Patents by Inventor Brett HALEY

Brett HALEY has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230112632
    Abstract: Systems, methods, devices and software for operating particle sampling devices in a user-restrictive manner include a tag and a particle sampling device. The device includes a tag reader and a processor in communication with the tag reader. The processor: receives device configuration data and reads operational and/or user data from the tag having that data encoded thereon. Based on the data read from the tag, the processor may either grant or deny access to a user for performing device operations. Alternatively, for a headless particle sampling device configured for minimal user interaction during operation, the device is removably attached to a supporting structure proximate the tag positioned in or on the supporting structure. In the headless configuration, the processor reads device configuration parameters including network communication information from the tag following device power up.
    Type: Application
    Filed: December 13, 2022
    Publication date: April 13, 2023
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Matt MICHAELIS, Daniele PANDOLFI, Brett HALEY
  • Patent number: 11576045
    Abstract: Systems, methods, devices and software for operating particle sampling devices in a user-restrictive manner include a tag and a particle sampling device. The device includes a tag reader and a processor in communication with the tag reader. The processor: receives device configuration data and reads operational and/or user data from the tag having that data encoded thereon. Based on the data read from the tag, the processor may either grant or deny access to a user for performing device operations. Alternatively, for a headless particle sampling device configured for minimal user interaction during operation, the device is removably attached to a supporting structure proximate the tag positioned in or on the supporting structure. In the headless configuration, the processor reads device configuration parameters including network communication information from the tag following device power up.
    Type: Grant
    Filed: August 7, 2020
    Date of Patent: February 7, 2023
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Matt Michaelis, Daniele Pandolfi, Brett Haley
  • Patent number: 11385161
    Abstract: Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer, including independently of the presence or absence of particles. The method and analyzers include use of distinct and non-interfering time frequency domains: a middle frequency time domain and a low frequency time domain, and optionally a high frequency time domain. The high frequency time domain generates a laser facet drive current frequency modulation to prevent the laser facet from spatial-mode hopping. The middle frequency time domain is for particle detection. The low frequency time domain is for calibration status, including laser-pulse-light self-diagnostics, for the health or calibration status of the analyzer. By carefully selecting the frequency time domain ranges, there is non-interference, with the ability to self-diagnose the instrument that is particle-independent.
    Type: Grant
    Filed: April 27, 2020
    Date of Patent: July 12, 2022
    Assignee: Particle Measuring Systems, Inc.
    Inventors: Thomas A. Bates, Matt Michaelis, Brett Haley
  • Publication number: 20210404936
    Abstract: Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer, including independently of the presence or absence of particles. The method and analyzers include use of distinct and non-interfering time frequency domains: a middle frequency time domain and a low frequency time domain, and optionally a high frequency time domain. The high frequency time domain generates a laser facet drive current frequency modulation to prevent the laser facet from spatial-mode hopping. The middle frequency time domain is for particle detection. The low frequency time domain is for calibration status, including laser-pulse-light self-diagnostics, for the health or calibration status of the analyzer. By carefully selecting the frequency time domain ranges, there is non-interference, with the ability to self-diagnose the instrument that is particle-independent.
    Type: Application
    Filed: April 27, 2020
    Publication date: December 30, 2021
    Applicant: Particle Measuring Systems, Inc.
    Inventors: Thomas A. BATES, Matt MICHAELIS, Brett HALEY
  • Patent number: 11181455
    Abstract: Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer. The method includes the steps of providing an optical particle analyzer and modulating a power applied to a source of EMR. The method includes the steps of, in response to the modulating step, inducing a detector signal waveform and analyzing the detector signal waveform to determine a value of at least one diagnostic parameter associated with one or more of the source of EMR, an optical assembly, a chamber, a detector, and an optical collection system of the optical particle analyzer. The method includes the step of determining a calibration status of the optical particle analyzer based on the one or more determined values of the at least one diagnostic parameter.
    Type: Grant
    Filed: November 8, 2019
    Date of Patent: November 23, 2021
    Assignee: Particle Measuring Systems, Inc.
    Inventors: Thomas A. Bates, Matt Michaelis, Brett Haley
  • Publication number: 20210044978
    Abstract: Systems, methods, devices and software for operating particle sampling devices in a user-restrictive manner include a tag and a particle sampling device. The device includes a tag reader and a processor in communication with the tag reader. The processor: receives device configuration data and reads operational and/or user data from the tag having that data encoded thereon. Based on the data read from the tag, the processor may either grant or deny access to a user for performing device operations. Alternatively, for a headless particle sampling device configured for minimal user interaction during operation, the device is removably attached to a supporting structure proximate the tag positioned in or on the supporting structure. In the headless configuration, the processor reads device configuration parameters including network communication information from the tag following device power up.
    Type: Application
    Filed: August 7, 2020
    Publication date: February 11, 2021
    Applicant: Particle Measuring Systems, Inc.
    Inventors: Matt MICHAELIS, Daniele PANDOLFI, Brett HALEY
  • Patent number: 10859487
    Abstract: The systems and methods provided herein relate generally to the improvement of data quality in optical liquid particle counters and control of optical particle counters to achieve longer expected lifetime, for example by avoiding damage caused by electromagnetic radiation and heat. The systems and methods incorporate sensors which characterize the fluid flowing through the flow cell, thereby enhancing accuracy and reducing the number of false positives.
    Type: Grant
    Filed: March 5, 2019
    Date of Patent: December 8, 2020
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Brian Knollenberg, Jim Lumpkin, Brett Haley, Matt Soappman, Dan Rodier, Mark Lilly
  • Publication number: 20200150017
    Abstract: Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer. The method includes the steps of providing an optical particle analyzer and modulating a power applied to a source of EMR. The method includes the steps of, in response to the modulating step, inducing a detector signal waveform and analyzing the detector signal waveform to determine a value of at least one diagnostic parameter associated with one or more of the source of EMR, an optical assembly, a chamber, a detector, and an optical collection system of the optical particle analyzer. The method includes the step of determining a calibration status of the optical particle analyzer based on the one or more determined values of the at least one diagnostic parameter.
    Type: Application
    Filed: November 8, 2019
    Publication date: May 14, 2020
    Inventors: Thomas A. BATES, Matt MICHAELIS, Brett HALEY
  • Publication number: 20190323943
    Abstract: The systems and methods provided herein relate generally to the improvement of data quality in optical liquid particle counters and control of optical particle counters to achieve longer expected lifetime, for example by avoiding damage caused by electromagnetic radiation and heat. The systems and methods incorporate sensors which characterize the fluid flowing through the flow cell, thereby enhancing accuracy and reducing the number of false positives.
    Type: Application
    Filed: March 5, 2019
    Publication date: October 24, 2019
    Inventors: Brian KNOLLENBERG, Jim LUMPKIN, Brett HALEY, Matt SOAPPMAN, Dan RODIER, Mark LILLY
  • Patent number: 10371620
    Abstract: The systems and methods provided herein relate generally to the improvement of data quality in optical liquid particle counters and control of optical particle counters to achieve longer expected lifetime, for example by avoiding damage caused by electromagnetic radiation and heat. The systems and methods incorporate sensors which characterize the fluid flowing through the flow cell, thereby enhancing accuracy and reducing the number of false positives.
    Type: Grant
    Filed: May 19, 2017
    Date of Patent: August 6, 2019
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Brian Knollenberg, Jim Lumpkin, Brett Haley, Matt Soappman, Dan Rodier, Mark Lilly
  • Publication number: 20170356838
    Abstract: The systems and methods provided herein relate generally to the improvement of data quality in optical liquid particle counters and control of optical particle counters to achieve longer expected lifetime, for example by avoiding damage caused by electromagnetic radiation and heat. The systems and methods incorporate sensors which characterize the fluid flowing through the flow cell, thereby enhancing accuracy and reducing the number of false positives.
    Type: Application
    Filed: May 19, 2017
    Publication date: December 14, 2017
    Inventors: Brian KNOLLENBERG, Jim LUMPKIN, Brett HALEY, Matt SOAPPMAN, Dan RODIER, Mark LILLY