Patents by Inventor Brett Barwick

Brett Barwick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Photon induced near field electron microscope and biological imaging system
    Patent number: 8963085
    Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.
    Type: Grant
    Filed: September 24, 2013
    Date of Patent: February 24, 2015
    Assignee: California Institute of Technology
    Inventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick
  • PHOTON INDUCED NEAR FIELD ELECTRON MICROSCOPE AND BIOLOGICAL IMAGING SYSTEM
    Publication number: 20140084160
    Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.
    Type: Application
    Filed: September 24, 2013
    Publication date: March 27, 2014
    Applicant: California Institute of Technology
    Inventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick
  • Photon induced near field electron microscope and biological imaging system
    Patent number: 8569695
    Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.
    Type: Grant
    Filed: April 16, 2013
    Date of Patent: October 29, 2013
    Assignee: California Institute of Technology
    Inventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick
  • PHOTON INDUCED NEAR FIELD ELECTRON MICROSCOPE AND BIOLOGICAL IMAGING SYSTEM
    Publication number: 20130234022
    Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.
    Type: Application
    Filed: April 16, 2013
    Publication date: September 12, 2013
    Applicant: California Institute of Technology
    Inventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick
  • Photon induced near field electron microscope and biological imaging system
    Patent number: 8429761
    Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.
    Type: Grant
    Filed: September 16, 2010
    Date of Patent: April 23, 2013
    Assignee: California Institute of Technology
    Inventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick
  • PHOTON INDUCED NEAR FIELD ELECTRON MICROSCOPE AND BIOLOGICAL IMAGING SYSTEM
    Publication number: 20110220792
    Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.
    Type: Application
    Filed: September 16, 2010
    Publication date: September 15, 2011
    Applicant: California Institute of Technology
    Inventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick