Patents by Inventor Brian Charles Wadell

Brian Charles Wadell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Generating a waveform based on digital pulses
    Patent number: 11442098
    Abstract: Example automatic test equipment (ATE) includes a first test instrument to receive a waveform from a device under test, where the waveform is based on test signals sent from the ATE to the DUT; circuitry to generate digital pulses based on the waveform; and a second test instrument to receive the digital pulses over at least two digital pins and to process the digital pulses to test the DUT.
    Type: Grant
    Filed: June 20, 2019
    Date of Patent: September 13, 2022
    Assignee: TERADYNE, INC.
    Inventors: Brian Charles Wadell, Richard Pye
  • Handler change kit for a test system
    Patent number: 10972192
    Abstract: An example system includes a receptacle to house a device under test (DUT); an antenna for exchanging signals with the DUT, where at least some of the signals are for use in performing radiated testing of the DUT; and a cap configured to mate to the receptacle to form a housing to enclose the DUT. The housing is for isolating the DUT at least one of physically or electromagnetically.
    Type: Grant
    Filed: May 11, 2018
    Date of Patent: April 6, 2021
    Assignee: TERADYNE, INC.
    Inventors: Brian Charles Wadell, Jonathan Hanes Williams, Roger Allen Sinsheimer
  • GENERATING A WAVEFORM BASED ON DIGITAL PULSES
    Publication number: 20200400742
    Abstract: Example automatic test equipment (ATE) includes a first test instrument to receive a waveform from a device under test, where the waveform is based on test signals sent from the ATE to the DUT; circuitry to generate digital pulses based on the waveform; and a second test instrument to receive the digital pulses over at least two digital pins and to process the digital pulses to test the DUT.
    Type: Application
    Filed: June 20, 2019
    Publication date: December 24, 2020
    Inventors: Brian Charles Wadell, Richard Pye
  • HANDLER CHANGE KIT FOR A TEST SYSTEM
    Publication number: 20190349096
    Abstract: An example system includes a receptacle to house a device under test (DUT); an antenna for exchanging signals with the DUT, where at least some of the signals are for use in performing radiated testing of the DUT; and a cap configured to mate to the receptacle to form a housing to enclose the DUT. The housing is for isolating the DUT at least one of physically or electromagnetically.
    Type: Application
    Filed: May 11, 2018
    Publication date: November 14, 2019
    Inventors: Brian Charles Wadell, Jonathan Hanes Williams, Roger Allen Sinsheimer