Abstract: A test module is provided for testing system modules. All the test circuitry and test connectors reside on the test module. The test module is coupled to the system modules during testing, and is removed from the system after testing. Test connectors and test circuitry on the test module support such test functions as voltage margining, CPU emulation, and JTAG boundary scanning. A JTAG selection function can also be provided for selecting one or more JTAG loops for testing individually or as a single loop. The test module further includes level shifters for converting between 3.3V and 1.2V.

Abstract: A computer system for managing a computer network comprises a rack cabinet having a cabinet interior. A plurality of infrastructure connector assemblies are fixedly mounted on the rack cabinet in 1-U boundaries, each infrastructure connector assembly including a signal snap interface connector and a power snap interface connector. A plurality of compute elements are adapted to be slidably disposed within the cabinet interior of the rack cabinet in a stacked relationship, each compute element including at least one infrastructure connector assembly which releasably snap-interconnects with an associated infrastructure connector assembly mounted on the rack cabinet. A distributed power bay is disposed within the rack cabinet and provides central power for the computer system. A rack manager is disposed within the rack cabinet and includes the central video and I/O devices for the computer system.