Patents by Inventor Brian A. Lepine

Brian A. Lepine has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for non-destructive analysis of multiple structural parameters
    Patent number: 10585067
    Abstract: A system and method for non-destructive analysis of a structure. A probe acquires a transient time based reference signal and at least one test signal. The reference signal and test signals are transformed to the frequency domain. The frequency domain test signal can be normalized using the frequency domain reference signal. Parameters of interest are evaluated at each test location by iteratively determining estimated parameter values, generating an estimated frequency domain test signal using the estimated parameter values and determining the convergence between the estimated frequency domain test signal and the normalized frequency domain test signal. The parameters values are determined as the estimated parameter values resulting in a maximized convergence between the estimated signal and the normalized test signal. The parameter values can be used to visualize and model various features of the structure.
    Type: Grant
    Filed: January 31, 2017
    Date of Patent: March 10, 2020
    Assignee: Atomic Energy Of Canada Limited
    Inventors: Dag Horn, Brian A. Lepine, Jia Lei
  • METHOD FOR NON-DESTRUCTIVE ANALYSIS OF MULTIPLE STRUCTURAL PARAMETERS
    Publication number: 20170219528
    Abstract: A system and method for non-destructive analysis of a structure. A probe acquires a transient time based reference signal and at least one test signal. The reference signal and test signals are transformed to the frequency domain. The frequency domain test signal can be normalized using the frequency domain reference signal. Parameters of interest are evaluated at each test location by iteratively determining estimated parameter values, generating an estimated frequency domain test signal using the estimated parameter values and determining the convergence between the estimated frequency domain test signal and the normalized frequency domain test signal. The parameters values are determined as the estimated parameter values resulting in a maximized convergence between the estimated signal and the normalized test signal. The parameter values can be used to visualize and model various features of the structure.
    Type: Application
    Filed: January 31, 2017
    Publication date: August 3, 2017
    Inventors: Dag Horn, Brian A. Lepine, Jia Lei