Patents by Inventor Brian A. Knollenberg
Brian A. Knollenberg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12130222Abstract: Disclosed is a method for detecting and/or growing particles, comprising controlling the surface area exposed to the saturator region by monitoring at least one of a depth of the working liquid on the saturator surface, the surface area exposed to the saturator region, or a volume of the working liquid on the saturator surface. Also disclosed is an apparatus or system for detecting and/or growing particles, comprising a fluidics system configured to control the surface area exposed to the saturator region by monitoring at least one of a depth of the working liquid on the saturator surface, the surface area exposed to the saturator region, or a volume of the working liquid on the saturator surface. Certain aspects do not employ one or more porous structures for vapor generation, nor a separate carrier fluid flow or inlet comprising a carrier fluid and vaporized working liquid for combining with the sample flow in the saturator region.Type: GrantFiled: June 14, 2022Date of Patent: October 29, 2024Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Edward Yates, Cary Hertert, Brian A. Knollenberg
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Publication number: 20240264066Abstract: A method of calibrating an optical particle counter may include performing first and second calibration procedures. The first calibration procedure may include performing sensitivity calibration and/or channel size calibration of the optical particle counter under calibration using a monodispersed particle standard. The second calibration procedure may include sample volume calibration. The sample volume calibration may include: flowing a polydispersed particle calibration sample dispersed in a fluid through the optical particle counter under calibration to produce a first signal output; flowing the polydispersed particle calibration sample dispersed in the fluid through a reference optical particle counter to produce a reference signal output; comparing the first signal output with the reference signal output; and adjusting, in response to the comparing, an effective sample volume parameter stored in a computer readable memory of the optical particle counter under calibration.Type: ApplicationFiled: February 5, 2024Publication date: August 8, 2024Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventor: Brian A. KNOLLENBERG
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Publication number: 20240230509Abstract: The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.Type: ApplicationFiled: October 27, 2023Publication date: July 11, 2024Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Timothy A. ELLIS, Chris BONINO, Brian A. KNOLLENBERG, James LUMPKIN, Daniel RODIER, Dwight SEHLER, Mehran Vahdani MOGHADDAM, Thomas RAMIN
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Patent number: 11988593Abstract: The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.Type: GrantFiled: November 20, 2020Date of Patent: May 21, 2024Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Timothy A Ellis, Chris Bonino, Brian A. Knollenberg, James Lumpkin, Daniel Rodier, Dwight Sehler, Mehran Vahdani Moghaddam, Thomas Ramin
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Publication number: 20240133793Abstract: The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.Type: ApplicationFiled: October 26, 2023Publication date: April 25, 2024Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Timothy A. ELLIS, Chris BONINO, Brian A. KNOLLENBERG, James LUMPKIN, Daniel RODIER, Dwight SEHLER, Mehran Vahdani MOGHADDAM, Thomas RAMIN
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Patent number: 11946852Abstract: Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.Type: GrantFiled: December 16, 2021Date of Patent: April 2, 2024Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Daniel Rodier, James Lumpkin, Dwight Sehler, Brian Knollenberg
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Publication number: 20230236107Abstract: A particle detection system may include a light source, a first beam splitter, a particle interrogation zone, a reflecting surface, a second beam splitter, a first photodetector, and a second photodetector. The first beam splitter may be configured to split the source beam into an interrogation beam and a reference beam. The particle interrogation zone may be disposed in the path of the interrogation beam. The reflecting surface may be configured to reflect the interrogation beam back on itself. The second beam splitter may be configured to: (i) receive the reference beam and side scattered light from one or more particles interacting with the interrogation beam in the particle interrogation zone; and (ii) produce a first component beam and second component beam. The first photodetector may be configured to detect the first component beam. The second photodetector may be configured to detect the second component beam.Type: ApplicationFiled: January 19, 2023Publication date: July 27, 2023Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Mehran Vahdani MOGHADDAM, Brian A. KNOLLENBERG, Dwight SEHLER
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Publication number: 20230087059Abstract: A particle detection system may include a laser optical source providing a beam of electromagnetic radiation, one or more beam shaping elements for receiving the beam of electromagnetic radiation, an optical isolator disposed in the path of the beam, between the laser source and the one or more beam shaping elements, a particle interrogation zone disposed in the path of the beam, wherein particles in the particle interrogation zone interact with the beam of electromagnetic radiation, and a first photodetector configured to detect light scattered and/or transmitted from the particle interrogation zone, a second photodetector configured to monitor power of the beam, and a controller configured to adjust the beam power based on a signal from the second photodetector, wherein the optical isolator is configured to filter optical feedback from the particle detection system out of an optical path leading to the second photodetector.Type: ApplicationFiled: September 22, 2022Publication date: March 23, 2023Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Brian A. KNOLLENBERG, Dwight SEHLER, Saeid ROSTAMI
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Publication number: 20220397519Abstract: Modular docking station and methods for sampling and monitoring gas and other fluids, where a sampling device is able to be removably attached to the docking station, thereby allowing the sampling device to be replaced without having to remove or disconnect the docking station from the rest of the sampling system. This allows the docking station to remain connected to the rest of the system with minimal or no interruption and reduces maintenance costs and time when replacing the sampling device.Type: ApplicationFiled: June 14, 2022Publication date: December 15, 2022Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Brian A. KNOLLENBERG, Edward YATES, Daniel RODIER
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Publication number: 20220397495Abstract: A manifold system and methods of collecting samples, where the manifold system comprises multiple input sample ports and a preferably rotatable flow focusing element. The manifold system is able to sample aerosols and gases from multiple sample points, such as from cleanrooms and manufacturing environments, for collection and analysis. The flow focusing element reduces cross talk and cross contamination of particles, including nanoparticles, between different samples.Type: ApplicationFiled: June 14, 2022Publication date: December 15, 2022Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Edward YATES, Cary HERTERT, Brian A. KNOLLENBERG, Jonathan SKUBA
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Publication number: 20220397510Abstract: Disclosed is a method for detecting and/or growing particles, comprising controlling the surface area exposed to the saturator region by monitoring at least one of a depth of the working liquid on the saturator surface, the surface area exposed to the saturator region, or a volume of the working liquid on the saturator surface. Also disclosed is an apparatus or system for detecting and/or growing particles, comprising a fluidics system configured to control the surface area exposed to the saturator region by monitoring at least one of a depth of the working liquid on the saturator surface, the surface area exposed to the saturator region, or a volume of the working liquid on the saturator surface. Certain aspects do not employ one or more porous structures for vapor generation, nor a separate carrier fluid flow or inlet comprising a carrier fluid and vaporized working liquid for combining with the sample flow in the saturator region.Type: ApplicationFiled: June 14, 2022Publication date: December 15, 2022Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Edward YATES, Cary HERTERT, Brian A. KNOLLENBERG
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Patent number: 11428619Abstract: Provided herein is a particle analyzer that is operably connected to a probe unit that is capable of both dislodging particles from a surface and sampling the particles after they have been dislodged. The devices and methods described herein may be lightweight and/or handheld, for example, so that they may be used within a cleanroom environment to clean and sample permanent surfaces and tools. The devices may include optical particle counters that use scattered, obscured or emitted light to detect particles, including condensation particle counting systems or split detection optical particle counters to increase the sensitivity of the device and thereby facilitate detection of smaller particles, while avoiding the increased complexity typically required for the detection of nanoscale particles, such as particles less than 100 nm in effective diameter.Type: GrantFiled: January 20, 2021Date of Patent: August 30, 2022Assignee: Particle Measuring Systems, Inc.Inventors: Brian A. Knollenberg, Daniel Robert Rodier
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Patent number: 11428617Abstract: Provided herein are particle detection systems, and related methods configured to characterize a liquid sample, comprising: a first probe configured to determine a first parameter set of a plurality of first particles in a liquid sample, the first particles characterized by a size characteristic selected from a first size range; wherein the first parameter set comprises a first size distribution and a first concentration; and a second probe configured to determine a second parameter set of one or more second particles in the liquid sample, the second particles being characterized by a size characteristic selected from a second size range; wherein the second parameter set comprises a second size distribution and a second concentration.Type: GrantFiled: December 29, 2020Date of Patent: August 30, 2022Assignee: Particle Measuring Systems, Inc.Inventors: Brian A. Knollenberg, Daniel Rodier
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Publication number: 20220155212Abstract: Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.Type: ApplicationFiled: December 16, 2021Publication date: May 19, 2022Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Daniel RODIER, James LUMPKIN, Dwight SEHLER, Brian KNOLLENBERG
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Patent number: 11320360Abstract: Provided herein are systems and methods of optical particle counters which account and adjust for the refractive index of the carrier fluid being analyzed. The provided systems are robust and may be implemented in a variety of optical particle counters including obscured light, reflected light, emitted light and scattered light particle counters. The described systems may be useful with any fluid, including gases or liquids. In some cases, the system can account for the differences in refractive index between two liquids, for example, ultrapure water and an acid, such as sulfuric, hydrochloric, hydrofluoric, acetic, phosphoric, chromic phosphoric, and the like. By accounting for the refractive index of the carrier fluid, the described systems and methods are also more sensitive and able to more accurately detect and characterize smaller particles, including nanoscale sized particles.Type: GrantFiled: August 30, 2019Date of Patent: May 3, 2022Assignee: Particle Measuring Systems, Inc.Inventors: James M. Lumpkin, Brian A. Knollenberg, John R. Mitchell
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Patent number: 11268930Abstract: Described herein are monitoring systems and methods, including for airborne molecular contamination (AMC), that combine a sampler, such as an impinger or sorbent tube with a real time analyzer, such as an ion mobility spectrometer (IMS) or optical particle counter. The system may allow for selective sampling in which the sampler is only exposed to the target fluid during periods in which the real time analyzer detects analytes, such as molecular contamination or particles, meeting particular criteria such the composition and/or concentration of analytes. The invention also includes impinger systems having a sampler reservoir comprising an anion leaching resistant material characterized by low anion leach rates in the presence of deionized water.Type: GrantFiled: August 25, 2020Date of Patent: March 8, 2022Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Daniel Rodier, Brian Knollenberg, Isidro Sanchez
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Patent number: 11250684Abstract: The invention generally provides devices and methods for particle detection for minimizing human-caused contamination in manufacturing environments requiring low levels of microbes, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Methods of the invention may incorporate wirelessly transmitting an alarm signal from a particle detector to a remote device, replicating a graphical user interface of the particle detector on an electronic display of the remote device, and passing one or more user instructions from the remote device to the particle detector via the replicate graphical interface of the remote device.Type: GrantFiled: April 7, 2021Date of Patent: February 15, 2022Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Scott MacLaughlin, Matt Michaelis, Brian A. Knollenberg
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Patent number: 11237095Abstract: Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.Type: GrantFiled: April 24, 2020Date of Patent: February 1, 2022Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Daniel Rodier, James Lumpkin, Dwight Sehler, Brian Knollenberg
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Publication number: 20210208054Abstract: The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.Type: ApplicationFiled: November 20, 2020Publication date: July 8, 2021Applicant: Particle Measuring Systems, Inc.Inventors: Timothy A. ELLIS, Chris BONINO, Brian A. KNOLLENBERG, James LUMPKIN, Daniel RODIER, Dwight SEHLER, Mehran Vahdani MOGHADDAM, Thomas RAMIN
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Publication number: 20210190659Abstract: Provided herein are particle detection systems, and related methods configured to characterize a liquid sample, comprising: a first probe configured to determine a first parameter set of a plurality of first particles in a liquid sample, the first particles characterized by a size characteristic selected from a first size range; wherein the first parameter set comprises a first size distribution and a first concentration; and a second probe configured to determine a second parameter set of one or more second particles in the liquid sample, the second particles being characterized by a size characteristic selected from a second size range; wherein the second parameter set comprises a second size distribution and a second concentration.Type: ApplicationFiled: December 29, 2020Publication date: June 24, 2021Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Brian A. KNOLLENBERG, Daniel RODIER