Patents by Inventor Brian S. Merrow

Brian S. Merrow has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9002186
    Abstract: An apparatus for controlling the temperature of an object, comprises: a housing comprising: a cavity adapted to accept an object, an air inlet configured to allow air to flow into the cavity, and an air outlet configured to allow air to flow out of the cavity; and a nest configured to hold the object within the housing such that the smallest planar dimension of the object is substantially aligned with the smallest planar dimension of the cavity; wherein the nest and housing are adapted to direct air flow from the air inlet, substantially in parallel across at least one surface of the object and in the direction of the smaller dimension of the at least one surface, to the air outlet.
    Type: Grant
    Filed: October 2, 2012
    Date of Patent: April 7, 2015
    Assignee: Teradyne, Inc.
    Inventors: Larry W. Akers, Nathan Blosser, Brian S. Merrow
  • Publication number: 20140262149
    Abstract: An example system may include racks that house slots, in which devices may be stored for testing. Cold air from a cold atrium is drawn over the slots and expelled into a warm atrium. The resulting warm air is cooled and then recycled back through the slots to control slot temperature.
    Type: Application
    Filed: March 15, 2013
    Publication date: September 18, 2014
    Applicant: TERADYNE, INC.
    Inventor: Brian S. Merrow
  • Publication number: 20140271064
    Abstract: An example system may include the following features: slots configured to receive devices to be tested; a device transport mechanism to move devices between a shuttle mechanism and slots; a feeder to provide devices untested devices and to receive tested devices; and a shuttle mechanism to receive an untested device from the feeder and to provide the untested device to the device transport mechanism, and to receive a tested device from the device transport mechanism and to provide the tested device to the feeder.
    Type: Application
    Filed: March 15, 2013
    Publication date: September 18, 2014
    Inventors: Brian S. Merrow, Philip Campbell, Eric L. Truebenbach, Adna Khalid, John P. Toscano, Nathan James Blosser, Jianfa Pei, Marc LeSueur Smith
  • Patent number: 8712580
    Abstract: A method of transferring storage devices within a storage device testing system includes actuating an automated transporter to retrieve multiple storage devices presented for testing, and actuating the automated transporter to deliver each retrieved storage device to a respective test slot of the storage device testing system and insert each storage device in the respective test slot.
    Type: Grant
    Filed: April 16, 2009
    Date of Patent: April 29, 2014
    Assignee: Teradyne, Inc.
    Inventors: Evgeny Polyakov, Edward Garcia, Eric L. Truebenbach, Brian S. Merrow, Brian J. Whitaker
  • Patent number: 8687356
    Abstract: A storage device testing system that includes at least one rack, test slots housed by each rack, and at least one air mover in pneumatic communication with the test slots. Each test slot includes a test slot housing having an entrance and an exit, with the entrance configured to receive a storage device. The at least one air mover is configured to move air exterior to the racks into the entrance of each test slot housing, over the received storage device, and out of the exit of each test slot housing.
    Type: Grant
    Filed: February 2, 2010
    Date of Patent: April 1, 2014
    Assignee: Teradyne, Inc.
    Inventor: Brian S. Merrow
  • Patent number: 8655482
    Abstract: A storage device testing system includes one or more test racks, and one or more test slots housed by the one or more test racks, each test slot being configured to receive a storage device for testing. The storage device testing system also includes a transfer station for supplying storage devices to be tested. The one or more test racks and the transfer station at least partially define an operating area. The storage device testing system can also include automated machinery that is disposed within the operating area and is configured to transfer storage devices between the transfer station and the one or more test slots, and a cover at least partially enclosing the operating area, thereby at least partially inhibiting air exchange between the operating area and an environment surrounding the test racks.
    Type: Grant
    Filed: April 17, 2009
    Date of Patent: February 18, 2014
    Assignee: Teradyne, Inc.
    Inventor: Brian S. Merrow
  • Patent number: 8631698
    Abstract: A test rack for a storage device testing system includes a plurality of test slot carriers. Each of the test slot carriers includes a plurality of test slot assemblies. The test slot assemblies are configured to received and support storage devices for testing. The test rack also includes a chassis. The chassis includes a plurality of carrier receptacles for releasable receiving and supporting the test slot carriers. The test slot carriers are interchangeable with each other among the various carrier receptacles.
    Type: Grant
    Filed: February 2, 2010
    Date of Patent: January 21, 2014
    Assignee: Teradyne, Inc.
    Inventors: Brian S. Merrow, Valquirio N. Carvalho, John P. Toscano
  • Patent number: 8628239
    Abstract: A test slot assembly is provided for testing a storage device. The test slot assembly is configured to receive and support a storage device, or a storage device supported by a storage device transporter. The test slot assembly also includes a temperature sensing assembly. The temperature sensing assembly is arranged to measure a temperature of a storage device by way of physical contact. The test slot assembly also includes a clamping mechanism operatively associated with the housing. The clamping mechanism is operable to move the temperature sensing assembly into contact with a storage device.
    Type: Grant
    Filed: July 15, 2010
    Date of Patent: January 14, 2014
    Assignee: Teradyne, Inc.
    Inventors: Brian S. Merrow, Larry W. Akers
  • Patent number: 8549912
    Abstract: A disk drive transporter, for transporting a disk drive and for mounting a disk drive within a test slot, includes a frame configured to receive and support a disk drive. The frame includes sidewalls configured to receive a disk drive therebetween and sized to be inserted into a test slot along with a disk drive. The frame also includes a clamping mechanism operatively associated with at least one of the sidewalls. The clamping mechanism includes a first engagement element and a first actuator operable to initiate movements of the first engagement element. The first actuator is operable to move the first engagement element into engagement with a test slot after a disk drive being supported by the frame is arranged in a test position in a test slot.
    Type: Grant
    Filed: December 18, 2007
    Date of Patent: October 8, 2013
    Assignee: Teradyne, Inc.
    Inventors: Brian S. Merrow, Edward Garcia, Evgeny Polyakov
  • Patent number: 8547123
    Abstract: A test slot assembly is provided for testing a storage device. The test slot assembly is configured to receive and support a storage device, or a storage device supported by a storage device transporter. The test slot assembly also includes a conductive heating assembly. The conductive heating assembly is arranged to heat a storage device by way of thermal conduction.
    Type: Grant
    Filed: July 15, 2010
    Date of Patent: October 1, 2013
    Assignee: Teradyne, Inc.
    Inventors: Brian S. Merrow, Larry W. Akers
  • Patent number: 8499611
    Abstract: A disk drive emulator for testing a test slot of a disk drive testing system includes an emulator body, an interface connecter disposed on the emulator body, and at least one vibration sensor disposed on the emulator body. The emulator body comprises a material having a tensile modulus of at least 40×10^6 Psi.
    Type: Grant
    Filed: October 6, 2008
    Date of Patent: August 6, 2013
    Assignee: Teradyne, Inc.
    Inventors: Brian S. Merrow, Robert A. Dasilva
  • Patent number: 8482915
    Abstract: A disk drive test slot thermal control system includes a test slot. The test slot includes a housing and an air mover (e.g., a blower or a fan). The housing includes an outer surface, and an internal cavity. The internal cavity includes a test compartment for receiving a disk drive for testing. The housing also includes an inlet aperture extending from the outer surface of the housing to the internal cavity. The air mover can be disposed outside of the internal cavity to provide an air flow towards the test compartment through the inlet aperture.
    Type: Grant
    Filed: August 13, 2010
    Date of Patent: July 9, 2013
    Assignee: Teradyne, Inc.
    Inventor: Brian S. Merrow
  • Patent number: 8467180
    Abstract: A disk drive transporter, for transporting a disk drive and for mounting a disk drive within a test slot, includes a frame configured to receive and support a disk drive. The frame includes sidewalls configured to receive a disk drive therebetween and sized to be inserted into a test slot along with a disk drive. The frame also includes a clamping mechanism operatively associated with at least one of the sidewalls. The clamping mechanism includes a first engagement element and a first actuator operable to initiate movements of the first engagement element. The first actuator is operable to move the first engagement element into engagement with a test slot after a disk drive being supported by the frame is arranged in a test position in a test slot.
    Type: Grant
    Filed: April 23, 2010
    Date of Patent: June 18, 2013
    Assignee: Teradyne, Inc.
    Inventors: Brian S. Merrow, Edward Garcia, Evgeny Polyakov
  • Patent number: 8466699
    Abstract: A storage device transporter is provided for transporting a storage device and for mounting a storage device within a test slot. The storage device transporter includes a frame that is configured to receive and support a storage device. The storage device transporter also includes a conductive heating assembly that is associated with the frame. The conductive heating assembly is arranged to heat a storage device supported by the frame by way of thermal conduction.
    Type: Grant
    Filed: July 15, 2009
    Date of Patent: June 18, 2013
    Assignee: Teradyne, Inc.
    Inventors: Brian S. Merrow, Larry W. Akers
  • Patent number: 8451608
    Abstract: A storage device testing system cooling circuit includes a plurality of test racks. Each of the test racks include a test slot compartment and a test electronics compartment. Each of the test slot compartments includes multiple test slots, and one or more cooling conduits configured to convey a cooling liquid toward the test slots. Each of the test electronics compartments includes test electronics configured to communicate with the test slots for executing a test algorithm, and a heat exchanger in fluid communication with the one or more cooling conduits. The heat exchanger is configured to cool an air flow directed toward the test electronics.
    Type: Grant
    Filed: April 16, 2009
    Date of Patent: May 28, 2013
    Assignee: Teradyne, Inc.
    Inventor: Brian S. Merrow
  • Patent number: 8405971
    Abstract: A disk drive transporter, for transporting a disk drive and for mounting a disk drive within a test slot, includes a frame configured to receive and support a disk drive. The frame includes sidewalls configured to receive a disk drive therebetween and sized to be inserted into a test slot along with a disk drive. The frame also includes a clamping mechanism operatively associated with at least one of the sidewalls. The clamping mechanism includes a first engagement element and a first actuator operable to initiate movements of the first engagement element. The first actuator is operable to move the first engagement element into engagement with a test slot after a disk drive being supported by the frame is arranged in a test position in a test slot.
    Type: Grant
    Filed: April 26, 2010
    Date of Patent: March 26, 2013
    Assignee: Teradyne, Inc.
    Inventors: Brian S. Merrow, Edward Garcia, Evgeny Polyakov
  • Patent number: 8305751
    Abstract: A disk drive test slot includes a housing that defines a test compartment for receiving and supporting a disk drive transporter carrying a disk drive for testing. The housing also defines an open end that provides access to the test compartment for insertion and removal of disk drive transporter carrying a disk drive for testing. The disk drive test slot also includes a mounting plate connected to the housing. One or more isolators are disposed between the housing and the mounting plate. The one or more isolators are operable to inhibit transmission of vibrational energy between the housing and the mounting plate.
    Type: Grant
    Filed: April 17, 2008
    Date of Patent: November 6, 2012
    Assignee: Teradyne, Inc.
    Inventor: Brian S. Merrow
  • Patent number: 8279603
    Abstract: A test slot cooling system for a storage device testing system includes a storage device transporter having first and second portions. The first portion of the storage device transporter includes an air director and the second portion of the storage device transporter is configured to receive a storage device. The test slot cooling system includes a test slot housing defining an air entrance and a transporter opening for receiving the storage device transporter. The air entrance is in pneumatic communication with the air director of the received storage device transporter. The test slot cooling system also includes an air mover in pneumatic communication with the air entrance of the test slot housing for delivering air to the air director. The air director directs air substantially simultaneously over at least top and bottom surfaces of the storage device received in the storage device transporter.
    Type: Grant
    Filed: March 11, 2011
    Date of Patent: October 2, 2012
    Assignee: Teradyne, Inc.
    Inventors: Brian S. Merrow, Nicholas C. Krikorian
  • Patent number: 8238099
    Abstract: A disk drive testing system includes one or more test racks, and one or more test slots housed by the one or more test racks, each test slot being configured to receive and support a disk drive transporter carrying a disk drive for testing. The disk drive testing system also includes a transfer station for supplying disk drives to be tested. The one or more test racks and the transfer station at least partially define an operating area. The disk drive testing system can also include automated machinery that is disposed within the operating area and is configured to transfer disk drives between the transfer station and the one or more test slots, and a cover at least partially enclosing the operating area, thereby at least partially inhibiting air exchange between the operating area and an environment surrounding the test racks.
    Type: Grant
    Filed: April 17, 2008
    Date of Patent: August 7, 2012
    Assignee: Teradyne, Inc.
    Inventor: Brian S. Merrow
  • Publication number: 20120136477
    Abstract: A storage device transporter (400, 400b, 400c), for transporting a storage device (600) and for mounting a storage device within a test slot (500, 500b), includes a frame (410, 410b, 410c) configured to receive and support a storage device. The frame includes sidewalls (418, 425a, 425b, 429a, 429b) configured to receive a storage device there between and sized to be inserted into a test slot along with a storage device. The frame also includes a clamping mechanism (450) operatively associated with at least one of the sidewalls. The clamping mechanism includes a first engagement element (476, 700, 750) and a first actuator (454, 710, 760) operable to initiate movements of the first engagement element. The first actuator is operable to move the first engagement element into engagement with a test slot after a storage device being supported by the frame is arranged in a test position in a test slot.
    Type: Application
    Filed: April 17, 2009
    Publication date: May 31, 2012
    Applicant: TERADYNE, INC.
    Inventors: Brian S. Merrow, Edward Garcia, Evgeny Polyakov