Patents by Inventor Brannon KLOPFER

Brannon KLOPFER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Nanosecond imaging methods using optical modulators
    Patent number: 11965780
    Abstract: Improved resolution of a time-varying optical measurement is provided with optical intensity modulator(s) having a bandwidth greater than that of the detector array(s). The modulator configuration can have high photon collection efficiency, e.g. by using polarization modulation to split the incident light into several time-gated channels.
    Type: Grant
    Filed: August 29, 2022
    Date of Patent: April 23, 2024
    Assignee: The Board of Trustees of the Leland Stanford Junior University
    Inventors: Adam Bowman, Mark A. Kasevich, Brannon Klopfer
  • Nanosecond imaging methods using optical modulators
    Publication number: 20240068871
    Abstract: Improved resolution of a time-varying optical measurement is provided with optical intensity modulator(s) having a bandwidth greater than that of the detector array(s). The modulator configuration can have high photon collection efficiency, e.g. by using polarization modulation to split the incident light into several time-gated channels.
    Type: Application
    Filed: August 29, 2022
    Publication date: February 29, 2024
    Inventors: Adam Bowman, Mark A. Kasevich, Brannon Klopfer
  • Wide-field nanosecond imaging methods using wide-field optical modulators
    Patent number: 11592393
    Abstract: Improved resolution of a time-varying optical image is provided with a wide field optical intensity modulator having a bandwidth greater than that of the detector array(s). The modulator configuration can have high photon collection efficiency, e.g. by using polarization modulation to split the incident light into several timegated channels.
    Type: Grant
    Filed: November 21, 2019
    Date of Patent: February 28, 2023
    Assignee: The Board of Trustees of the Leland Stanford Junior University
    Inventors: Adam Bowman, Mark A. Kasevich, Brannon Klopfer
  • Aberration reduction in multipass electron microscopy
    Patent number: 11456148
    Abstract: Improved aberration correction in multipass electron microscopy is provided by having Fourier images of the sample (instead of real images) at the reflection planes of the resonator. The resulting ?1 magnification of the sample reimaging can be compensated by appropriate sample placement or by adding compensating elements to the resonator. This enables simultaneous correction of lowest order chromatic and spherical aberration from the electron objective lenses. If real images of the sample are at the reflection planes of the resonator instead, only the lowest order chromatic aberration can be corrected.
    Type: Grant
    Filed: May 28, 2019
    Date of Patent: September 27, 2022
    Assignee: The Board of Trustees of the Leland Stanford Junior University
    Inventors: Mark A. Kasevich, Stewart A. Koppell, Brannon Klopfer, Thomas Juffmann, Marian Mankos
  • Aberration reduction in multipass electron microscopy
    Publication number: 20210217578
    Abstract: Improved aberration correction in multipass electron microscopy is provided by having Fourier images of the sample (instead of real images) at the reflection planes of the resonator. The resulting ?1 magnification of the sample reimaging can be compensated by appropriate sample placement or by adding compensating elements to the resonator. This enables simultaneous correction of lowest order chromatic and spherical aberration from the electron objective lenses. If real images of the sample are at the reflection planes of the resonator instead, only the lowest order chromatic aberration can be corrected.
    Type: Application
    Filed: May 28, 2019
    Publication date: July 15, 2021
    Applicant: The Board of Trustees of the Leland Stanford Junior University
    Inventors: Mark A. KASEVICH, Stewart A. KOPPELL, Brannon KLOPFER, Thomas JUFFMANN, Marian MANKOS