Abstract: There is provided a system and method for automatically calibrating a temperature sensor. More specifically, there is provided a system including a temperature sensor that includes a first resistance configured to indicate a temperature of the temperature sensor and a second resistance, in series with the first resistor, wherein the second resistance is adjustable to calibrate the first resistance, and a calibration circuit, coupled to the temperature sensor and configured to automatically calibrate the first resistance.

Abstract: Apparatus, systems, and methods disclosed herein may initialize a delay-locked loop (DLL) or phase-locked loop (PLL) to achieve a locked condition and may then initiate a quiescent mode of operation. Quiescent operation may be achieved by breaking a feedback loop associated with the DLL or PLL to prevent updates to a variable delay line associated with the DLL and/or to a variable frequency oscillator associated with the PLL. An output clock phase associated with the DLL or PLL may thus be held substantially constant following a DLL initialization period. Additional embodiments are disclosed and claimed.

Abstract: This disclosure relates to delay line test circuits and methods. In one aspect, an integrated circuit (IC) can include a plurality of delay lines, a selection circuit, a delay comparison circuit, and a control circuit. The plurality of delay lines can generate a plurality of delayed clock signals, and the selection circuit can include a plurality of inputs configured to receive at least the plurality of delayed clock signals. The selection circuit can generate a first output clock signal and a second output clock signal by selecting amongst signals received at the plurality of inputs based on a state of a selection control signal. The delay comparison circuit can compare a delay of the first output clock signal to a delay of the second output clock signal and can generate a delay comparison such as a pass/fail flag based on the result. The control circuit can generate the selection control signal.

Abstract: There is provided a system and method for automatically calibrating a temperature sensor. More specifically, there is provided a system including a temperature sensor that includes a first resistance configured to indicate a temperature of the temperature sensor and a second resistance, in series with the first resistor, wherein the second resistance is adjustable to calibrate the first resistance, and a calibration circuit, coupled to the temperature sensor and configured to automatically calibrate the first resistance.

Abstract: This disclosure relates to delay line test circuits and methods. In one aspect, an integrated circuit (IC) can include a plurality of delay lines, a selection circuit, a delay comparison circuit, and a control circuit. The plurality of delay lines can generate a plurality of delayed clock signals, and the selection circuit can include a plurality of inputs configured to receive at least the plurality of delayed clock signals. The selection circuit can generate a first output clock signal and a second output clock signal by selecting amongst signals received at the plurality of inputs based on a state of a selection control signal. The delay comparison circuit can compare a delay of the first output clock signal to a delay of the second output clock signal and can generate a delay comparison such as a pass/fail flag based on the result. The control circuit can generate the selection control signal.

Abstract: There is provided a system and method for automatically calibrating a temperature sensor. More specifically, there is provided a system including a temperature sensor that includes a first resistance configured to indicate a temperature of the temperature sensor and a second resistance, in series with the first resistor, wherein the second resistance is adjustable to calibrate the first resistance, and a calibration circuit, coupled to the temperature sensor and configured to automatically calibrate the first resistance.

Abstract: Apparatus, systems, and methods disclosed herein may initialize a delay-locked loop (DLL) or phase-locked loop (PLL) to achieve a locked condition and may then initiate a quiescent mode of operation. Quiescent operation may be achieved by breaking a feedback loop associated with the DLL or PLL to prevent updates to a variable delay line associated with the DLL and/or to a variable frequency oscillator associated with the PLL. An output clock phase associated with the DLL or PLL may thus be held substantially constant following a DLL initialization period. Additional embodiments are disclosed and claimed.

Abstract: Apparatus, systems, and methods disclosed herein may initialize a delay-locked loop (DLL) or phase-locked loop (PLL) to achieve a locked condition and may then initiate a quiescent mode of operation. Quiescent operation may be achieved by breaking a feedback loop associated with the DLL or PLL to prevent updates to a variable delay line associated with the DLL and/or to a variable frequency oscillator associated with the PLL. An output clock phase associated with the DLL or PLL may thus be held substantially constant following a DLL initialization period. Additional embodiments are disclosed and claimed.

Abstract: There is provided a system and method for automatically calibrating a temperature sensor. More specifically, there is provided a system including a temperature sensor that includes a first resistance configured to indicate a temperature of the temperature sensor and a second resistance, in series with the first resistor, wherein the second resistance is adjustable to calibrate the first resistance, and a calibration circuit, coupled to the temperature sensor and configured to automatically calibrate the first resistance.

Abstract: There is provided a system and method for automatically calibrating a temperature sensor. More specifically, there is provided a system made up of a temperature sensor which includes a first resistance configured to indicate a temperature of the temperature sensor and a second resistance, in series with the first resistor, wherein the second resistance is adjustable to calibrate the first resistance, and a calibration circuit, coupled to the temperature sensor and configured to automatically calibrate the first resistance.

Abstract: Apparatus, systems, and methods disclosed herein may initialize a delay-locked loop (DLL) or phase-locked loop (PLL) to achieve a locked condition and may then initiate a quiescent mode of operation. Quiescent operation may be achieved by breaking a feedback loop associated with the DLL or PLL to prevent updates to a variable delay line associated with the DLL and/or to a variable frequency oscillator associated with the PLL. An output clock phase associated with the DLL or PLL may thus be held substantially constant following a DLL initialization period. Additional embodiments are disclosed and claimed.

Abstract: There is provided a system and method for automatically calibrating a temperature sensor. More specifically, there is provided a system comprising a temperature sensor comprising a first resistance configured to indicate a temperature of the temperature sensor and a second resistance, in series with the first resistor, wherein the second resistance is adjustable to calibrate the first resistance, and a calibration circuit, coupled to the temperature sensor and configured to automatically calibrate the first resistance.

Abstract: A delay-lock loop includes a phase detector comparing the phase of a digital input signal to the phase of a feedback signal. The phase detector generates a corresponding control signal that is used to control the delay of a delay line. A multiplexer couples the input signal to the input of the delay line and thereafter couples a signal received from the output of the delay line to the input of the delay line so that the delay line functions as several individual delay lines. At least one digital signal that has propagated through the delay line is used as a feedback signal that is coupled from the output of the delay line to the phase detector by a signal router. The phase of the signal coupled to the phase detector by the router is therefore locked to the phase of the input signal.

Abstract: A delay-lock loop includes a phase detector comparing the phase of a digital input signal to the phase of a feedback signal. The phase detector generates a corresponding control signal that is used to control the delay of a delay line. A multiplexer couples the input signal to the input of the delay line and thereafter couples a signal received from the output of the delay line to the input of the delay line so that the delay line functions as several individual delay lines. At least one digital signal that has propagated through the delay line is used as a feedback signal that is coupled from the output of the delay line to the phase detector by a signal router. The phase of the signal coupled to the phase detector by the router is therefore locked to the phase of the input signal.