Patents by Inventor Brett HALEY
Brett HALEY has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12231890Abstract: Systems, methods, devices and software for operating particle sampling devices in a user-restrictive manner include a tag and a particle sampling device. The device includes a tag reader and a processor in communication with the tag reader. The processor: receives device configuration data and reads operational and/or user data from the tag having that data encoded thereon. Based on the data read from the tag, the processor may either grant or deny access to a user for performing device operations. Alternatively, for a headless particle sampling device configured for minimal user interaction during operation, the device is removably attached to a supporting structure proximate the tag positioned in or on the supporting structure. In the headless configuration, the processor reads device configuration parameters including network communication information from the tag following device power up.Type: GrantFiled: December 13, 2022Date of Patent: February 18, 2025Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Matt Michaelis, Daniele Pandolfi, Brett Haley
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Publication number: 20230112632Abstract: Systems, methods, devices and software for operating particle sampling devices in a user-restrictive manner include a tag and a particle sampling device. The device includes a tag reader and a processor in communication with the tag reader. The processor: receives device configuration data and reads operational and/or user data from the tag having that data encoded thereon. Based on the data read from the tag, the processor may either grant or deny access to a user for performing device operations. Alternatively, for a headless particle sampling device configured for minimal user interaction during operation, the device is removably attached to a supporting structure proximate the tag positioned in or on the supporting structure. In the headless configuration, the processor reads device configuration parameters including network communication information from the tag following device power up.Type: ApplicationFiled: December 13, 2022Publication date: April 13, 2023Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Matt MICHAELIS, Daniele PANDOLFI, Brett HALEY
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Patent number: 11576045Abstract: Systems, methods, devices and software for operating particle sampling devices in a user-restrictive manner include a tag and a particle sampling device. The device includes a tag reader and a processor in communication with the tag reader. The processor: receives device configuration data and reads operational and/or user data from the tag having that data encoded thereon. Based on the data read from the tag, the processor may either grant or deny access to a user for performing device operations. Alternatively, for a headless particle sampling device configured for minimal user interaction during operation, the device is removably attached to a supporting structure proximate the tag positioned in or on the supporting structure. In the headless configuration, the processor reads device configuration parameters including network communication information from the tag following device power up.Type: GrantFiled: August 7, 2020Date of Patent: February 7, 2023Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Matt Michaelis, Daniele Pandolfi, Brett Haley
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Patent number: 11385161Abstract: Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer, including independently of the presence or absence of particles. The method and analyzers include use of distinct and non-interfering time frequency domains: a middle frequency time domain and a low frequency time domain, and optionally a high frequency time domain. The high frequency time domain generates a laser facet drive current frequency modulation to prevent the laser facet from spatial-mode hopping. The middle frequency time domain is for particle detection. The low frequency time domain is for calibration status, including laser-pulse-light self-diagnostics, for the health or calibration status of the analyzer. By carefully selecting the frequency time domain ranges, there is non-interference, with the ability to self-diagnose the instrument that is particle-independent.Type: GrantFiled: April 27, 2020Date of Patent: July 12, 2022Assignee: Particle Measuring Systems, Inc.Inventors: Thomas A. Bates, Matt Michaelis, Brett Haley
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Publication number: 20210404936Abstract: Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer, including independently of the presence or absence of particles. The method and analyzers include use of distinct and non-interfering time frequency domains: a middle frequency time domain and a low frequency time domain, and optionally a high frequency time domain. The high frequency time domain generates a laser facet drive current frequency modulation to prevent the laser facet from spatial-mode hopping. The middle frequency time domain is for particle detection. The low frequency time domain is for calibration status, including laser-pulse-light self-diagnostics, for the health or calibration status of the analyzer. By carefully selecting the frequency time domain ranges, there is non-interference, with the ability to self-diagnose the instrument that is particle-independent.Type: ApplicationFiled: April 27, 2020Publication date: December 30, 2021Applicant: Particle Measuring Systems, Inc.Inventors: Thomas A. BATES, Matt MICHAELIS, Brett HALEY
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Patent number: 11181455Abstract: Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer. The method includes the steps of providing an optical particle analyzer and modulating a power applied to a source of EMR. The method includes the steps of, in response to the modulating step, inducing a detector signal waveform and analyzing the detector signal waveform to determine a value of at least one diagnostic parameter associated with one or more of the source of EMR, an optical assembly, a chamber, a detector, and an optical collection system of the optical particle analyzer. The method includes the step of determining a calibration status of the optical particle analyzer based on the one or more determined values of the at least one diagnostic parameter.Type: GrantFiled: November 8, 2019Date of Patent: November 23, 2021Assignee: Particle Measuring Systems, Inc.Inventors: Thomas A. Bates, Matt Michaelis, Brett Haley
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Publication number: 20210044978Abstract: Systems, methods, devices and software for operating particle sampling devices in a user-restrictive manner include a tag and a particle sampling device. The device includes a tag reader and a processor in communication with the tag reader. The processor: receives device configuration data and reads operational and/or user data from the tag having that data encoded thereon. Based on the data read from the tag, the processor may either grant or deny access to a user for performing device operations. Alternatively, for a headless particle sampling device configured for minimal user interaction during operation, the device is removably attached to a supporting structure proximate the tag positioned in or on the supporting structure. In the headless configuration, the processor reads device configuration parameters including network communication information from the tag following device power up.Type: ApplicationFiled: August 7, 2020Publication date: February 11, 2021Applicant: Particle Measuring Systems, Inc.Inventors: Matt MICHAELIS, Daniele PANDOLFI, Brett HALEY
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Patent number: 10859487Abstract: The systems and methods provided herein relate generally to the improvement of data quality in optical liquid particle counters and control of optical particle counters to achieve longer expected lifetime, for example by avoiding damage caused by electromagnetic radiation and heat. The systems and methods incorporate sensors which characterize the fluid flowing through the flow cell, thereby enhancing accuracy and reducing the number of false positives.Type: GrantFiled: March 5, 2019Date of Patent: December 8, 2020Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Brian Knollenberg, Jim Lumpkin, Brett Haley, Matt Soappman, Dan Rodier, Mark Lilly
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Publication number: 20200150017Abstract: Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer. The method includes the steps of providing an optical particle analyzer and modulating a power applied to a source of EMR. The method includes the steps of, in response to the modulating step, inducing a detector signal waveform and analyzing the detector signal waveform to determine a value of at least one diagnostic parameter associated with one or more of the source of EMR, an optical assembly, a chamber, a detector, and an optical collection system of the optical particle analyzer. The method includes the step of determining a calibration status of the optical particle analyzer based on the one or more determined values of the at least one diagnostic parameter.Type: ApplicationFiled: November 8, 2019Publication date: May 14, 2020Inventors: Thomas A. BATES, Matt MICHAELIS, Brett HALEY
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Publication number: 20190323943Abstract: The systems and methods provided herein relate generally to the improvement of data quality in optical liquid particle counters and control of optical particle counters to achieve longer expected lifetime, for example by avoiding damage caused by electromagnetic radiation and heat. The systems and methods incorporate sensors which characterize the fluid flowing through the flow cell, thereby enhancing accuracy and reducing the number of false positives.Type: ApplicationFiled: March 5, 2019Publication date: October 24, 2019Inventors: Brian KNOLLENBERG, Jim LUMPKIN, Brett HALEY, Matt SOAPPMAN, Dan RODIER, Mark LILLY
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Patent number: 10371620Abstract: The systems and methods provided herein relate generally to the improvement of data quality in optical liquid particle counters and control of optical particle counters to achieve longer expected lifetime, for example by avoiding damage caused by electromagnetic radiation and heat. The systems and methods incorporate sensors which characterize the fluid flowing through the flow cell, thereby enhancing accuracy and reducing the number of false positives.Type: GrantFiled: May 19, 2017Date of Patent: August 6, 2019Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Brian Knollenberg, Jim Lumpkin, Brett Haley, Matt Soappman, Dan Rodier, Mark Lilly
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Publication number: 20170356838Abstract: The systems and methods provided herein relate generally to the improvement of data quality in optical liquid particle counters and control of optical particle counters to achieve longer expected lifetime, for example by avoiding damage caused by electromagnetic radiation and heat. The systems and methods incorporate sensors which characterize the fluid flowing through the flow cell, thereby enhancing accuracy and reducing the number of false positives.Type: ApplicationFiled: May 19, 2017Publication date: December 14, 2017Inventors: Brian KNOLLENBERG, Jim LUMPKIN, Brett HALEY, Matt SOAPPMAN, Dan RODIER, Mark LILLY