Patents by Inventor Brandon Barnett

Brandon Barnett has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20150212032
    Abstract: Described are devices and methods for detecting the match quality and concentration of analytes binding to an electrode surface. The devices utilize a clock to measure capacitance change as a function of time and a temperature controller to measure the capacitance change as a function of temperature.
    Type: Application
    Filed: April 3, 2015
    Publication date: July 30, 2015
    Inventors: Gordon HOLT, Hernan CASTRO, Brandon BARNETT
  • Patent number: 9085461
    Abstract: A wafer having a plurality of dies (also called array chips) on the wafer, the die having an electrode to generate a deprotecting reagent, a working electrode to electrochemically synthesize a material, a confinement electrode adjacent to the working electrode to confine reactive reagents, and a die pad, wherein die pads of the plurality of dies are interconnected on the wafer to electrochemically synthesize the material in parallel on a plurality of working electrodes is disclosed. Also, a method for wafer-scale manufacturing of a plurality of dies and a method for electrochemically synthesizing a material in parallel on a plurality of dies on a wafer are disclosed.
    Type: Grant
    Filed: May 16, 2012
    Date of Patent: July 21, 2015
    Assignee: INTEL CORPORATION
    Inventors: Valery M. Dubin, Florian Gstrein, Gordon D. Holt, Brandon Barnett
  • Patent number: 8999724
    Abstract: Described are devices and methods for detecting the match quality and concentration of analytes binding to an electrode surface. The devices utilize a clock to measure capacitance change as a function of time and a temperature controller to measure the capacitance change as a function of temperature.
    Type: Grant
    Filed: December 28, 2006
    Date of Patent: April 7, 2015
    Assignee: Intel Corporation
    Inventors: Gordon Holt, Hernan Castro, Brandon Barnett
  • Patent number: 8614086
    Abstract: Described are quality control methods and devices for the reproducible manufacturing and integrity monitoring of polymers on electrochemical synthesis and detection chips. The devices and methods allow for simultaneous manufacturing and synthesis of polymers.
    Type: Grant
    Filed: December 28, 2006
    Date of Patent: December 24, 2013
    Assignee: Intel Corporation
    Inventors: Gordon Holt, Ghadeer Antanius, Brandon Barnett
  • Publication number: 20130186767
    Abstract: Described are devices and methods for detecting binding on an electrode surface. In addition, devices and methods for electrochemically synthesizing polymers and devices and methods for synthesizing and detecting binding to the polymer on a common integrated device surface are described.
    Type: Application
    Filed: December 22, 2012
    Publication date: July 25, 2013
    Inventors: Hernan Adolfo CASTRO, Gordon Holt, Brandon Barnett, Handong Li, Narayan Sundararajan, Wei Wang
  • Patent number: 8486631
    Abstract: Described are quality control methods and devices for the reproducible manufacturing and integrity monitoring of polymers on electrochemical synthesis and detection chips. The devices and methods allow for simultaneous manufacturing and synthesis of polymers.
    Type: Grant
    Filed: July 15, 2011
    Date of Patent: July 16, 2013
    Assignee: Intel Corporation
    Inventors: Gordon Holt, Ghadeer Antanius, Brandon Barnett
  • Patent number: 8338097
    Abstract: Described are devices and methods for detecting binding on an electrode surface. In addition, devices and methods for electrochemically synthesizing polymers and devices and methods for synthesizing and detecting binding to the polymer on a common integrated device surface are described.
    Type: Grant
    Filed: March 14, 2011
    Date of Patent: December 25, 2012
    Assignee: Intel Corporation
    Inventors: Hernan Castro, Gordon Holt, Brandon Barnett, Handong Li, Narayan Sundararajan, Wei Wang
  • Patent number: 8278121
    Abstract: A wafer having a plurality of dies (also called array chips) on the wafer, the die having an electrode to generate a deprotecting reagent, a working electrode to electrochemically synthesize a material, a confinement electrode adjacent to the working electrode to confine reactive reagents, and a die pad, wherein die pads of the plurality of dies are interconnected on the wafer to electrochemically synthesize the material in parallel on a plurality of working electrodes is disclosed. Also, a method for wafer-scale manufacturing of a plurality of dies and a method for electrochemically synthesizing a material in parallel on a plurality of dies on a wafer are disclosed.
    Type: Grant
    Filed: September 23, 2011
    Date of Patent: October 2, 2012
    Assignee: Intel Corporation
    Inventors: Valery M. Dubin, Florian Gstrein, Gordon D. Holt, Brandon Barnett
  • Publication number: 20120225512
    Abstract: A wafer having a plurality of dies (also called array chips) on the wafer, the die having an electrode to generate a deprotecting reagent, a working electrode to electrochemically synthesize a material, a confinement electrode adjacent to the working electrode to confine reactive reagents, and a die pad, wherein die pads of the plurality of dies are interconnected on the wafer to electrochemically synthesize the material in parallel on a plurality of working electrodes is disclosed. Also, a method for wafer-scale manufacturing of a plurality of dies and a method for electrochemically synthesizing a material in parallel on a plurality of dies on a wafer are disclosed.
    Type: Application
    Filed: May 16, 2012
    Publication date: September 6, 2012
    Inventors: Valery M. Dubin, Florian Gstrein, Gordon D. Holt, Brandon Barnett
  • Publication number: 20120070930
    Abstract: A wafer having a plurality of dies (also called array chips) on the wafer, the die having an electrode to generate a deprotecting reagent, a working electrode to electrochemically synthesize a material, a confinement electrode adjacent to the working electrode to confine reactive reagents, and a die pad, wherein die pads of the plurality of dies are interconnected on the wafer to electrochemically synthesize the material in parallel on a plurality of working electrodes is disclosed. Also, a method for wafer-scale manufacturing of a plurality of dies and a method for electrochemically synthesizing a material in parallel on a plurality of dies on a wafer are disclosed.
    Type: Application
    Filed: September 23, 2011
    Publication date: March 22, 2012
    Inventors: Valery M. DuBin, Florian Gstrein, Gordon D. Holt, Brandon Barnett
  • Publication number: 20110315559
    Abstract: Described are quality control methods and devices for the reproducible manufacturing and integrity monitoring of polymers on electrochemical synthesis and detection chips. The devices and methods allow for simultaneous manufacturing and synthesis of polymers.
    Type: Application
    Filed: July 15, 2011
    Publication date: December 29, 2011
    Inventors: Gordon Holt, Ghadeer Antanius, Brandon Barnett
  • Patent number: 8053774
    Abstract: A wafer having a plurality of dies (also called array chips) on the wafer, the die having an electrode to generate a deprotecting reagent, a working electrode to electrochemically synthesize a material, a confinement electrode adjacent to the working electrode to confine reactive reagents, and a die pad, wherein die pads of the plurality of dies are interconnected on the wafer to electrochemically synthesize the material in parallel on a plurality of working electrodes is disclosed. Also, a method for wafer-scale manufacturing of a plurality of dies and a method for electrochemically synthesizing a material in parallel on a plurality of dies on a wafer are disclosed.
    Type: Grant
    Filed: June 6, 2005
    Date of Patent: November 8, 2011
    Assignee: Intel Corporation
    Inventors: Valery M. Dubin, Florian Gstrein, Gordon D. Holt, Brandon Barnett
  • Publication number: 20110224092
    Abstract: Described are devices and methods for detecting binding on an electrode surface. In addition, devices and methods for electrochemically synthesizing polymers and devices and methods for synthesizing and detecting binding to the polymer on a common integrated device surface are described.
    Type: Application
    Filed: March 14, 2011
    Publication date: September 15, 2011
    Applicant: INTEL CORPORATION
    Inventors: Hernan Adolfo CASTRO, Gordon Holt, Brandon Barnett, Handong Li, Narayan Sundararajan, Wei Wang
  • Patent number: 7923237
    Abstract: Described are devices and methods for detecting binding on an electrode surface. In addition, devices and methods for electrochemically synthesizing polymers and devices and methods for synthesizing and detecting binding to the polymer on a common integrated device surface are described.
    Type: Grant
    Filed: December 28, 2006
    Date of Patent: April 12, 2011
    Assignee: Intel Corporation
    Inventors: Hernan Adolfo Castro, Gordon Holt, Brandon Barnett, Handong Li, Narayan Sundararajan, Wei Wang
  • Publication number: 20100261287
    Abstract: Described are devices and methods for detecting the match quality and concentration of analytes binding to an electrode surface. The devices utilize a clock to measure capacitance change as a function of time and a temperature controller to measure the capacitance change as a function of temperature.
    Type: Application
    Filed: December 28, 2006
    Publication date: October 14, 2010
    Inventors: Gordon Holt, Hernan Castro, Brandon Barnett
  • Publication number: 20100248209
    Abstract: The embodiments of the invention relate to a device having a first substrate comprising a transistor; a second substrate; an insulating layer in between and adjoining the first and second substrates; and an opening within the second substrate, the opening being aligned with the transistor; wherein the transistor is configured to detect an electrical charge change within the opening. Other embodiments relate to a method including providing a substrate comprising a first part, a second part, and an insulating layer in between and adjoining the first and second parts; fabricating a transistor on the first part; and fabricating an opening within the second part, the opening being aligned with the transistor; wherein the transistor is configured to detect an electrical charge change within the opening.
    Type: Application
    Filed: June 30, 2006
    Publication date: September 30, 2010
    Inventors: Suman Datta, Shriram Ramanathan, Jack T. Kavalieros, Justin K. Brask, Brandon Barnett
  • Publication number: 20080157786
    Abstract: Described are quality control methods and devices for the reproducible manufacturing and integrity monitoring of polymers on electrochemical synthesis and detection chips. The devices and methods allow for simultaneous manufacturing and synthesis of polymers.
    Type: Application
    Filed: December 28, 2006
    Publication date: July 3, 2008
    Inventors: Gordon Holt, Ghadeer Antanius, Brandon Barnett
  • Publication number: 20080160635
    Abstract: Described are devices and methods for detecting binding on an electrode surface. In addition, devices and methods for electrochemically synthesizing polymers and devices and methods for synthesizing and detecting binding to the polymer on a common integrated device surface are described.
    Type: Application
    Filed: December 28, 2006
    Publication date: July 3, 2008
    Applicant: Intel Corporation
    Inventors: Hernan Adolfo Castro, Gordon Holt, Brandon Barnett, Handong Li, Narayan Sundararajan, Wei Wang
  • Patent number: 7387607
    Abstract: A monitoring device having a signal receiver, a pseudo-ground, a digital processor and a transceiver, the signal receiver having an ability to receive a sensed signal representing a patient vital sign, the pseudo-ground having an ability to generate a baseline signal that is compared with the sensed signal, the transceiver having an ability to wirelessly transmit a processed signal from the digital processor to a base station or a wireless gateway and to receive an incoming signal from the base station or the wireless gateway, and the digital processor having an ability to process the sensed signal and the incoming signal locally within the monitoring device is disclosed.
    Type: Grant
    Filed: June 6, 2005
    Date of Patent: June 17, 2008
    Assignee: Intel Corporation
    Inventors: Gordon D. Holt, Brandon Barnett, Richard Wykoff, Sorin Davidovici, Xiao-Feng Qi
  • Publication number: 20060275927
    Abstract: A wafer having a plurality of dies (also called array chips) on the wafer, the die having an electrode to generate a deprotecting reagent, a working electrode to electrochemically synthesize a material, a confinement electrode adjacent to the working electrode to confine reactive reagents, and a die pad, wherein die pads of the plurality of dies are interconnected on the wafer to electrochemically synthesize the material in parallel on a plurality of working electrodes is disclosed. Also, a method for wafer-scale manufacturing of a plurality of dies and a method for electrochemically synthesizing a material in parallel on a plurality of dies on a wafer are disclosed.
    Type: Application
    Filed: June 6, 2005
    Publication date: December 7, 2006
    Applicant: Intel Corporation
    Inventors: Valery Dubin, Florian Gstrein, Gordon Holt, Brandon Barnett