Abstract: Apparatus for inspecting contour of a container sidewall includes at least one light source for directing light energy onto the container sidewall and at least one light sensor disposed to receive light energy from the light source reflected from the container sidewall. The light sensor is responsive to such reflected light energy to provide signals indicative of position of the container sidewall relative to the sensor at at least two locations on the container sidewall spaced from each other in the direction of the container axis. An information processor is responsive to such signals to determine contour of the container sidewall as a function of sidewall positions at such locations. The at least two locations on the container sidewall preferably are nominally aligned with each other in a direction parallel to the container axis.

Abstract: A container inspection apparatus and method measures both warp and off-level of an annular sealing surface of a container. The apparatus preferably has a warp gauge device and an off-level gauge device suspended over a container support and base by at least one column for the warp gauge device and a pillar for the off-level gauge device. When measuring for warp, the off-level gauge device is constructed and arranged to pivot clear of the warp gauge device, and vice-versa when measuring for off-level. The container preferably is held laterally or radially in place by two V-bracket assemblies, and vertically in place by a container support. The V-bracket assemblies are adjustable vertically to accommodate containers of differing diameters and heights.

Abstract: Apparatus for inspecting a container includes an optical inspection device having at least one light source for directing light energy onto the container as the container is rotated around an axis, and at least one light sensor for receiving light energy from the light source following interaction with the container. An image processor is coupled to the sensor for detecting rotation of the container as a function of fluctuations in the output from the sensor. Rotation of the container will cause some fluctuation in the output of the sensor due to interaction of the light energy with the container. The absence of any detected fluctuations in the sensor output is interpreted as an indication that the container is not rotating, either due to malformation of the container, malfunction of the mechanism for rotating the container, or some other reason.

Abstract: Apparatus for inspecting contour of a container sidewall includes at least one light source for directing light energy onto the container sidewall and at least one light sensor disposed to receive light energy from the light source reflected from the container sidewall. The light sensor is responsive to such reflected light energy to provide signals indicative of position of the container sidewall relative to the sensor at at least two locations on the container sidewall spaced from each other in the direction of the container axis. An information processor is responsive to such signals to determine contour of the container sidewall as a function of sidewall positions at such locations. The at least two locations on the container sidewall preferably are nominally aligned with each other in a direction parallel to the container axis.

Abstract: Apparatus for inspecting a container finish includes at least one light source for directing light energy onto the sealing surface of a container. At least one light sensor is disposed to receive light energy reflected from the sealing surface of the container, and is responsive to such reflected light energy to provide signals indicative of the level of the sealing surface at at least four points on the sealing surface spaced from each other around the axis of the container finish. An information processor is responsive to such signals for detecting variations in level at the sealing surface of the container. In the preferred embodiments of the invention, the points on the sealing surface from which reflected energy is received at the sensor are at a nominal angle of 90° from each other. The information processor preferably is responsive to such signals for detecting warp, dip, off-level and overall height variations at the sealing surface.