Abstract: A polymerizable Gemini surfactant based on tail groups with mixed isomer dienes. The Gemini surfactants may be produced having imidazolium head groups and diene tail groups with a near-equal abundance of the “E” and “Z” isomers. These compounds are lyotropic liquid crystals that can form bicontinuous cubic phases by self-assembly.

Abstract: A polymer-based electrolyte material for use in lithium ion batteries that exhibits high bulk ion conductivity at ambient and sub-ambient temperatures. The polymer electrolyte comprises a polymer matrix and a liquid electrolyte which is an organic solvent containing a free lithium salt. The polymer matrix is cross-linked and can be formed of cross-linkable ionic monomers, particularly ionic LLC surfactant monomers.

Abstract: The present invention relates to a class of conducting oligomers and polymers and to a method for the preparation of the same. The conducting oligomers and polymers contain an end-capping group, which is non-electrically conductive and contains at least one branch point. The branched end-capping groups are made by a method that first substitutes the branched group on the heteroaromatic monomer, particularly at the “2” position on these monomers. In a second step, the end-capping intermediate is co-polymerized with one or more additional heteroaromatic monomers to form capped conducting oligomers and polymers.

Abstract: An apparatus for determining pen acceleration for use in a signature vertification system. Capacitive transducer means are mounted in a pen, and change capacitance by an amount which is proportional to pen acceleration. A Blumlein bridge circuit is utilized to measure changes in the capacitance of the transducer means, and the output of the bridge is amplified and demodulated to result in a signal which is proportional to acceleration.

Abstract: A method or technique is disclosed for predicting precisely where oxygen precipitation will occur in semiconductor wafers that are being processed in connection with integrated circuit manufacture; the technique is based upon the discovery that such precipitation will occur at resistivity peaks measured prior to any thermal treatment of the wafers. In other words, the technique permits characterizing the wafers by the diametral resistivity profile that is obtained in the initial resistivity measurements, whereby a change in oxygen precipitation can be predicted precisely where compensated intrinsic regions have been measured in the initial measurements.