Patents by Inventor Brian Joseph Grenon

Brian Joseph Grenon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Adaptive inspection method and system
    Patent number: 5978501
    Abstract: A method and system for detecting defects in the design of a photolithographic mask or a printed wafer. It derives an adaptive inspection algorithm that allows for a tighter inspection of a mask to a data set which has repeatable differences. The inspection should allow flexibility to remove un-important differences while maintaining a tight inspection capability.
    Type: Grant
    Filed: January 3, 1997
    Date of Patent: November 2, 1999
    Assignee: International Business Machines Corporation
    Inventors: Karen Marie Dusablon Badger, Brian Joseph Grenon, David Shawn O'Grady, Jacek Grzegorz Smolinski