Patents by Inventor Brian D. Yanoff

Brian D. Yanoff has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250052916
    Abstract: Systems and methods are provided for a detector for medical imaging. The detector for medical imaging includes a mesh detector element formed on a planar side of a first semiconductor layer. The mesh detector element includes a metal layer including a plurality of longitudinal strips, where each longitudinal strip is positioned over a respective second semiconductor layer of the opposite doping polarity from the first semiconductor layer, and embedded in the first semiconductor layer. Further, each longitudinal strip is separated from a neighboring longitudinal strip by a respective opening of a plurality of openings, such that the metal layer does not extend continuously across a width of the mesh detector element.
    Type: Application
    Filed: August 9, 2023
    Publication date: February 13, 2025
    Inventors: Brian D. Yanoff, Biju Jacob
  • Publication number: 20230389884
    Abstract: Methods and systems are provided for repairing a defective segment of a sensor array of a photon counting detector of a photon counting computed tomography (PCCT) imaging system. In one example, a method for a PCCT imaging system comprises dividing a segment of the sensor array into a plurality of sub-segments, wherein each sub-segment of the plurality of sub-segments is electrically coupled to a readout electronics, the readout electronics configured to calculate a photon count for the segment; generating a total photon count for the divided segment based on combined electrical signals produced at each sub-segment of the divided segment; and reconstructing an image based on the total photon count at the divided segment. A defect detected in the divided segment may be traced to a defective sub-segment, which may be isolated from the readout electronics, thereby increasing a quality of the reconstructed image.
    Type: Application
    Filed: June 7, 2022
    Publication date: December 7, 2023
    Inventors: Nicholas R. Konkle, Brian D. Yanoff, John M. Boudry
  • Patent number: 8158951
    Abstract: An apparatus and methods for evaluating the operation of pixelated detectors are provided. The method includes obtaining data values for each of a plurality of pixels of a pixelated detector and determining a data consistency metric for each of the plurality of detector pixels. The method further includes identifying, using the determined data consistency metric, any detector pixels that exceed an acceptance criterion as noisy pixels.
    Type: Grant
    Filed: February 3, 2009
    Date of Patent: April 17, 2012
    Assignee: General Electric Company
    Inventors: Girish Bal, Floribertus Heukensfeldt Jansen, Osnat Zak, Gideon Berlad, Yaron Hefetz, Sergei Dolinsky, Brian D. Yanoff, John Eric Tkaczyk, Yanfeng Du, Ravindra Mohan Manjeshwar, Evren Asma, Qian Hua
  • Publication number: 20100193697
    Abstract: An apparatus and methods for evaluating the operation of pixelated detectors are provided. The method includes obtaining data values for each of a plurality of pixels of a pixelated detector and determining a data consistency metric for each of the plurality of detector pixels. The method further includes identifying, using the determined data consistency metric, any detector pixels that exceed an acceptance criterion as noisy pixels.
    Type: Application
    Filed: February 3, 2009
    Publication date: August 5, 2010
    Inventors: Girish Bal, Floribertus Heukensfeldt Jansen, Osnat Zak, Gideon Berlad, Yaron Hefetz, Sergei Dolinsky, Brian D. Yanoff, John Eric Tkaczyk, Yanfeng Du, Ravindra Mohan Manjeshwar, Evren Asma, Qian Hua