Patents by Inventor Brian M. Trapp

Brian M. Trapp has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8429193
    Abstract: A system and a method are provided. The method includes assigning an entity to a ticket group associated with an ID thereof, displaying to the entity reports, which are each organized with an associated security access control, in accordance with the ticket group, determining whether the entity is authorized to access any selected one or more of the reports in accordance with a result of a comparison between an access level associated with the entity ID and the security access control associated with each of the one or more of the stored reports, and granting or denying the access in accordance with the determination.
    Type: Grant
    Filed: January 9, 2009
    Date of Patent: April 23, 2013
    Assignee: International Business Machines Corporation
    Inventors: Yunsheng Song, Tso-Hui Ting, Brian M. Trapp
  • Publication number: 20100185675
    Abstract: A system and a method are provided. The method includes assigning an entity to a ticket group associated with an ID thereof, displaying to the entity reports, which are each organized with an associated security access control, in accordance with the ticket group, determining whether the entity is authorized to access any selected one or more of the reports in accordance with a result of a comparison between an access level associated with the entity ID and the security access control associated with each of the one or more of the stored reports, and granting or denying the access in accordance with the determination.
    Type: Application
    Filed: January 9, 2009
    Publication date: July 22, 2010
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Yunsheng Song, Tso-Hui Ting, Brian M. Trapp
  • Patent number: 7751920
    Abstract: A computing system, method, and computer program product facilitates data mining of information, for example image data, relating to a surface of a manufactured product when the manufactured product is processed using a tool relative to which the manufactured product may be randomly oriented. For each manufactured object, data pertaining to the surface is converted into a weight distribution. A rotational axis along which each surface would tend to rotate under the action of gravity with the surface supported at its geometric centroid is determined. The sets of data can then be properly oriented relative to one another for data mining by aligning the rotational axis of each set of data.
    Type: Grant
    Filed: December 8, 2006
    Date of Patent: July 6, 2010
    Assignee: International Business Machines Corporation
    Inventors: Thomas P. Moyer, Keith Tabakman, Brian M. Trapp
  • Publication number: 20090112352
    Abstract: A storage medium including a method of modeling yield for semiconductor products includes determining expected faults for each of a plurality of library elements by running a critical area analysis on each of the library elements, and assessing, from the critical area analysis, an expected number of faults per unit area, and comparing the same to actual observed faults on previously manufactured semiconductor products. Thereafter, the expected number of faults for each library element is updated in response to observed yield. A database is established, which includes the die size and expected faults for each of the library elements. Integrated circuit product die size is estimated, and library elements to be used to create the integrated circuit die are selected. Fault and size data for each of the selected library elements are obtained, the adjusted estimated faults for each of the library elements are summed, and estimated yield is calculated.
    Type: Application
    Filed: January 5, 2009
    Publication date: April 30, 2009
    Applicant: International Business Machines Corporation
    Inventors: Thomas S. Barnett, Jeanne P. Bickford, William Y. Chang, Rashmi D. Chatty, Sebnem Jaji, Kerry A. Kravec, Wing L. Lai, Gie Lee, Brian M. Trapp, Alan J. Weger
  • Patent number: 7477961
    Abstract: A method of modeling yield for semiconductor products includes determining expected faults for each of a plurality of library elements by running a critical area analysis on each of the library elements, and assessing, from the critical area analysis, an expected number of faults per unit area, and comparing the same to actual observed faults on previously manufactured semiconductor products. Thereafter, the expected number of faults for each library element is updated in response to observed yield. A database is established, which includes the die size and expected faults for each of the library elements. Integrated circuit product die size is estimated, and library elements to be used to create the integrated circuit die are selected. Fault and size data for each of the selected library elements are obtained, the adjusted estimated faults for each of the library elements are summed, and estimated yield is calculated.
    Type: Grant
    Filed: May 12, 2006
    Date of Patent: January 13, 2009
    Assignee: International Business Machines Corporation
    Inventors: Thomas S. Barnett, Jeanne P. Bickford, William Y. Chang, Rashmi D. Chatty, Sebnem Jaji, Kerry A. Kravec, Wing L. Lai, Gie Lee, Brian M. Trapp, Alan J. Weger
  • Publication number: 20080140247
    Abstract: A computing system, method, and computer program product facilitates data mining of information, for example image data, relating to a surface of a manufactured product when the manufactured product is processed using a tool relative to which the manufactured product may be randomly oriented. For each manufactured object, data pertaining to the surface is converted into a weight distribution. A rotational axis along which each surface would tend to rotate under the action of gravity with the surface supported at its geometric centroid is determined. The sets of data can then be properly oriented relative to one another for data mining by aligning the rotational axis of each set of data.
    Type: Application
    Filed: December 8, 2006
    Publication date: June 12, 2008
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Thomas P. Moyer, Keith Tabakman, Brian M. Trapp