Abstract: The apparatus of the present invention includes a multiple stylus probe attachment capable of attachment to a probing mechanism mounted to a turret tool station of a numerically controlled lathe for use in probing various surfaces of a workpiece. The probe attachment includes a base configured for attachment to the probing mechanism along a longitudinal axis of the probing mechanism. The probe attachment further includes a first stylus attached to the base with the distal end of the first stylus extending in a direction generally parallel to the longitudinal axis of the probing mechanism. A second stylus is attached to the base with its distal end extending in a direction generally perpendicular to the longitudinal axis of the probing mechanism. After the probe attachment is secured to the probing mechanism, the probe is calibrated by calibrating both styli. The probe may then be utilized to measure various surfaces of a workpiece while positioned in the workpiece holder of the lathe.