Patents by Inventor Brian T. McNellis

Brian T. McNellis has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Quantitative analysis and visualization of spatial points
    Patent number: 10303738
    Abstract: A method for analyzing spatial point patterns and visualizing the results is presented. The method includes simulating at least one point set within a region using a point process, dividing the region into a plurality of elements, determining scores for both real data and simulated data for each element by weighting the point sets within a domain of a predetermined kernel. The method further includes comparing scores for each element, computing confidence intervals for at least one confidence level having a predetermined statistical significance; and providing a visualization to identify clusters and exclusion zones.
    Type: Grant
    Filed: June 29, 2016
    Date of Patent: May 28, 2019
    Assignee: Yale University
    Inventors: Derek K. Toomre, Brian T. McNellis
  • QUANTITATIVE ANALYSIS AND VISUALIZATION OF SPATIAL POINTS
    Publication number: 20160306773
    Abstract: A method for analyzing spatial point patterns and visualizing the results is presented. The method includes simulating at least one point set within a region using a point process, dividing the region into a plurality of elements, determining scores for both real data and simulated data for each element by weighting the point sets within a domain of a predetermined kernel. The method further includes comparing scores for each element, computing confidence intervals for at least one confidence level having a predetermined statistical significance; and providing a visualization to identify clusters and exclusion zones.
    Type: Application
    Filed: June 29, 2016
    Publication date: October 20, 2016
    Inventors: Derek K. Toomre, Brian T. McNellis
  • Quantitative analysis and visualization of spatial points
    Patent number: 9384170
    Abstract: A method for analyzing spatial point patterns and visualizing the results is presented. The method includes simulating at least one point set within a region using a point process, dividing the region into a plurality of elements, determining scores for both real data and simulated data for each element by weighting the point sets within a domain of a predetermined kernel. The method further includes comparing scores for each element, computing confidence intervals for at least one confidence level having a predetermined statistical significance; and providing a visualization to identify clusters and exclusion zones.
    Type: Grant
    Filed: February 10, 2014
    Date of Patent: July 5, 2016
    Assignee: Yale University
    Inventors: Derek K. Toomre, Brian T. McNellis
  • QUANTITATIVE ANALYSIS AND VISUALIZATION OF SPATIAL POINTS
    Publication number: 20140156223
    Abstract: A method for analyzing spatial point patterns and visualizing the results is presented. The method includes simulating at least one point set within a region using a point process, dividing the region into a plurality of elements, determining scores for both real data and simulated data for each element by weighting the point sets within a domain of a predetermined kernel. The method further includes comparing scores for each element, computing confidence intervals for at least one confidence level having a predetermined statistical significance; and providing a visualization to identify clusters and exclusion zones.
    Type: Application
    Filed: February 10, 2014
    Publication date: June 5, 2014
    Inventors: Derek K. Toomre, Brian T. McNellis