Patents by Inventor Brandon David See

Brandon David See has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11937020
    Abstract: An object inspection system and a method for detecting defects which utilizes a plurality of cameras and lights to capture images of a portion of an object and which uses the captured images to determine the presence of a defect upon a surface, such as surface, of the object and which may communicated the location of the identified defect to an automated defect repair assembly.
    Type: Grant
    Filed: March 16, 2022
    Date of Patent: March 19, 2024
    Assignee: Inovision Software Solutions, Inc.
    Inventors: Jacob Nathaniel Allen, Zhipeng Liang, Brandon David See, Frank Damacio Luna
  • Publication number: 20220264057
    Abstract: An object inspection system and a method for detecting defects which utilizes a plurality of cameras and lights to capture images of a portion of an object and which uses the captured images to determine the presence of a defect upon a surface, such as surface, of the object and which may communicated the location of the identified defect to an automated defect repair assembly.
    Type: Application
    Filed: March 16, 2022
    Publication date: August 18, 2022
    Inventors: Jacob Nathaniel Allen, Zhipeng Liang, Brandon David See, Frank Damacio Luna
  • Patent number: 11310467
    Abstract: An object inspection system and a method for detecting defects which utilizes a plurality of cameras and lights to capture images of a portion of an object and which uses the captured images to determine the presence of a defect upon a surface, such as surface, of the object and which may communicated the location of the identified defect to an automated defect repair assembly.
    Type: Grant
    Filed: May 4, 2020
    Date of Patent: April 19, 2022
    Assignee: INOVISION SOFTWARE SOLUTIONS, INC.
    Inventors: Jacob Nathaniel Allen, Zhipeng Liang, Brandon David See, Frank Damacio Luna
  • Publication number: 20200344449
    Abstract: An object inspection system and a method for detecting defects which utilizes a plurality of cameras and lights to capture images of a portion of an object and which uses the captured images to determine the presence of a defect upon a surface, such as surface, of the object and which may communicated the location of the identified defect to an automated defect repair assembly.
    Type: Application
    Filed: May 4, 2020
    Publication date: October 29, 2020
    Inventors: Jacob Nathaniel Allen, Zhipeng Liang, Brandon David See, Frank Damacio Luna
  • Publication number: 20190238796
    Abstract: An object inspection system 10 and a method for detecting defects which utilizes a plurality of cameras 26 and lights 18 to capture images of a portion of an object 14 and which uses the captured images to determine the presence of a defect upon a surface, such as surface 12, of the object 14 and which may communicated the location of the identified defect to an automated defect repair assembly 9.
    Type: Application
    Filed: May 9, 2018
    Publication date: August 1, 2019
    Inventors: Jacob Nathaniel Allen, Brandon David See, Frank Damacio Luna, Zhipeng Liang
  • Publication number: 20190096057
    Abstract: An object inspection system 10 and a method for detecting defects which utilizes a plurality of cameras 26 and lights 18 to capture images of a portion of an object 14 and which uses the captured images to determine the presence of a defect upon a surface, such as surface 12, of the object 14 and which may communicated the location of the identified defect to an automated defect repair assembly 9.
    Type: Application
    Filed: May 9, 2018
    Publication date: March 28, 2019
    Inventors: Jacob Nathaniel Allen, Brandon David See, Zhipeng Liang, Frank Damacio Luna
  • Publication number: 20170277979
    Abstract: A light is shined on a specular surface of an inspected object at a fixed position. Light is reflected directly from the surface into a fixed camera. Multiple images are taken as the light source moves. Images are fused into a single image. This invention takes a single image and generates several defect detection images using several distinct image processing sequences. Each defect detection image alone could be used to identify when defects are located under a camera pixel, but the several images are combined to create a feature vector that can be used as an input to a pattern classifier. The pattern classifier may be trained to achieve superior defect detection results by combining several detection images.
    Type: Application
    Filed: March 22, 2016
    Publication date: September 28, 2017
    Applicant: INOVISION SOFTWARE SOLUTIONS, INC.
    Inventors: Jacob Nathaniel Allen, Brandon David See, Patrick Kerry Krawec