Abstract: A fulfillment test of a computing system having components is performed within a build-to-order test phase. Responsive to the fulfillment test failing, the component that most contributed to the fulfillment test failing is replaced, regardless of whether the given component was determined to be suspect or marginally defective pursuant to a fabrication test previously performed within a build-to-plan test phase. Any other component of that contributed to the fulfillment test failing and that was determined to be suspect or marginally defective pursuant to the fabrication test previously performed within the build-to-plan test phase is also replaced.

Abstract: An apparatus includes a system test module that initiates a system power test for a computer system. The computer system includes one or more power supplies that provide power to system components. The system power test includes determining power system characteristics under various loading conditions. The apparatus includes a configure module that configures a system component during the system power test. The system component uses a higher amount of power after being configured than in a previous un-configured condition. The apparatus includes a de-configure module that de-configures the system component during the system power test. The system component uses a lower amount of power after being de-configured than in a previous configured condition. The apparatus includes a diagnostic module that measures power system performance of the computer system during varying loading conditions caused by configuring and de-configuring one or more system components by the configure module and the de-configure module.

Abstract: An apparatus includes a system test module that initiates a system power test for a computer system. The computer system includes one or more power supplies that provide power to system components. The system power test includes determining power system characteristics under various loading conditions. The apparatus includes a configure module that configures a system component during the system power test. The system component uses a higher amount of power after being configured than in a previous un-configured condition. The apparatus includes a de-configure module that de-configures the system component during the system power test. The system component uses a lower amount of power after being de-configured than in a previous configured condition. The apparatus includes a diagnostic module that measures power system performance of the computer system during varying loading conditions caused by configuring and de-configuring one or more system components by the configure module and the de-configure module.

Abstract: A fulfillment test of a computing system having components is performed within a build-to-order test phase. Responsive to the fulfillment test failing, the component that most contributed to the fulfillment test failing is replaced, regardless of whether the given component was determined to be suspect or marginally defective pursuant to a fabrication test previously performed within a build-to-plan test phase. Any other component of that contributed to the fulfillment test failing and that was determined to be suspect or marginally defective pursuant to the fabrication test previously performed within the build-to-plan test phase is also replaced.

Abstract: A dynamic predictive model of a computing system fabrication test is constructed. The computing system fabrication test is conducted over test sectors. Each test sector corresponds to a different type of the computing system fabrication test, and includes test operations that are individually performed to effectuate the test sector. The dynamic predictive model generates a predicted completion time of each test operation of each test sector. Production output of the computing system fabrication test is forecast for a scenario corresponding to a particular computing system to undergo fabrication testing, by applying the dynamic predictive model to the scenario. The production output is forecast in that a total time remaining until the particular computing system to which the scenario corresponds has completed the fabrication testing is predicted.