Patents by Inventor Brian Buras

Brian Buras has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12007428
    Abstract: Embodiments of the present invention provide systems and methods for multidimensional parts average testing for testing devices and analyzing testing results to detect outliers according to embodiments of the present invention. The testing can include calculating multivariate (e.g., bivariate) statistics using delta measurements of like devices, a ratio of measurements, or principal component analysis that identifies eigenvectors and eigenvalues to define meta parameters, for example. Raw test result data can be converted to residual space and robust regression can be performed to prevent outlier results from influencing regression, thereby reducing overkill advantageously.
    Type: Grant
    Filed: October 8, 2021
    Date of Patent: June 11, 2024
    Assignee: ADVANTEST CORPORATION
    Inventors: Kenneth Butler, Ira Leventhal, Constantinos Xanthopoulos, Alan Hart, Brian Buras, Keith Schaub
  • Publication number: 20230111543
    Abstract: Embodiments of the present invention provide systems and methods for multidimensional parts average testing for testing devices and analyzing testing results to detect outliers according to embodiments of the present invention. The testing can include calculating multivariate (e.g., bivariate) statistics using delta measurements of like devices, a ratio of measurements, or principal component analysis that identifies eigenvectors and eigenvalues to define meta parameters, for example. Raw test result data can be converted to residual space and robust regression can be performed to prevent outlier results from influencing regression, thereby reducing overkill advantageously.
    Type: Application
    Filed: October 8, 2021
    Publication date: April 13, 2023
    Inventors: Kenneth Butler, Ira Leventhal, Constantinos Xanthopoulos, Alan Hart, Brian Buras, Keith Schaub
  • Patent number: 10371744
    Abstract: A method of performing a test using automated test equipment (ATE) is disclosed. The method comprises configuring a proxy application programming interface (API) services module, wherein the proxy API services module provides an interface between a test framework and a test software environment, wherein the test framework communicates with the test software environment though the proxy API services module, wherein the test software environment is communicatively coupled with test hardware, and wherein the proxy API services module is configured to isolate the test framework from dependencies associated with the test software environment.
    Type: Grant
    Filed: March 2, 2015
    Date of Patent: August 6, 2019
    Assignee: ADVANTEST CORPORATION
    Inventor: Brian Buras
  • Patent number: 9448276
    Abstract: A method of testing a device. The method comprises determining a computational window. The computational window is a time period of device testing activity below an activity threshold. The at least one computational window occurs during the device testing activity. The method further comprises creating and executing a decision tree during the computational window. The decision tree comprises a scheduled test analysis of test results and a selection of test control actions scheduled to execute in response to the test analysis.
    Type: Grant
    Filed: April 11, 2012
    Date of Patent: September 20, 2016
    Assignee: ADVANTEST CORPORATION
    Inventors: Henry Arnold, Brian Buras, Pierre Gauthier, James Stephen Ledford
  • Patent number: 9322874
    Abstract: An apparatus for testing a device. The apparatus comprises a test control module and a test analysis module. The test control module is operable to generate and transmit first prober and handler (PH) requests to a supervisor module. The supervisor module is operable to transmit first PH commands to a prober and handler for execution thereof. The test analysis module is operable to generate and transmit second PH requests to the supervisor module. The supervisor module is further operable to transmit second PH commands to the prober and handler for execution thereof. The execution of the second PH commands are performed transparently to the test control module.
    Type: Grant
    Filed: April 11, 2012
    Date of Patent: April 26, 2016
    Assignee: ADVANTEST CORPORATION
    Inventors: Henry Arnold, Pierre Gauthier, Brian Buras, James Stephen Ledford
  • Publication number: 20150177316
    Abstract: A method of performing a test using automated test equipment (ATE) is disclosed. The method comprises configuring a proxy application programming interface (API) services module, wherein the proxy API services module provides an interface between a test framework and a test software environment, wherein the test framework communicates with the test software environment though the proxy API services module, wherein the test software environment is communicatively coupled with test hardware, and wherein the proxy API services module is configured to isolate the test framework from dependencies associated with the test software environment.
    Type: Application
    Filed: March 2, 2015
    Publication date: June 25, 2015
    Inventor: Brian Buras
  • Publication number: 20130275072
    Abstract: An apparatus for testing a device. The apparatus comprises a test control module and a test analysis module. The test control module is operable to generate and transmit first prober and handler (PH) requests to a supervisor module. The supervisor module is operable to transmit first PH commands to a prober and handler for execution thereof. The test analysis module is operable to generate and transmit second PH requests to the supervisor module. The supervisor module is further operable to transmit second PH commands to the prober and handler for execution thereof. The execution of the second PH commands are performed transparently to the test control module.
    Type: Application
    Filed: April 11, 2012
    Publication date: October 17, 2013
    Inventors: Henry Arnold, Pierre Gauthier, Brian Buras, James Stephen Ledford
  • Publication number: 20130275357
    Abstract: A method for analyzing test results. The method comprises selecting selected control rules for verification from a plurality of stored, accessing selected test results, performing selected statistical analyses of the selected test results, and executing at least one action of a plurality of selected actions, wherein the plurality of selected actions is selected by a result of the selected statistical analyses. The plurality of selected control rules are arranged in a decision tree. The decision tree comprises a schedule for verification of the selected control rules. A selection of the test results is defined by the plurality of selected control rules. A selection of statistical analyses is defined by the plurality of selected control rules and the decision tree. There is at least one action selected by the decision tree.
    Type: Application
    Filed: April 11, 2012
    Publication date: October 17, 2013
    Inventors: Henry Arnold, Pierre Gauthier, Brian Buras, James Stephen Ledford
  • Publication number: 20130275073
    Abstract: A method of testing a device. The method comprises determining a computational window. The computational window is a time period of device testing activity below an activity threshold. The at least one computational window occurs during the device testing activity. The method further comprises creating and executing a decision tree during the computational window. The decision tree comprises a scheduled test analysis of test results and a selection of test control actions scheduled to execute in response to the test analysis.
    Type: Application
    Filed: April 11, 2012
    Publication date: October 17, 2013
    Inventors: Henry Arnold, Brian Buras, Pierre Gauthier, James Stephen Ledford