Abstract: A system and method for performing nanoscale thermal property characterization of materials. The system combines the operating principles of thermoreflectance-based techniques and scanning probe microscopy techniques into a hybrid solution capable of deriving thermophysical properties of a sample. A pump laser beam heats a distal end of a cantilever, and a probe laser beam is reflected off of a specular surface at the distal end of the cantilever carrying with it thermoreflectance data that can be used to extract thermophysical properties of the sample region adjacent to a tip suspended at the distal end of the cantilever.

Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.

Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.

Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.

Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.

Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.

Abstract: A system is provided for the display of thermal data in a respiratory mask, the system comprising: a first respiratory mask frame; a lens disposed in the respiratory mask frame disposed in front of eyes of the user; a transparent display, being detachably mounted to the respiratory mask and displaying thermal imaging data.

Abstract: A level sensing system and method for determining the level of a conductive material in a casting mold are disclosed, wherein the level sensing system a drive circuit and an inductive component disposed adjacent to the casting mold, and a position of the conductive material in the casting mold may be determined by a change in an electrical characteristic of the drive circuit.

Abstract: A level sensing system and method for determining the level of a conductive material in a casting mold are disclosed, wherein the level sensing system a drive circuit and an inductive component disposed adjacent to the casting mold, and a position of the conductive material in the casting mold may be determined by a change in an electrical characteristic of the drive circuit.

Abstract: An equipment rack includes a subrack mounted in a first direction and one or more circuit cards, each circuit card being mounted in the subrack in a second direction substantially perpendicular to the first direction and in parallel with each other circuit card mounted in the subrack. Each circuit card includes one or more ports coupled to a respective optical fiber traveling in the second direction. The equipment rack also includes a fiber handling track mounted in the first direction. The fiber handling track includes one or more radius control bosses, the number of radius control bosses equaling or exceeding the number of circuit cards mounted in the subrack. Each of the radius control bosses is adapted to receive an optical fiber coupled to a respective one of the one or more circuit cards and divert the received optical fiber from the second direction to the first direction.

Abstract: A production circuit tuning tool consisting of a cover and a number of feed-through, gold-tipped probes that adjust the performance of an underlying circuit. The probes are positioned in the cover so that they may act as temporary jumpers between the trace wiring and tuning patches on the circuit substrate. The portion of the probe that bridges the patches comprises a slender nonconductive plunger of low dielectric constant material having a gold plated tip. Once the proper combination of jumpers is determined, the tuning tool cover is removed, permanent jumpers are soldered into place and a regular production cover is installed.