Abstract: In an embodiment, a portable solar system includes a solar panel assembly and a case. The solar panel assembly includes a frame at least partially surrounding the solar panel assembly. The case includes a case front and a case back. The case back is movably attached to the case front at a first hinge. The frame of the solar panel assembly is attached to the case back on an interior side of the case. The case back includes a storage pocket that is accessible from an exterior side of the case.

Abstract: A solar panel assembly includes a substrate and a solar array coupled to the substrate. The solar array includes a plurality of photovoltaic cells. An optical layer is disposed over the solar array. The optical layer, the solar array, and the substrate together form a solar assembly. A frame surrounds the solar assembly and includes a plurality of frame members. Each frame member of the plurality of frame members includes an arcuate member that forms an aerodynamic outer edge of the frame member.

Abstract: A solar panel assembly includes a substrate and a solar array coupled to the substrate. The solar array includes a plurality of photovoltaic cells. An optical layer is disposed over the solar array. The optical layer, the solar array, and the substrate together form a solar assembly. A frame surrounds the solar assembly and includes a plurality of frame members. Each frame member of the plurality of frame members includes an arcuate member that forms an aerodynamic outer edge of the frame member.

Abstract: In an embodiment, a portable solar system includes a solar panel assembly and a case. The solar panel assembly includes a frame at least partially surrounding the solar panel assembly. The case includes a case front and a case back. The case back is movably attached to the case front at a first hinge. The frame of the solar panel assembly is attached to the case back on an interior side of the case. The case back includes a storage pocket that is accessible from an exterior side of the case.

Abstract: A solar panel assembly includes a substrate and a solar array coupled to the substrate. The solar array includes a plurality of photovoltaic cells. An optical layer is disposed over the solar array. The optical layer, the solar array, and the substrate together form a solar assembly. A frame surrounds the solar assembly and includes a plurality of frame members. Each frame member of the plurality of frame members includes an arcuate member that forms an aerodynamic outer edge of the frame member.

Abstract: In an embodiment, a portable solar system includes a solar panel assembly and a case. The solar panel assembly includes a frame at least partially surrounding the solar panel assembly. The case includes a case front and a case back. The case back is movably attached to the case front at a first hinge. The frame of the solar panel assembly is attached to the case back on an interior side of the case. The case back includes a storage pocket that is accessible from an exterior side of the case.

Abstract: A solar panel assembly includes a substrate and a solar array coupled to the substrate. The solar array includes a plurality of photovoltaic cells. An optical layer is disposed over the solar array. The optical layer, the solar array, and the substrate together form a solar assembly. A frame surrounds the solar assembly and includes a plurality of frame members. Each frame member of the plurality of frame members includes an arcuate member that forms an aerodynamic outer edge of the frame member.

Abstract: Provided are methods of fabricating memory cells such as resistive random access memory (ReRAM) cells. A method involves forming a first layer including two high-k dielectric materials such that one material has a higher dielectric constant than the other material. In some embodiments, hafnium oxide and titanium oxide form the first layer. The higher-k material may be present at a lower concentration. In some embodiments, a concentration ratio of these two high-k materials is between about 3 and 7. The first layer may be formed using atomic layer deposition. The first layer is then annealed in an oxygen-containing environment. The method may proceed with forming a second layer including a low-k dielectric material, such as silicon oxide, and forming an electrode. After forming the electrode, the memory cell is annealed in a nitrogen containing environment. The nitrogen anneal may be performed at a higher temperature than the oxygen anneal.

Abstract: Provided are methods of fabricating memory cells such as resistive random access memory (ReRAM) cells. A method involves forming a first layer including two high-k dielectric materials such that one material has a higher dielectric constant than the other material. In some embodiments, hafnium oxide and titanium oxide form the first layer. The higher-k material may be present at a lower concentration. In some embodiments, a concentration ratio of these two high-k materials is between about 3 and 7. The first layer may be formed using atomic layer deposition. The first layer is then annealed in an oxygen-containing environment. The method may proceed with forming a second layer including a low-k dielectric material, such as silicon oxide, and forming an electrode. After forming the electrode, the memory cell is annealed in a nitrogen containing environment. The nitrogen anneal may be performed at a higher temperature than the oxygen anneal.

Abstract: A method and memory device is provided for reading data from an ECC word of a plurality of reference bits associated with a plurality of memory device bits and determining if a double bit error in the ECC word exists. The ECC word may be first toggled twice and the reference bits reset upon detecting the double bit error.

Abstract: A method and memory device is provided for reading data from an ECC word of a plurality of reference bits associated with a plurality of memory device bits and determining if a double bit error in the ECC word exists. The ECC word may be first toggled twice and the reference bits reset upon detecting the double bit error.

Abstract: Methods (300, 400) and apparatus (46, 416, 470) are provided for sensing physical parameters. The apparatus (46, 416, 470) comprises a magnetic tunnel junction (MTJ) (32, 432), a magnetic field source (MFS) (34, 445, 476) whose magnetic field (35) overlaps the MTJ (32, 432) and a moveable magnetic cladding element (33, 448, 478) whose proximity (43, 462, 479, 479?) to the MFS (34, 445, 476) varies in response to an input to the sensor. The MFS (34, 445, 476) is located between the cladding element (33, 448, 478) and the MTJ (32, 432). Motion (41, 41?, 41-1, 464, 477) of the cladding element (33, 448, 478) relative to the MFS (34, 445, 476) in response to sensor input causes the magnetic field (35) at the MTJ (32, 432) to change, thereby changing the electrical properties of the MTJ (32, 432). A one-to-one correspondence (54) between the sensor input and the electrical properties of the MTJ (32, 432) is obtained.

Abstract: Magnetoelectronic device structures and methods for fabricating the same are provided. One method comprises forming a first and a second conductor. The first conductor is electrically coupled to an interconnect stack. A first insulating layer is deposited overlying the first conductor and the second conductor. A via is etched to substantially expose the first conductor. A protective capping layer is deposited by electroless deposition within the via and is electrically coupled to the first conductor. A magnetic memory element layer is formed within the via and overlying the second insulating layer and the second conductor.

Abstract: Structures for electrical communication with an overlying electrode for a semiconductor element and methods for fabricating such structures are provided. The structure for electrical communication with an overlying electrode comprises a first electrode having a lateral dimension, a semiconductor element overlying the first electrode, and a second electrode overlying the semiconductor element. The second electrode has a lateral dimension that is less than the lateral dimension of the first electrode. A conductive hardmask overlies the second electrode and is in electrical communication with the second electrode. The conductive hardmask has a lateral dimension that is substantially equal to the lateral dimension of the first electrode. A conductive contact element is in electrical communication with the conductive hardmask.

Abstract: A method for fabricating a flux concentrating system (62) for use in a magnetoelectronics device is provided. The method comprises the steps of providing a bit line (10) formed in a substrate (12) and forming a first material layer (24) overlying the bit line (10) and the substrate (12). Etching is performed to form a trench (58) in the first material layer (24) and a cladding layer (56) is deposited in the trench (52). A buffer material layer (58) is formed overlying the cladding layer (56) and a portion of the buffer material layer (58) and a portion of the cladding layer (56) is removed.

Abstract: A method for fabricating a flux concentrating system (62) for use in a magnetoelectronics device is provided. The method comprises the steps of providing a bit line (10) formed in a substrate (12) and forming a first material layer (24) overlying the bit line (10) and the substrate (12). Etching is performed to form a trench (58) in the first material layer (24) and a cladding layer (56) is deposited in the trench (52). A buffer material layer (58) is formed overlying the cladding layer (56) and a portion of the buffer material layer (58) and a portion of the cladding layer (56) is removed.

Abstract: A method for fabricating a cladded conductor (42) for use in a magnetoelectronics device is provided. The method includes providing a substrate (10) and forming a conductive barrier layer (12) overlying the substrate (10). A dielectric layer (16) is formed overlying the conductive barrier layer (12) and a conducting line (20) is formed within a portion of the dielectric layer (16). The dielectric layer (16) is removed and a flux concentrator (30) is formed overlying the conducting line (20).

Abstract: A method for contacting an electrically conductive layer overlying a magnetoelectronics element includes forming a memory element layer overlying a dielectric region. A first electrically conductive layer is deposited overlying the memory element layer. A first dielectric layer is deposited overlying the first electrically conductive layer and is patterned and etched to form a first masking layer. Using the first masking layer, the first electrically conductive layer is etched. A second dielectric layer is deposited overlying the first masking layer and the dielectric region. A portion of the second dielectric layer is removed to expose the first masking layer. The second dielectric layer and the first masking layer are subjected to an etching chemistry such that the first masking layer is etched at a faster rate than the second dielectric layer. The etching exposes the first electrically conductive layer.

Abstract: A method for contacting an electrically conductive electrode overlying a first dielectric material of a structure is provided. The method includes forming a mask layer overlying the electrically conductive electrode and patterning the mask layer to form an exposed electrically conductive electrode material. At least a portion of the exposed electrically conductive electrode material is removed while an electrically conductive veil is formed adjacent the mask layer. A metal contact layer is formed such that said metal contact layer contacts the electrically conductive veil.