Patents by Inventor Brian Schulkin

Brian Schulkin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20140306128
    Abstract: Methods and apparatus for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices and controllers to maintain or vary the polarization of modulated signals as desired. The methods and apparatus are provided to characterize electromagnetic fields by directing the electromagnetic field and a probe beam upon an electro-crystal and detecting the modulation of the resulting probe beam. Detection of the modulation of the probe beam is practiced by detecting and comparing the polarization components of the modulated probe beam. Aspects of the invention may be used to analyze or detect explosives, explosive related compounds, and pharmaceuticals, among other substances. A compact apparatus, modular optical devices for use with the apparatus, sample holders, and radiation source mounts are also disclosed.
    Type: Application
    Filed: June 26, 2014
    Publication date: October 16, 2014
    Applicant: RENSSELAER POLYTECHNIC INSTITUTE
    Inventors: Brian SCHULKIN, Xi-Cheng ZHANG, Thomas TONGUE, Jingzhou XU, Jian CHEN
  • Patent number: 8796653
    Abstract: Methods and apparatus for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices and controllers to maintain or vary the polarization of modulated signals as desired. The methods and apparatus are provided to characterize electromagnetic fields by directing the electromagnetic field and a probe beam upon an electro-crystal and detecting the modulation of the resulting probe beam. Detection of the modulation of the probe beam is practiced by detecting and comparing the polarization components of the modulated probe beam. Aspects of the invention may be used to analyze or detect explosives, explosive related compounds, and pharmaceuticals, among other substances. A compact apparatus, modular optical devices for use with the apparatus, sample holders, and radiation source mounts are also disclosed.
    Type: Grant
    Filed: September 20, 2010
    Date of Patent: August 5, 2014
    Assignee: Rensselaer Polytechnic Institute
    Inventors: Brian Schulkin, Xi-Cheng Zhang, Thomas Tongue, Jingzhou Xu, Jian Chen
  • Publication number: 20110006226
    Abstract: Methods and apparatus for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices and controllers to maintain or vary the polarization of modulated signals as desired. The methods and apparatus are provided to characterize electromagnetic fields by directing the electromagnetic field and a probe beam upon an electro-crystal and detecting the modulation of the resulting probe beam. Detection of the modulation of the probe beam is practiced by detecting and comparing the polarization components of the modulated probe beam. Aspects of the invention may be used to analyze or detect explosives, explosive related compounds, and pharmaceuticals, among other substances. A compact apparatus, modular optical devices for use with the apparatus, sample holders, and radiation source mounts are also disclosed.
    Type: Application
    Filed: September 20, 2010
    Publication date: January 13, 2011
    Applicant: RENSSELAER POLYTECHNIC INSTITUTE
    Inventors: Brian SCHULKIN, Xi-Cheng ZHANG, Thomas TONGUE, Jingzhou XU, Jian CHEN
  • Patent number: 7808636
    Abstract: Methods and apparatus for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices and controllers to maintain or vary the polarization of modulated signals as desired. The methods and apparatus are provided to characterize electromagnetic fields by directing the electromagnetic field and a probe beam upon an electro-crystal and detecting the modulation of the resulting probe beam. Detection of the modulation of the probe beam is practiced by detecting and comparing the polarization components of the modulated probe beam. Aspects of the invention may be used to analyze or detect explosives, explosive related compounds, and pharmaceuticals, among other substances. A compact apparatus, modular optical devices for use with the apparatus, sample holders, and radiation source mounts are also disclosed.
    Type: Grant
    Filed: January 11, 2008
    Date of Patent: October 5, 2010
    Assignee: Rensselaer Polytechnic Institute
    Inventors: Brian Schulkin, Xi-Cheng Zhang, Thomas Tongue, Jingzhou Xu, Jian Chen
  • Publication number: 20080239317
    Abstract: Methods and apparatus for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices and controllers to maintain or vary the polarization of modulated signals as desired. The methods and apparatus are provided to characterize electromagnetic fields by directing the electromagnetic field and a probe beam upon an electro-crystal and detecting the modulation of the resulting probe beam. Detection of the modulation of the probe beam is practiced by detecting and comparing the polarization components of the modulated probe beam. Aspects of the invention may be used to analyze or detect explosives, explosive related compounds, and pharmaceuticals, among other substances. A compact apparatus, modular optical devices for use with the apparatus, sample holders, and radiation source mounts are also disclosed.
    Type: Application
    Filed: January 11, 2008
    Publication date: October 2, 2008
    Applicant: RENSSELAER POLYTECHNIC INSTITUTE
    Inventors: Brian SCHULKIN, Xi-Cheng ZHANG, Thomas TONGUE, Jingzhou XU, Jian CHEN