Abstract: A current-mode D/A converter is described having variable output and offset control. According to an exemplary embodiment, a first D/A converter includes a number of first control inputs and an output capable of generating a first current proportional to a number of active first control inputs. A driver includes an input connected to the output of the first D/A converter, a number of second control inputs, and an output capable of generating a second current proportional to the first current based on a number of active second control inputs. A second D/A converter includes a number of third control inputs and an output capable of generating a third current proportional to a number of active third control inputs. Offset control circuitry includes an input connected to the output of the second D/A converter, an offset control input, and an output connected to the output of the driver.

Abstract: A current-mode D/A converter is described having variable output and offset control. According to an exemplary embodiment, a first D/A converter includes a number of first control inputs and an output capable of generating a first current proportional to a number of active first control inputs. A driver includes an input connected to the output of the first D/A converter, a number of second control inputs, and an output capable of generating a second current proportional to the first current based on a number of active second control inputs. A second D/A converter includes a number of third control inputs and an output capable of generating a third current proportional to a number of active third control inputs. Offset control circuitry includes an input connected to the output of the second D/A converter, an offset control input, and an output connected to the output of the driver.

Abstract: Conventional semiconductor integrated circuits have a problem that a test of an analog circuit requires considerable labor and cost. However, an address decoder for decoding an address input from the outside and generating an address signal, a storing unit for storing data for setting a parameter input from the outside in a location indicated by the address signal, and a selector for selecting data stored in the storing means instead of a signal value on a control bus at the time of testing an analog circuit are provided in a semiconductor integrated circuit, thereby allowing reductions in labor and costs.