Abstract: A system includes a memory that stores instructions and receives a circuit netlist, and includes a processing unit that accesses the memory and executes the instructions. The instructions include an EDA application that includes a test-point flop allocation module that is configured to evaluate the circuit netlist to determine compatibility of the test-point nodes in the circuit netlist. The test-point flop allocation module can further allocate each of the test-point flops to a test-point sharing group comprising a plurality of compatible test-point nodes. The EDA application also includes a circuit layout module configured to generate a circuit layout associated with the circuit design, the circuit layout comprising the functional logic and scan-chains comprising the test-point flops allocated to the test-point sharing groups in response to the circuit netlist. The circuit layout is employable to fabricate an integrated circuit (IC) chip.

Abstract: In a circuit adapted for scan testing, a first set of connections configures the circuit elements into power domains with separate power-level controls, and a second set of connections configures the circuit elements to form scan segments for loading values into circuit elements from input ends of the scan segments and unloading values from circuit elements at output ends of the scan segments. A decompressor circuit receives a decompressor input and is operatively connected to the scan-segment input ends, and a compressor circuit is operatively connected to the scan segment output ends and generates a compressor output. Isolation circuits at scan-segment exits set values for scan segments at scan-segment exits when a corresponding independent power domain is in a power-off state.

Abstract: A method for testing integrated circuits is provided. The method provides for incorporating compression and decompression logic into each sub-component of an integrated circuit, developing test modes that target different sub-components of the integrated circuit, selecting one of the test modes, applying a test pattern to one or more sub-components of the integrated circuit targeted by the one test mode, comparing a response from application of the test pattern to a known good response, and diagnosing the response to determine which part of the one or more sub-components targeted by the one test mode failed when the response does not match the known good response.

Abstract: A method is provided to improve the usability of Design-For-Testability Synthesis (DFTS) tools and to increase the design process productivity. The method comprises receiving a list of testability and design impact analysis functions, to be performed on the circuit, also referred to as a device under test (DUT). The impact analysis leads to the creation of logical transformations, which can be selected by a user with one or more available transformation methods from a list including, but not limited to, boundary scan test logic insertion, scan test logic insertion, memory BIST (built-in-self-test) logic insertion, and logic BIST logic insertion, and scan test data compression insertion logic insertion.

Abstract: A method for testing integrated circuits is provided. The method provides for incorporating compression and decompression logic into each sub-component of an integrated circuit, developing test modes that target different sub-components of the integrated circuit, selecting one of the test modes, applying a test pattern to one or more sub-components of the integrated circuit targeted by the one test mode, comparing a response from application of the test pattern to a known good response, and diagnosing the response to determine which part of the one or more sub-components targeted by the one test mode failed when the response does not match the known good response.

Abstract: A method and a corresponding apparatus for verifying a minimal level sensitive timing abstraction model provides for an extension of the timing abstraction model. The method modifies and runs the timing abstraction model with certain stimulus to establish whether the timing results with the timing abstraction model are identical to the timing result with the modeled circuit. The timing abstraction model extension, which enables verification of the timing abstraction model, only negligibly increases the size of the timing abstraction model, thus keeping STA runtimes short and the memory requirements small.

Abstract: A method and a corresponding apparatus provides for modeling circuit environmental sensitivity for a basic minimal level sensitive timing abstraction model. Environmental issues typically include different external conditions, such as input signal switching time and output capacitive loading for the circuit, that are influenced by the circuitry surrounding the basic timing abstraction model. The method for modeling circuit environmental sensitivity involves creation of delay components that allow for modeling the circuit environmental sensitivities while maintaining the transparent regions of the circuit. To properly model the environment effects, zero delay elements may be inserted at input and output ports of the basic timing abstraction model, producing an improved abstraction model that retains accuracy and efficiency of the basic timing abstraction model.

Abstract: A method for improved load sensitivity modeling in a minimal level sensitive timing abstraction model provides for an extension of the timing abstraction model. The timing abstraction model extension improves accuracy of the timing abstraction model by splitting setup/hold check nodes and/or dummy latch nodes at certain input and/or output ports.

Abstract: A minimal level sensitive timing abstraction model supports multiple levels of hierarchy, is input stimulus independent, can be input into general static timing analysis (STA) tools, and limits timing analysis to the most critical paths, i.e., the most critical arrival at any given port, leading to significant reduction of the number of internal clock-controlled nodes, which in turn results in significant speed-up of STA runs on large circuits and reduced memory and storage space requirements. Further speed-up of STA runs may be achieved by tracing only the most relevant transparent paths to a given output port, which reduces the number of paths fed to the adjacent blocks. The timing abstraction model may also simplify the output from the timing analysis and may shorten designer's time to analyze STA results.

Abstract: A minimal level sensitive timing representative of a circuit path uses a circuit path timing model to represent a circuit block, which contains multiple circuit paths, in a simplified form, thus reducing the circuit paths to a minimized representation with same timing requirements and fixed clock waveforms. The reduction of the circuit paths in turn results in significant speed-up of static timing analysis (STA) runs on large circuits and reduced memory and storage space requirements. The minimal level sensitive timing representative may simplifies the output from the timing analysis and shortens designer's time to analyze STA results.