Abstract: Aspects of the invention include a first pull-down device and a second pull-down device, wherein a first drain terminal is connected to a second source terminal, and wherein a first gate terminal is connected to a true read local bitline, wherein a second drain terminal is connected to a compliment read local bit line, and wherein a second gate terminal is connected to a true write global bitline, a third pull-down device and a fourth pull-down device, wherein a third source terminal is connected to the voltage supply, wherein a third drain terminal is connected to a fourth source terminal, and wherein a third gate terminal is connected to the compliment read local bitline, and wherein a fourth drain terminal is connected to the true read local bitline, and wherein a fourth gate terminal is connected to a compliment write global bit line.

Abstract: Aspects of the invention include a first pull-down device and a second pull-down device, wherein a first drain terminal is connected to a second source terminal, and wherein a first gate terminal is connected to a true read local bitline, wherein a second drain terminal is connected to a compliment read local bit line, and wherein a second gate terminal is connected to a true write global bitline, a third pull-down device and a fourth pull-down device, wherein a third source terminal is connected to the voltage supply, wherein a third drain terminal is connected to a fourth source terminal, and wherein a third gate terminal is connected to the compliment read local bitline, and wherein a fourth drain terminal is connected to the true read local bitline, and wherein a fourth gate terminal is connected to a compliment write global bit line.

Abstract: Embodiments of the present invention are directed to methods, systems, and circuitry for reduced error in power consumption estimation for distinct circuitries. A non-limiting example includes distinct circuitry having an optimized power consumption definition. The distinct circuitry includes a substrate. The distinct circuitry includes an arrangement of interoperable hardware components disposed on the substrate having input pins defined according to a model described by a hardware description language operable to emulate toggle events of the interoperable hardware components defined by the model having a toggle event count based on combinations of the toggle events that correspond to predetermined power quantities. The toggle events define an aggregate toggle power consumption closer to an actual power consumption than an aggregate pin power consumption based on the input pins.

Abstract: A method for testing a circuit includes receiving, by a noise injection circuit, an input signal and generating a noise pulse. Generating the noise pulse includes computing an input resistor pulse, and computing an output resistor pulse. Generating the noise pulse further includes short-circuiting an output resistor substantially simultaneously with opening an input resistor. The method for testing the circuit includes modifying, by the noise injection circuit, the input signal using the noise pulse.

Abstract: An aspect a bit selection path configured to propagate a bit selection signal. The bit selection path includes bit selection delay circuitry defining a bit selection delay. The memory array includes a row selection path configured to propagate a row selection signal. The row selection path includes row selection delay circuitry defining a row selection delay. The memory array includes local selection circuitry. The local selection circuitry is configured to receive the bit selection signal from the bit selection path before the row selection signal from the row selection path according to the bit selection delay and the row selection delay.

Abstract: An aspect a bit selection path configured to propagate a bit selection signal. The bit selection path includes bit selection delay circuitry defining a bit selection delay. The memory array includes a row selection path configured to propagate a row selection signal. The row selection path includes row selection delay circuitry defining a row selection delay. The memory array includes local selection circuitry. The local selection circuitry is configured to receive the bit selection signal from the bit selection path before the row selection signal from the row selection path according the bit selection delay and the row selection delay.

Abstract: Embodiments of the present invention are directed to methods, systems, and circuitry for reduced error in power consumption estimation for distinct circuitries. A non-limiting example includes distinct circuitry having an optimized power consumption definition. The distinct circuitry includes a substrate. The distinct circuitry includes an arrangement of interoperable hardware components disposed on the substrate having input pins defined according to a model described by a hardware description language operable to emulate toggle events of the interoperable hardware components defined by the model having a toggle event count based on combinations of the toggle events that correspond to predetermined power quantities. The toggle events define an aggregate toggle power consumption closer to an actual power consumption than an aggregate pin power consumption based on the input pins.

Abstract: A method for testing a circuit includes receiving, by a noise injection circuit, an input signal and generating a noise pulse. Generating the noise pulse includes computing an input resistor pulse, and computing an output resistor pulse. Generating the noise pulse further includes short-circuiting an output resistor substantially simultaneously with opening an input resistor. The method for testing the circuit includes modifying, by the noise injection circuit, the input signal using the noise pulse.

Abstract: According to one or more embodiments of the present invention, a delay circuit includes a first sub-circuit that delays a leading edge of an input signal according to first control settings, the input signal being for an electric device. The delay circuit further includes a second sub-circuit that delays a trailing edge of the input signal according to second control settings. An output signal from the delay circuit is received by the electric device.