date of Patent: May 10, 2016
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: David E. Atkinson, Matthew S. Grady, Donald L. LaCroix, David B. Lutton, II, Bradley D. Pepper, Randolph P. Steel
  • Real-time rule engine for adaptive testing of integrated circuits
    Patent number: 9311201
    Abstract: A method of testing a device is disclosed. Test data is obtained for a device testing program that tests the device. An adaptation command for testing the device is determined at an adaptive testing engine using obtained test data. The adaptation command is sent from the adaptive testing engine to a tool control application. The tool control application uses the adaptation command to control an operation related to the testing of the device.
    Type: Grant
    Filed: August 22, 2012
    Date of Patent: April 12, 2016
    Assignee: International Business Machines Corporation
    Inventors: David E. Atkinson, Matthew S. Grady, Donald L. LaCroix, David B. Lutton, II, Bradley D. Pepper, Randolph P. Steel
  • Integrated circuit test optimization using adaptive test pattern sampling algorithm
    Patent number: 8689066
    Abstract: A method of implementing integrated circuit device testing includes performing baseline testing of a first group of chips using a full set of test patterns, and for chip identified as failing, determining, a score for each test pattern in the full set. The score is indicative of an ability of the test pattern to uniquely identify a failing chip with respect to other test patterns. Following the baseline testing, streamlined testing on a second group of chips is performed, using a reduced set of the test patterns having highest average scores as determined by the baseline testing. Following the streamlined testing, full testing on a third group of chips is performed using the full set of test patterns, and updating the average score for each pattern. Further testing alternates between the streamlined testing and the full testing for additional groups of chips.
    Type: Grant
    Filed: June 29, 2011
    Date of Patent: April 1, 2014
    Assignee: International Business Machines Corporation
    Inventors: Matthew S. Grady, Mark C. Johnson, Bradley D. Pepper, Dean G. Percy, Joseph C. Pranys
  • REAL-TIME RULE ENGINE FOR ADAPTIVE TESTING OF INTEGRATED CIRCUITS
    Publication number: 20140059382
    Abstract: A method of testing a device is disclosed. Test data is obtained for a device testing program that tests the device. An adaptation command for testing the device is determined at an adaptive testing engine using obtained test data. The adaptation command is sent from the adaptive testing engine to a tool control application. The tool control application uses the adaptation command to control an operation related to the testing of the device.
    Type: Application
    Filed: August 22, 2012
    Publication date: February 27, 2014
    Applicant: International Business Machines Corporation
    Inventors: David E. Atkinson, Matthew S. Grady, Donald L. LaCroix, David B. Lutton, II, Bradley D. Pepper, Randolph P. Steel
  • REAL-TIME RULE ENGINE FOR ADAPTIVE TESTING OF INTEGRATED CIRCUITS
    Publication number: 20140059386
    Abstract: A method of testing a device is disclosed. Test data is obtained for a device testing program that tests the device. An adaptation command for testing the device is determined at an adaptive testing engine using obtained test data. The adaptation command is sent from the adaptive testing engine to a tool control application. The tool control application uses the adaptation command to control an operation related to the testing of the device.
    Type: Application
    Filed: February 26, 2013
    Publication date: February 27, 2014
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: David E. Atkinson, Matthew S. Grady, Donald L. LaCroix, David B. Lutton, II, Bradley D. Pepper, Randolph P. Steel
  • INTEGRATED CIRCUIT TEST OPTIMIZATION USING ADAPTIVE TEST PATTERN SAMPLING ALGORITHM
    Publication number: 20130007546
    Abstract: A method of implementing integrated circuit device testing includes performing baseline testing of a first group of chips using a full set of test patterns, and for chip identified as failing, determining, a score for each test pattern in the full set. The score is indicative of an ability of the test pattern to uniquely identify a failing chip with respect to other test patterns. Following the baseline testing, streamlined testing on a second group of chips is performed, using a reduced set of the test patterns having highest average scores as determined by the baseline testing. Following the streamlined testing, full testing on a third group of chips is performed using the full set of test patterns, and updating the average score for each pattern. Further testing alternates between the streamlined testing and the full testing for additional groups of chips.
    Type: Application
    Filed: June 29, 2011
    Publication date: January 3, 2013
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Matthew S. Grady, Mark C. Johnson, Bradley D. Pepper, Dean G. Percy, Joseph C. Pranys