Abstract: A spectrometer system comprising a housing configured as a handheld device with a screen; a source of narrow band illumination; a sensor that detects Raman scattering signals; a source of wide band illumination; an optical element that detect Fourier transform infrared (FTIR) signals; a memory device comprising a library of information with Raman scattering reference information and FTIR reference information; and a processor configured to execute software instructions, wherein the software instructions are configured to: direct the narrow band illumination to the sample; detect the Raman scattering signals; direct the wide band illumination to the sample; detect the FTIR signals; determine a composition of the sample from a similarity between the Raman scattering spectral information and the Raman scattering reference information, and from a similarity between the FTIR spectral information and the FTIR reference information; and display the composition of the sample on the screen.

Abstract: Disclosed are apparatus, kits, methods, and systems that include a radiation source configured to direct radiation to a sample; a detector configured to measure radiation from the sample; an electronic processor configured to determine information about the sample based on the measured radiation; a housing enclosing the source, the detector, and the electronic processor, the housing having a hand-held form factor; an arm configured to maintain a separation between the sample and the housing, the arm including a first end configured to connect to the housing and a second end configured to contact the sample; and a layer positioned on the second end of the arm, the layer being configured to contact the sample and to transmit at least a portion of the radiation from the sample to the detector.

Abstract: A spectrometer system comprising a housing configured as a handheld device with a screen; a source of narrow band illumination; a sensor that detects Raman scattering signals; a source of wide band illumination; an optical element that detect Fourier transform infrared (FTIR) signals; a memory device comprising a library of information with Raman scattering reference information and FTIR reference information; and a processor configured to execute software instructions, wherein the software instructions are configured to: direct the narrow band illumination to the sample; detect the Raman scattering signals; direct the wide band illumination to the sample; detect the FTIR signals; determine a composition of the sample from a similarity between the Raman scattering spectral information and the Raman scattering reference information, and from a similarity between the FTIR spectral information and the FTIR reference information; and display the composition of the sample on the screen.

Abstract: The embodiments of the present invention are directed to applying intimate contact pressures to samples while undergoing ATR infrared interrogation. As a general mode of operation, after a solid sample is placed on the ATR element, a force actuator moves an anvil arm to apply a contact force to the sample against the ATR. Thereafter, when the scan is over, the user can see the result of the one or more scans. The force actuator may be a motor or a solenoid or other type of force actuator. The applied contact force may be a fixed force or may be a user-selectable force or may be automatically controlled through feedback from the spectrometer based on the spectroscopic signature of the sample material.

Abstract: A spectrometer configurable for field analyses of chemical properties of a material is provided. The spectrometer includes: at least one sensor adapted for providing Fourier transform infrared spectroscopy (FTIR) surveillance and at least another sensor for providing Raman spectroscopy surveillance. The spectrometer can be provided with a user accessible instruction set for modifying a sampling configuration of the spectrometer. A method of determining the most likely composition of a sample by at least two technologies using the spectrometer is also provided.

Abstract: The embodiments of the present invention are directed to applying intimate contact pressures to samples while undergoing ATR infrared interrogation. As a general mode of operation, after a solid sample is placed on the ATR element, a force actuator moves an anvil arm to apply a contact force to the sample against the ATR. Thereafter, when the scan is over, the user can see the result of the one or more scans. The force actuator may be a motor or a solenoid or other type of force actuator. The applied contact force may be a fixed force or may be a user-selectable force or may be automatically controlled through feedback from the spectrometer based on the spectroscopic signature of the sample material.

Abstract: The embodiments of the present invention are directed to applying intimate contact pressures to samples while undergoing ATR infrared interrogation. As a general mode of operation, after a solid sample is placed on the ATR element, a force actuator moves an anvil arm to apply a contact force to the sample against the ATR. Thereafter, when the scan is over, the user can see the result of the one or more scans. The force actuator may be a motor or a solenoid or other type of force actuator. The applied contact force may be a fixed force or may be a user-selectable force or may be automatically controlled through feedback from the spectrometer based on the spectroscopic signature of the sample material.

Abstract: A spectrometer configurable for field analyses of chemical properties of a material is provided. The spectrometer includes: at least one sensor adapted for providing Fourier transform infrared spectroscopy (FTIR) surveillance and at least another sensor for providing Raman spectroscopy surveillance. The spectrometer can be provided with a user accessible instruction set for modifying a sampling configuration of the spectrometer. A method of determining the most likely composition of a sample by at least two technologies using the spectrometer is also provided.

Abstract: Disclosed are apparatus, kits, methods, and systems that include a radiation source configured to direct radiation to a sample; a detector configured to measure radiation from the sample; an electronic processor configured to determine information about the sample based on the measured radiation; a housing enclosing the source, the detector, and the electronic processor, the housing having a hand-held form factor; an arm configured to maintain a separation between the sample and the housing, the arm including a first end configured to connect to the housing and a second end configured to contact the sample; and a layer positioned on the second end of the arm, the layer being configured to contact the sample and to transmit at least a portion of the radiation from the sample to the detector.

Abstract: The embodiments of the present invention are directed to applying intimate contact pressures to samples while undergoing ATR infrared interrogation. As a general mode of operation, after a solid sample is placed on the ATR element, a force actuator moves an anvil arm to apply a contact force to the sample against the ATR. Thereafter, when the scan is over, the user can see the result of the one or more scans. The force actuator may be a motor or a solenoid or other type of force actuator. The applied contact force may be a fixed force or may be a user-selectable force or may be automatically controlled through feedback from the spectrometer based on the spectroscopic signature of the sample material.

Abstract: Disclosed are apparatus, kits, methods, and systems that include a radiation source configured to direct radiation to a sample; a detector configured to measure radiation from the sample; an electronic processor configured to determine information about the sample based on the measured radiation; a housing enclosing the source, the detector, and the electronic processor, the housing having a hand-held form factor; an arm configured to maintain a separation between the sample and the housing, the arm including a first end configured to connect to the housing and a second end configured to contact the sample; and a layer positioned on the second end of the arm, the layer being configured to contact the sample and to transmit at least a portion of the radiation from the sample to the detector.

Abstract: Disclosed are apparatus, kits, methods, and systems that include a radiation source configured to direct radiation to a sample; a detector configured to measure radiation from the sample; an electronic processor configured to determine infotmation about the sample based on the measured radiation; a housing enclosing the source, the detector, and the electronic processor, the housing having a hand-held form factor; an arm configured to maintain a separation between the sample and the housing, the arm including a first end configured to connect to the housing and a second end configured to contact the sample; and a layer positioned on the second end of the arm, the layer being configured to contact the sample and to transmit at least a portion of the radiation from the sample to the detector.