Abstract: A system is described for providing pulses to test a semiconductor device, such as a memory device. The system includes several voltage sources, each voltage source being coupled to an output terminal through a pass gate. A control logic circuit provides a control signal to each of the pass gates to render the pass gates conductive in a sequence. A voltage generated by each voltage source is coupled to the output terminal in a sequence to generate a series of pulses at the output terminal. Each of the voltage sources may be a programmable digital-to-analog converter receiving a voltage control signal and generating a voltage based on the voltage control signal.

Abstract: An apparatus and method for testing a semiconductor device allows error data to be displayed, in real time, based on the physical locations of the errors on the semiconductor device. A mapping circuit includes a router circuit, an error catch memory, and a topological circuit. The router circuit converts logical addresses employed by the semiconductor device to physical addresses employed by the error catch memory so that error data is appropriately routed from locations in the semiconductor device to corresponding locations in the error catch memory. The topological circuit then converts the physical addresses of the error data in the error catch memory to spatial addresses for allowing a host computer to rapidly display such errors as a bit map display on a visual display device. The router and topological circuits are preferably field programmable gate arrays or programmable read only memories so that the host computer can reprogram them for different semiconductor devices to be tested.

Abstract: A method and apparatus for generating a timing signal for a semiconductor device, wherein the timing of rising and falling edges in the timing signal can be very precisely controlled. In one embodiment, a serial data stream derived from data stored in a memory device is applied to the inputs of first and second programmable delay elements each adapted to introduce a delay into the serial data stream. The resulting first delayed serial data stream is applied to the SET input of a flip-flop circuit; the resulting second delayed serial data stream is applied to the RESET input of the flip-flop. The output of the flip-flop constitutes the generated timing signal. The rising and falling edges of the timing signal are controlled through manipulation of the lengths of the delays introduced by the first and second delay elements into the serial data stream. Manipulation of the delay times is accomplished through adjustment of analog programming voltages applied to the respective delay elements.

Abstract: A method and apparatus for generating a timing signal for a semiconductor device, wherein the timing of rising and falling edges in the timing signal can be very precisely controlled. In one embodiment, a serial data stream derived from data stored in a memory device is applied to the inputs of first and second programmable delay elements each adapted to introduce a delay into the serial data stream. The resulting first delayed serial data stream is applied to the SET input of a flip-flop circuit; the resulting second delayed serial data stream is applied to the RESET input of the flip-flop. The output of the flip-flop constitutes the generated timing signal. The rising and falling edges of the timing signal are controlled through manipulation of the lengths of the delays introduced by the first and second delay elements into the serial data stream. Manipulation of the delay times is accomplished through adjustment of analog programming voltages applied to the respective delay elements.

Abstract: A method and apparatus for generating a timing signal for a semiconductor device, wherein the timing of rising and falling edges in the timing signal can be very precisely controlled. In one embodiment, a serial data stream derived from data stored in a memory device is applied to the inputs of first and second programmable delay elements each adapted to introduce a delay into the serial data stream. The resulting first delayed serial data stream is applied to the SET input of a flip-flop circuit; the resulting second delayed serial data stream is applied to the RESET input of the flip-flop. The output of the flip-flop constitutes the generated timing signal. The rising and falling edges of the timing signal are controlled through manipulation of the lengths of the delays introduced by the first and second delay elements into the serial data stream. Manipulation of the delay times is accomplished through adjustment of analog programming voltages applied to the respective delay elements.

Abstract: A system is described for providing pulses to test a semiconductor device, such as a memory device. The system includes several voltage sources, each voltage source being coupled to an output terminal through a pass gate. A control logic circuit provides a control signal to each of the pass gates to render the pass gates conductive in a sequence. A voltage generated by each voltage source is coupled to the output terminal in a sequence to generate a series of pulses at the output terminal. Each of the voltage sources may be a programmable digital-to-analog converter receiving a voltage control signal and generating a voltage based on the voltage control signal.

Abstract: An apparatus and method for testing a semiconductor device allows error data to be displayed, in real time, based on the physical locations of the errors on the semiconductor device. A mapping circuit includes a router circuit, an error catch memory, and a topological circuit. The router circuit converts logical addresses employed by the semiconductor device to physical addresses employed by the error catch memory so that error data is appropriately routed from locations in the semiconductor device to corresponding locations in the error catch memory. The topological circuit then converts the physical addresses of the error data in the error catch memory to spatial addresses for allowing a host computer to rapidly display such errors as a bit map display on a visual display device. The router and topological circuits are preferably field programmable gate arrays or programmable read only memories so that the host computer can reprogram them for different semiconductor devices to be tested.

Abstract: A system for validating mapped signal generation permits identifying deficiencies in dynamic random access memory testing. As an example application of mapped signals consider memory testing. Memory tests such as stripe and checkerboard pattern tests frequently involve topological maps in order to permit use of the same memory test system and test program on memory devices and systems having different characteristics. An effective memory test exercises a memory cell by storing data therein which is of opposite physical polarity to data stored in physically adjacent cells. Topological maps account for variation in polarity of stored data depending on the address of a cell and variation due to the physical layout of cells which may not necessarily place consecutively addressed cells in physical proximity. A fixture for dynamic random access memory testing according to the present invention includes a battery, a signal multiplexer, and mode switching circuitry.

Abstract: An apparatus and method for testing a semiconductor device allows error data to be displayed, in real time, based on the physical locations of the errors on the semiconductor device. A mapping circuit includes a router circuit, an error catch memory, and a topological circuit. The router circuit converts logical addresses employed by the semiconductor device to physical addresses employed by the error catch memory so that error data is appropriately routed from locations in the semiconductor device to corresponding locations in the error catch memory. The topological circuit then converts the physical addresses of the error data in the error catch memory to spatial addresses for allowing a host computer to rapidly display such errors as a bit map display on a visual display device. The router and topological circuits are preferably field programmable gate arrays or programmable read only memories so that the host computer can reprogram them for different semiconductor devices to be tested.

Abstract: A system for validating mapped signal generation permits identifying deficiencies in dynamic random access memory testing. As an example application of mapped signals consider memory testing. Memory tests such as stripe and checkerboard pattern tests frequently involve topological maps in order to permit use of the same memory test system and test program on memory devices and systems having different characteristics. An effective memory test exercises a memory cell by storing data therein which is of opposite physical polarity to data stored in physically adjacent cells. Topological maps account for variation in polarity of stored data depending on the address of a cell and variation due to the physical layout of cells which may not necessarily place consecutively addressed cells in physical proximity. A fixture for dynamic random access memory testing according to the present invention includes a battery, a signal multiplexer, and mode switching circuitry.