Abstract: The method uses an XRF instrument for identifying a specified element on a jewelry sample by illuminating its surface with excitation radiation and measuring first and second intensities of characteristic emission lines of a specified element and calculating the ratio between the intensities to establish a measured thickness and to determine based on a certain range criteria whether the sample can be considered to be plated jewelry.

Abstract: A bicycle seat clamp assembly is disclosed herein which comprises upper and lower members to provide a vertical clamping force to the rails of a seat to attach a seat to the seat post. The upper and lower members are actuated by a horizontal fastening device which can be tightened or loosened with one hand. The bicycle seat clamp assembly provides for fine tuning of a front to back angular tilt as preferred by the user. Moreover, the seat post can be rotated to the forward direction or the rearward direction to increase a front to back adjustment range of the seat.

Abstract: A bicycle seat clamp assembly is disclosed herein which comprises upper and lower members to provide a vertical clamping force to the rails of a seat to attach a seat to the seat post. The upper and lower members are actuated by a horizontal fastening device which can be tightened or loosened with one hand. The bicycle seat clamp assembly provides for fine tuning of a front to back angular tilt as preferred by the user. Moreover, the seat post can be rotated to the forward direction or the rearward direction to increase a front to back adjustment range of the seat.

Abstract: An XRF system, preferably handheld, includes an X-ray source for directing X-rays to a sample, a detector responsive to X-rays emitted by the sample, and a filter assembly with multiple filter materials located between the X-ray source and the detector. An analyzer is responsive to detector and is configured to analyze the intensities of X-rays irradiated by the sample at one power setting and to choose a filter material which suppresses certain intensities with respect to other intensities. A device, controlled by the analyzer, automatically moves the filter assembly to the chosen filter material and then the analyzer increases the power setting to analyze certain non-suppressed intensities.

Abstract: An XRF system, preferably handheld, includes an X-ray source for directing X-rays to a sample, a detector responsive to X-rays emitted by the sample, and a filter assembly with multiple filter materials located between the X-ray source and the detector. An analyzer is responsive to detector and is configured to analyze the intensities of X-rays irradiated by the sample at one power setting and to choose a filter material which suppresses certain intensities with respect to other intensities. A device, controlled by the analyzer, automatically moves the filter assembly to the chosen filter material and then the analyzer increases the power setting to analyze certain non-suppressed intensities.