Abstract: A system is provided for maintaining a safe operating area while also providing a suitable forward bias voltage to drive a laser diode. The system can monitor a voltage that is applied to a laser diode driver using a threshold that is based on the fabrication process of the laser diode driver. For example, a system can utilize a first threshold for a laser diode driver that is fabricated utilizing a 10 nm process and utilize a second threshold for another laser diode driver that is fabricated utilizing a 20 nm process. The threshold can also be based on a color of the laser or a desired operation mode. The system can monitor a voltage applied to a laser diode using different thresholds while controlling a bleed current to ensure that the laser diode is forward biased while mitigating the risk of silicon breakdown of the laser diode driver.

Abstract: Technologies are described herein for a two-wire power delivery system that may be employed by a mobile device with a reversable cable. The described techniques allow for the two-wire power cable to be inserted in any orientation into the mobile device, without requiring a special keying or registration element, and without requiring any additional pins or wires. The mobile device includes a passive protection circuit that assists the two-wire power cable system in detecting the correct orientation for power delivery.

Abstract: Technologies are described herein for a two-wire power delivery system that may be employed by a mobile device with a reversable cable. The described techniques allow for the two-wire power cable to be inserted in any orientation into the mobile device, without requiring a special keying or registration element, and without requiring any additional pins or wires. The mobile device includes a passive protection circuit that assists the two-wire power cable system in detecting the correct orientation for power delivery.

Abstract: A system is provided for maintaining a safe operating area while also providing a suitable forward bias voltage to drive a laser diode. The system can monitor a voltage that is applied to a laser diode driver using a threshold that is based on the fabrication process of the laser diode driver. For example, a system can utilize a first threshold for a laser diode driver that is fabricated utilizing a 10 nm process and utilize a second threshold for another laser diode driver that is fabricated utilizing a 20 nm process. The threshold can also be based on a color of the laser or a desired operation mode. The system can monitor a voltage applied to a laser diode using different thresholds while controlling a bleed current to ensure that the laser diode is forward biased while mitigating the risk of silicon breakdown of the laser diode driver.

Abstract: Examples are disclosed herein related to controlling a scanning display system. One example provides a display device comprising a light source, a scanning mirror system configured to scan light from the light source, and a controller configured to control the scanning mirror system to scan the light by synthesizing in a time domain a mirror control waveform that comprises a linear scan portion and a retrace portion stitched to the linear scan portion, the mirror control waveform being continuous and having an arbitrary timing that is adjustable by the controller between scan cycles.

Abstract: Examples are disclosed herein related to controlling a scanning display system. One example provides a display device comprising a light source, a scanning mirror system configured to scan light from the light source, and a controller configured to control the scanning mirror system to scan the light by synthesizing in a time domain a mirror control waveform that comprises a linear scan portion and a retrace portion stitched to the linear scan portion, the mirror control waveform being continuous and having an arbitrary timing that is adjustable by the controller between scan cycles.