Patents by Inventor Brian G. Jamieson

Brian G. Jamieson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Intelligent ball for monitoring and diagnosis of heat exchanger tube health
    Patent number: 9903673
    Abstract: An intelligent ball sensor assembly for use with a heat exchanger system, includes a mechanically compliant ball having a recess formed therein. At least one sensor positioned on the ball is configured to gather selected information regarding a heat exchanger system. Signal conditioning control/transmission circuitry is operatively connected to the at least one sensor. A power source is operatively connected to the at least one sensor and the signal conditioning control/transmission circuitry. The sensor and the signal conditioning control/transmission circuitry cooperate to gather information about the status, health and efficiency of the heat exchanger system.
    Type: Grant
    Filed: September 8, 2016
    Date of Patent: February 27, 2018
    Assignee: Sentinel Diagnostics, LLC
    Inventors: Charles B. Dirks, Brian G. Jamieson, Michael A. Crocker
  • Systems, methods and apparatus of a low conductance silicon micro-leak for mass spectrometer inlet
    Patent number: 8742468
    Abstract: Systems, methods and apparatus are provided through which in some embodiments a mass spectrometer micro-leak includes a number of channels fabricated by semiconductor processing tools and that includes a number of inlet holes that provide access to the channels.
    Type: Grant
    Filed: September 23, 2010
    Date of Patent: June 3, 2014
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics Space Administration
    Inventors: Dan N. Harpold, Hasso B. Niemann, Brian G. Jamieson, Bernard A. Lynch
  • Systems, methods, and apparatus of a low conductance silicon micro-leak for mass spectrometer inlet
    Patent number: 8455926
    Abstract: Systems, methods and apparatus are provided through which in some embodiments a mass spectrometer micro-leak includes a number of channels fabricated by semiconductor processing tools and that includes a number of inlet holes that provide access to the channels.
    Type: Grant
    Filed: September 23, 2010
    Date of Patent: June 4, 2013
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Dan N. Harpold, Hasso B. Niemann, Brian G. Jamieson, Bernard A. Lynch
  • SYSTEMS, METHODS AND APPARATUS OF A LOW CONDUCTANCE SILICON MICRO-LEAK FOR MASS SPECTROMETER INLET
    Publication number: 20110097541
    Abstract: Systems, methods and apparatus are provided through which in some embodiments a mass spectrometer micro-leak includes a number of channels fabricated by semiconductor processing tools and that includes a number of inlet holes that provide access to the channels.
    Type: Application
    Filed: September 23, 2010
    Publication date: April 28, 2011
    Inventors: DAN N. HARPOLD, Hasso B. Niemann, Brian G. Jamieson, Bernard A. Lynch
  • SYSTEMS, METHODS, AND APPARATUS OF A LOW CONDUCTANCE SILICON MICRO-LEAK FOR MASS SPECTROMETER INLET
    Publication number: 20110095181
    Abstract: Systems, methods and apparatus are provided through which in some embodiments a mass spectrometer micro-leak includes a number of channels fabricated by semiconductor processing tools and that includes a number of inlet holes that provide access to the channels.
    Type: Application
    Filed: September 23, 2010
    Publication date: April 28, 2011
    Inventors: Dan N. Harpold, Hasso B. Niemann, Brian G. Jamieson, Bernard A. Lynch
  • Systems, methods, and apparatus of a low conductance silicon micro-leak for mass spectrometer inlet
    Patent number: 7922920
    Abstract: Systems, methods and apparatus are provided through which in some embodiments a mass spectrometer micro-leak includes a number of channels fabricated by semiconductor processing tools and that includes a number of inlet holes that provide access to the channels.
    Type: Grant
    Filed: September 27, 2007
    Date of Patent: April 12, 2011
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Dan N. Harpold, Hasso B. Niemann, Brian G. Jamieson, Bernard A. Lynch
  • SYSTEMS, METHODS, AND APPARATUS OF A LOW CONDUCTANCE SILICON MICRO-LEAK FOR MASS SPECTROMETER INLET
    Publication number: 20090110880
    Abstract: Systems, methods and apparatus are provided through which in some embodiments a mass spectrometer micro-leak includes a number of channels fabricated by semiconductor processing tools and that includes a number of inlet holes that provide access to the channels.
    Type: Application
    Filed: September 27, 2007
    Publication date: April 30, 2009
    Applicant: USA as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Dan N. Harpold, Hasso B. Niemann, Brian G. Jamieson, Bernard A. Lynch