Patents by Inventor Brian D. Butler

Brian D. Butler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9432064
    Abstract: A method and device for analyzing time domain waveforms traveling in electronic interconnect for the purpose of measuring the attenuation. This includes the use of an automated processing system and method to transmit a TDR step pulse into one end of an interconnect and to record the time domain waveform response from the same end of the interconnect. The processing algorithms separate the portions of the collected time domain waveform which contain return loss and insertion loss information and process each portion of that waveform data through FFT techniques to extract the frequency dependent loss data. The method describes the calibration techniques required to achieve these measurements and the device utilized can be a manual or robotic probing system.
    Type: Grant
    Filed: June 2, 2014
    Date of Patent: August 30, 2016
    Assignee: INTROBOTICS CORPORATION
    Inventors: Brian D. Butler, David L. Works
  • Publication number: 20150349899
    Abstract: A method and device for analyzing time domain waveforms traveling in electronic interconnect for the purpose of measuring the attenuation. This includes the use of an automated processing system and method to transmit a TDR step pulse into one end of an interconnect and to record the time domain waveform response from the same end of the interconnect. The processing algorithms separate the portions of the collected time domain waveform which contain return loss and insertion loss information and process each portion of that waveform data through FFT techniques to extract the frequency dependent loss data. The method describes the calibration techniques required to achieve these measurements and the device utilized can be a manual or robotic probing system.
    Type: Application
    Filed: June 2, 2014
    Publication date: December 3, 2015
    Applicant: Introbotics Corporation
    Inventors: Brian D. Butler, David L. Works
  • Patent number: 6798229
    Abstract: A coaxial probe for testing of planar electric transmission line structures comprising: a probe mount comprising a coaxial connector; a center electrode mounted on the probe mount and electrically connected to a center conductor of the coaxial connector, wherein the center conductor may be placed in contact with a first point on a planar electric transmission line structure to be tested; an outer electrode mounted on the probe mount and electrically connected to ground, the outer electrode comprising a protrusion to be placed in contact with a second point on the planar electric transmission line structure to be tested; and a dielectric of non-uniform thickness between the center and the outer electrodes.
    Type: Grant
    Filed: May 10, 2001
    Date of Patent: September 28, 2004
    Inventors: Brian D. Butler, Stephen M. Tobin
  • Patent number: 6759853
    Abstract: A robotic domain reflectometry test system (and corresponding method) comprising: domain reflectometry instrumentation; a robotic arm; and a passive, high frequency probe assembly comprising a signal probe and a ground probe having a fixed, non-adjustable pitch, the probe assembly being electrically connected to the domain reflectometry instrumentation, and being moved, electrically connected to, and retracted from test points on an electrical component to be tested by the robotic arm.
    Type: Grant
    Filed: December 15, 2000
    Date of Patent: July 6, 2004
    Inventor: Brian D. Butler
  • Publication number: 20030102876
    Abstract: A coaxial probe for testing of planar electric transmission line structures comprising: a probe mount comprising a coaxial connector; a center electrode mounted on the probe mount and electrically connected to a center conductor of the coaxial connector, wherein the center conductor may be placed in contact with a first point on a planar electric transmission line structure to be tested; an outer electrode mounted on the probe mount and electrically connected to ground, the outer electrode comprising a protrusion to be placed in contact with a second point on the planar electric transmission line structure to be tested; and a dielectric of non-uniform thickness between the center and the outer electrodes.
    Type: Application
    Filed: May 10, 2001
    Publication date: June 5, 2003
    Inventors: Brian D. Butler, Stephen M. Tobin
  • Publication number: 20020075009
    Abstract: A robotic domain reflectometry test system (and corresponding method) comprising: domain reflectometry instrumentation; a robotic arm; and a passive, high frequency probe assembly comprising a signal probe and a ground probe having a fixed, non-adjustable pitch, the probe assembly being electrically connected to the domain reflectometry instrumentation, and being moved, electrically connected to, and retracted from test points on an electrical component to be tested by the robotic arm.
    Type: Application
    Filed: December 15, 2000
    Publication date: June 20, 2002
    Inventor: Brian D. Butler