Abstract: Methods, apparatus, systems, and articles of manufacture to optimize pipeline execution are disclosed. An example apparatus includes at least one memory, machine readable instructions, and processor circuitry to execute the machine readable instructions to determine a value associated with a first location of a first pixel of a first image and a second location of a second pixel of a second image by calculating a matching cost between the first location and the second location, generate a disparity map including the value, and determine a minimum value based on the disparity map corresponding to a difference in horizontal coordinates between the first location and the second location.

Abstract: A computing device includes an appliance status table to store at least one of reliability and performance data for one or more network functions virtualization (NFV) appliances and one or more legacy network appliances. The computing device includes a load controller to configure an Internet Protocol (IP) filter rule to select a packet for which processing of the packet is to be migrated from a selected one of the one or more legacy network appliances to a selected one of the one or more NFV appliances, and to update the appliance status table with received at least one of reliability and performance data for the one or more legacy network appliances and the one or more NFV appliances. The computing device includes a packet distributor to receive the packet, to select one of the one or more NFV appliances based at least in part on the appliance status table, and to send the packet to the selected NFV appliance. Other embodiments are described herein.

Abstract: The method uses an XRF instrument for identifying a specified element on a jewelry sample by illuminating its surface with excitation radiation and measuring first and second intensities of characteristic emission lines of a specified element and calculating the ratio between the intensities to establish a measured thickness and to determine based on a certain range criteria whether the sample can be considered to be plated jewelry.

Abstract: A bicycle seat clamp assembly is disclosed herein which comprises upper and lower members to provide a vertical clamping force to the rails of a seat to attach a seat to the seat post. The upper and lower members are actuated by a horizontal fastening device which can be tightened or loosened with one hand. The bicycle seat clamp assembly provides for fine tuning of a front to back angular tilt as preferred by the user. Moreover, the seat post can be rotated to the forward direction or the rearward direction to increase a front to back adjustment range of the seat.

Abstract: The method uses an XRF instrument for identifying a specified element on a jewelry sample by illuminating its surface with excitation radiation and measuring first and second intensities of characteristic emission lines of a specified element and calculating the ratio between the intensities to establish a measured thickness and to determine based on a certain range criteria whether the sample can be considered to be plated jewelry.

Abstract: A bicycle seat clamp assembly is disclosed herein which comprises upper and lower members to provide a vertical clamping force to the rails of a seat to attach a seat to the seat post. The upper and lower members are actuated by a horizontal fastening device which can be tightened or loosened with one hand. The bicycle seat clamp assembly provides for fine tuning of a front to back angular tilt as preferred by the user. Moreover, the seat post can be rotated to the forward direction or the rearward direction to increase a front to back adjustment range of the seat.

Abstract: An XRF system, preferably handheld, includes an X-ray source for directing X-rays to a sample, a detector responsive to X-rays emitted by the sample, and a filter assembly with multiple filter materials located between the X-ray source and the detector. An analyzer is responsive to detector and is configured to analyze the intensities of X-rays irradiated by the sample at one power setting and to choose a filter material which suppresses certain intensities with respect to other intensities. A device, controlled by the analyzer, automatically moves the filter assembly to the chosen filter material and then the analyzer increases the power setting to analyze certain non-suppressed intensities.

Abstract: An XRF system, preferably handheld, includes an X-ray source for directing X-rays to a sample, a detector responsive to X-rays emitted by the sample, and a filter assembly with multiple filter materials located between the X-ray source and the detector. An analyzer is responsive to detector and is configured to analyze the intensities of X-rays irradiated by the sample at one power setting and to choose a filter material which suppresses certain intensities with respect to other intensities. A device, controlled by the analyzer, automatically moves the filter assembly to the chosen filter material and then the analyzer increases the power setting to analyze certain non-suppressed intensities.