Patents by Inventor Brian John Eves

Brian John Eves has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Instrument and method for combined surface topography and spectroscopic analysis
    Patent number: 6855926
    Abstract: A combined surface topography and spectroscopic analysis instrument comprises a scanning tunnelling microscope tip (12); and a sample carrier (58) which supports a sample (10) so that a surface thereto to be analyzed is presented towards the tip (12). The sample carrier (58) and the tip (12) are relative movable to enable the distance between the tip (12) and the surface to be varied in use and the sample surface to be scanned in two dimensions by the tip (12). An electronic analyzer is positioned to detect electrons from the tip (12) which have been back-scattered off the sample surface. A voltage controller (59) enables selective operation of the tip (12) in a first voltage range in scanning tunnelling mode, to enable spatial resolution imaging of the sample surface, and in a second, higher, voltage range in electron field emission mode whereby to permit the electron analyzer to analyze the back-scattered electrons.
    Type: Grant
    Filed: January 31, 2001
    Date of Patent: February 15, 2005
    Assignee: The University of Birmingham
    Inventors: Richard Edward Palmer, Krister Svensson, Peter Georg Laitenberger, Frederic Festy, Brian John Eves
  • Instrument and method for combined surface topography and spectroscopic analysis
    Publication number: 20030010911
    Abstract: A combined surface topography and spectroscopic analysis instrument comprises a scanning tunnelling microscope tip (12); and a sample carrier (58) which supports a sample (10) so that a surface thereof to be analyzed is presented towards the tip (12). The sample carrier (58) and the tip (12) are relative movable to enable the distance between the tip (12) and the surface to be varied in use and the sample surface to be scanned in two dimensions by the tip (12). An electron analyzer is positioned to detect electrons from the tip (12) which have been back-scattered off the sample surface. A voltage controller (59) enables selective operation of the tip (12) in a first voltage range in scanning tunnelling mode, to enable spatial resolution imaging of the sample surface, and in a second, higher, voltage range in electron field emission mode whereby to permit the electron analyzer to analyze the back-scattered electrons.
    Type: Application
    Filed: July 25, 2002
    Publication date: January 16, 2003
    Inventors: Richard Edward Palmer, Krister Svensson, Peter Georg Laitenberger, Frederic Festy, Brian John Eves