Abstract: A test fixture (120) is disclosed for electrically testing a device under test (130) by forming a plurality of temporary mechanical and electrical connections between terminals (131) on the device under test (130) and contact pads (161) on the load board (160). The test fixture (120) has a replaceable membrane (150) that includes vias (151), with each via (151) being associated with a terminal (131) on the device under test (130) and a contact pad (161) on the load board (160). In some cases, each via (151) has an electrically conducting wall for conducting current between the terminal (131) and the contact pad (161). In some cases, each via (151) includes a spring (152) that provides a mechanical resisting force to the terminal (131) when the device under test (130) is engaged with the test fixture (120).

Abstract: A test fixture (120) is disclosed for electrically testing a device under test (130) by forming a plurality of temporary mechanical and electrical connections between terminals (131) on the device under test (130) and contact pads (161) on the load board (160). The test fixture (120) has a replaceable membrane (150) that includes vias (151), with each via (151) being associated with a terminal (131) on the device under test (130) and a contact pad (161) on the load board (160). In some cases, each via (151) has an electrically conducting wall for conducting current between the terminal (131) and the contact pad (161). In some cases, each via (151) includes a spring (152) that provides a mechanical resisting force to the terminal (131) when the device under test (130) is engaged with the test fixture (120).

Abstract: A test fixture (120) is disclosed for electrically testing a device under test (130) by forming a plurality of temporary mechanical and electrical connections between terminals (131) on the device under test (130) and contact pads (161) on the load board (160). The test fixture (120) has a replaceable membrane (150) that includes vias (151), with each via (151) being associated with a terminal (131) on the device under test (130) and a contact pad (161) on the load board (160). In some cases, each via (151) has an electrically conducting wall for conducting current between the terminal (131) and the contact pad (161). In some cases, each via (151) includes a spring (152) that provides a mechanical resisting force to the terminal (131) when the device under test (130) is engaged with the test fixture (120).

Abstract: A system for testing a microcircuit having a center ground (CG) terminal has an insert for electrically connecting the CG terminal to a ground contact on a load board. The insert is held within a housing by compression and frictional interaction between a resilient projection carried by the insert and a slot in a wall of an aperture holding the insert.

Abstract: A test fixture (120) is disclosed for electrically testing a device under test (130) by forming a plurality of temporary mechanical and electrical connections between terminals (131) on the device under test (130) and contact pads (161) on the load board (160). The test fixture (120) has a replaceable membrane (150) that includes vias (151), with each via (151) being associated with a terminal (131) on the device under test (130) and a contact pad (161) on the load board (160). In some cases, each via (151) has an electrically conducting wall for conducting current between the terminal (131) and the contact pad (161). In some cases, each via (151) includes a spring (152) that provides a mechanical resisting force to the terminal (131) when the device under test (130) is engaged with the test fixture (120). In some cases, the spring (201) is housed within a pair of nested, open-ended tubes (202, 203) that can slide longitudinally with respect to each other.

Abstract: An actuator device applies force to an integrated circuit package to enable temporary contact between a plurality of contacts on the integrated circuit package and to a set of test contacts carried on a contactor support. A cover is hinged at one side, and rotates to position that allows an actuator element to apply force through a lead backer to the integrated circuit package or its leads, pressing the integrated circuit contacts against the test contacts. A latch opposite to the hinge holds the cover in the closed position. An interlock mechanism may be provided to prevent operating the latch unless the actuator element has withdrawn the lead backer from the integrated circuit or its leads, thereby preventing damage to components.

Abstract: A system for testing a microcircuit having a center ground (CG) terminal has an insert for electrically connecting the CG terminal with a ground contact on a load board. The insert is held within a housing having an aperture that includes at least one shelf facing toward the load board. The shelf interacts with a resilient projection on the insert to distort the projection. The projection's resilient distortion generates continual force pressing the insert against the load board. The continual force limits migration of debris created by the testing operations into the interface between the insert and the load board.

Abstract: A system for testing a microcircuit having a center ground (CG) terminal has an insert for electrically connecting the CG terminal to a ground contact on a load board. The insert is held within a housing by compression and frictional interaction between a resilient projection carried by the insert and a slot in a wall of an aperture holding the insert.

Abstract: An interface apparatus for reception and delivery of a package from a first location to a second location. The apparatus comprises a nest assembly having an interior defining a nest for receiving a package. The nest is formed by a plurality of sidewalls each having an interior surface, an exterior surface, and an end surface extending between the interior and exterior surfaces. In one embodiment, the interface between the interior surface and the end surface is constructed and arranged having at least a portion of the interface surface substantially conforming to the shape of the angled portion of the leads.

Abstract: An interface apparatus for reception and delivery of a package from a first location to a second location. The apparatus comprises a nest assembly having an interior defining a nest for receiving a package. The nest is formed by a plurality of sidewalls each having an interior surface, an exterior surface, and an end surface extending between the interior and exterior surfaces. In one embodiment, the interface between the interior surface and the end surface is constructed and arranged having at least a portion of the interface surface substantially conforming to the shape of the angled portion of the leads.

Abstract: The present invention is a floating alignment member for use with integrated circuits. The member has a body generally comprised of an alignment plate. The alignment plate has a contact surface, an interface surface, and a plurality of apertures formed through the plate. Each of the plurality of apertures has an interior wall that forms the aperture and at least a portion of the interior wall is conically tapered inward from the interface surface to the contact surface. Each aperture is oriented on the plate to accommodate a contact of an integrated circuit.