Abstract: The invention is a system and method for calibrating a robotics system. The invention measures the actual performance of the robotics system when positioning objects at several calibration positions within an operational area. The invention then determines corrective factors based on the performance measurements. The robotics system uses the corrective factors to overcome positioning errors and operate in the field with extreme precision. The calibration system comprises a control system, a laser projection device, a plate, and a laser detection device. The robotics system positions the laser projection device to project a laser beam through a hole in the plate and onto a laser detection area on the laser detection device. The control system then directs the robotics system to move the laser projection device to a plurality of calibration positions.

Abstract: An automated system and method for testing circuitry utilizes robotics to place probe leads at selected points on a circuit board with extreme precision. The robotics includes motors and associated control software. The control software can process user input and direct the motors to place the probe leads. The control software also directs the probe to perform the testing and provides the test results to the user. Three motors position the probe leads as directed by the control software. The motors utilize a polar coordinate positioning system. A rotational motor positions a second probe lead in a rotational direction relative to a first probe lead. A radial motor positions the second probe lead in a radial direction relative to the first probe lead. A Z-direction motor positions both probe leads in a Z-direction relative to the circuitry and engages the probe leads with the circuitry.

Abstract: The printed circuit board fault injection circuit uses an automated fixture to enable a robot arm mechanism to position a probe at a designated test node on the printed circuit board under test and apply a fault signal thereto. The test apparatus ensures that the designated node is in contact with the fault injector probe and controllably applies a voltage and/or current signal of selected magnitude to the test node to typically create a stuck-at-one or a stuck-at-zero fault or any other definable condition. The fault injector probe produces a stuck-at-zero fault that is not subject to spurious high frequency harmonics by extending the dynamic range of the fault injector circuit to apply a negative voltage to the test node to rob the output stage of the logic circuit that drives the test node of all drive current, thereby forcing a solid stuck-at-zero condition.