Patents by Inventor Bruce Andrien, Jr.
Bruce Andrien, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7364913Abstract: A method and apparatus for Flow Injection Analysis (FIA) into Atmospheric Pressure Ion sources (API) including Electrospray (ES) and Atmospheric Pressure Chemical Ionization (APCI) sources whereby the sampling and spray needles are one and the same. The sampling and spray needle configured with an autoinjector apparatus or used in manual injection is introduced directly into a mating ES or APCI probe configured in an API source. Such a sampling and spray needle eliminates the need for injector valves, transfer lines or additional fluid delivery systems in FIA into API sources interfaced to mass spectrometers or other chemical analyzers. The use of a sampling and spray needle configuration reduces component costs, liquid dead volume, sample dilution effects, and minimizes cross contamination effects, solvent consumption and waste while increasing sample throughput.Type: GrantFiled: April 26, 2002Date of Patent: April 29, 2008Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., J. Fred Banks, James Boyle
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Patent number: 7189967Abstract: Multipole ion guides configured with one or more segments and positioned in a higher pressure vacuum region, are operated in mass to charge selection and ion fragmentation modes. Individual multipole ion guides are mounted in a linear assembly with no electrodes configured in between each multipole ion guide. At least a portion of each multipole ion guide mounted in a linear assembly resides in a vacuum region with higher background pressure. At least one ion guide can be configured to extend continuously from one vacuum stage into another. Individual sets of RF, +/?DC and secular frequency voltage supplies provide potentials to the rods of each multipole ion guide allowing the operation of ion transmission, ion trapping, mass to charge selection and ion fragmentation functions independently in each ion guide.Type: GrantFiled: January 17, 2006Date of Patent: March 13, 2007Assignee: Analytica of Branford, Inc.Inventors: Craig M. Whitehouse, Bruce A. Andrien, Jr., Erol E. Gulcicek
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Patent number: 6987264Abstract: Multipole ion guides configured with one or mote segments and positioned in a higher pressure vacuum region, are operated in mass to charge selection and ion fragmentation modes. Individual multipole ion guides are mounted in a linear assembly with no electrodes configured in between each multipole ion guide. At least a portion of each multipole ion guide mounted in a linear assembly resides in a vacuum region with higher background pressure. At least one ion guide can be configured to extend continuously from one vacuum stage into another. Individual sets of RF, +/? DC and secular frequency voltage supplies provide potentials to the rods of each multipole ion guide allowing the operation of ion transmission, ion trapping, mass to charge selection and ion fragmentation functions independently in each ion guide.Type: GrantFiled: June 16, 2004Date of Patent: January 17, 2006Assignee: Analytica of Branford, Inc.Inventors: Craig M. Whitehouse, Bruce A. Andrien, Jr., Erol E. Gulcicek
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Patent number: 6858437Abstract: A method and apparatus for Flow Injection Analysis (FIA) into Atmospheric Pressure Ion sources (API) including Electrospray (ES) and Atmospheric Pressure Chemical Ionization (APCI) sources whereby the sampling and spray needles are one and the same. The sampling and spray needle configured with an autoinjector apparatus or used in manual injection is introduced directly into a mating ES or APCI probe configured in an API source. Such a sampling and spray needle eliminates the need for injector valves, transfer lines or additional fluid delivery systems in FIA into API sources interfaced to mass spectrometers or other chemical analyzers. The use of a sampling and spray needle configuration reduces component costs, liquid dead volume, sample dilution effects, and minimizes cross contamination effects, solvent consumption and waste while increasing sample throughput.Type: GrantFiled: May 17, 2002Date of Patent: February 22, 2005Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., J. Fred Banks, James Boyle
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Patent number: 6753523Abstract: Multipole ion guides configured with one or more segments and positioned in a higher pressure vacuum region, are operated in mass to charge selection and ion fragmentation modes. Individual multipole ion guides are mounted in a linear assembly with no electrodes configured in between each multipole ion guide. At least a portion of each multipole ion guide mounted in a linear assembly resides in a vacuum region with higher background pressure. At least one ion guide can be configured to extend continuously from one vacuum stage into another. Individual sets of RF, +/− DC and secular frequency voltage supplies provide potentials to the rods of each multipole ion guide allowing the operation of ion transmission, ion trapping, mass to charge selection and ion fragmentation functions independently in each ion guide.Type: GrantFiled: September 6, 2002Date of Patent: June 22, 2004Assignee: Analytica of Branford, Inc.Inventors: Craig M. Whitehouse, Bruce A. Andrien, Jr., Erol E. Gulcicek
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Patent number: 6600155Abstract: A Time-Of-Flight mass spectrometer (1) is configured with a pulsing region (10) and electronic controls to cause the directing of ions to a surface (12) in the Time-Of-Flight pulsing region (10). The population of ions resulting from the collecting of said ions on or near said surface (12) is subsequently accelerated into the Time-Of-Flight tube (17) for mass to charge analysis. Ions produced away from said surface (12) can be directed to the surface (12) with high or low surface collisional energies. Higher energy ion collisions with the surface (12) can result in Surface Induced Dissociation fragmentation and the resulting ion fragment population can be mass analyzed. Mass analysis can be performed prior to directing the ions to the surface allowing MS/MS Time-Of-Flight mass analysis with SID.Type: GrantFiled: September 6, 2001Date of Patent: July 29, 2003Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., Michael A. Sansone, Allan G. Burt, Craig M. Whitehouse
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Patent number: 6593568Abstract: An Atmospheric Pressure Ion (API) source is configured for Electrospray (ES) and Atmospheric Pressure Chemical Ionization (APCI) operating modes. The API source includes a multipurpose heater assembly mounted in the API source chamber. The multipurpose heater supplies heat to the API chamber endplate, bath gas and entrance end of the capillary orifice into vacuum as well as supplying electrical connections to the API source elements. An additional heater is configured at the exit end of the capillary orifice into vacuum. With this configuration, the bath gas, endplate and capillary entrance temperature can be set independent of gas flow rate. The capillary exit and entrance temperatures can be set independently as well. The multipurpose endplate heater combined with the capillary exit heater allows the optimization of API source performance over a wide range of operating conditions and analytical applications.Type: GrantFiled: June 2, 1999Date of Patent: July 15, 2003Inventors: Craig M. Whitehouse, Bruce A. Andrien, Jr., Michael A. Sansone, Clement Catalano
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Patent number: 6573494Abstract: A single or multiple layer curved Electrospray sample introduction means has been configured in an Atmospheric Pressure Ion (API) source interfaced to a mass analyzer. Sample solutions introduced through curved or bent sample introduction Electrospray (ES) probes configured in an API source are sprayed from the ES probe tip at an angle which differs from centerline of the ES probe body. Single or multiple curved ES probes can be configured in an Atmospheric Pressure Ion source interfaced to mass analyzers. Curved ES probes can also be configured in an API source which includes Atmospheric Pressure Chemical ionization.Type: GrantFiled: December 4, 2001Date of Patent: June 3, 2003Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., Michael A. Sansone, Allan G. Burt, Craig M. Whitehouse
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Patent number: 6541768Abstract: Multiple sample introduction means have been configured in Atmospheric Pressure Ion sources which are interfaced to mass analyzers. Different samples can be introduced through multiple Electrospray (ES) or Atmospheric Pressure Chemical Ionization (APCI) probes individually or simultaneously and ionized. The gas phase ion mixture resulting from individual solutions sprayed from multiple ES or APCI probe inputs is mass analyzed. In this manner a calibration solution can be introduced through one ES or APCI probe while one or more sample solutions are spray from additional probes. Simultaneous spraying of calibration and sample solutions, results in an acquired mass spectrum containing peaks of ions with known molecular weights as well as sample related peaks. The calibration peaks can be used as an internal calibration standard during data analysis.Type: GrantFiled: March 21, 2001Date of Patent: April 1, 2003Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., Craig M. Whitehouse, Shida Shen, Michael A. Sansone
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Patent number: 6458597Abstract: A method and apparatus for Flow Injection Analysis (FIA) into Atmospheric Pressure Ion sources (API) including Electrospray (ES) and Atmospheric Pressure Chemical Ionization (APCI) sources whereby the sampling and spray needles are one and the same. The sampling and spray needle configured with an autoinjector apparatus or used in manual injection is introduced directly into a mating ES or APCI probe configured in an API source. Such a sampling and spray needle eliminates the need for injector valves, transfer lines or additional fluid delivery systems in FIA into API sources interfaced to mass spectrometers or other chemical analyzers. The use of a sampling and spray needle configuration reduces component costs, liquid dead volume, sample dilution effects, and minimizes cross contamination effects, solvent consumption and waste while increasing sample throughput.Type: GrantFiled: March 22, 2000Date of Patent: October 1, 2002Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., J. Fred Banks, James Boyle
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Patent number: 6337480Abstract: An Electrospray probe which includes a replaceable or disposable micron size diameter Electrospray tip used for low flow rate Electrospray has been developed. The Electrospray probe assembly combines the use of a low pressure gas and electric fields to initiate and sustain the Electrospray process at low liquid flow rates. The operational flow rates of this probe range from below 25 nL/min to over 1 &mgr;L/min, with total sample volume loaded ranging from less than 1 &mgr;L to over 20 &mgr;L. The Electrospray probe assembly includes axial and radial adjustment of the Electrospray tip position relative to the sampling orifice into vacuum and that tip position can be locked in place. The replaceable microtip can be safely removed from the Electrospray (ES) chamber without turning off high voltage within the ES chamber. Telescoping support ways have been included to prevent ES tip damage by guiding the Electrospray probe tip during removal from and insertion into the ES chamber.Type: GrantFiled: August 4, 2000Date of Patent: January 8, 2002Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., Craig M. Whitehouse, Michael A. Sansone, Denise M. Sauro, Glenn P. Whitehouse
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Patent number: 6326616Abstract: A single or multiple layer curved Electrospray sample introduction means has been configured in an Atmospheric Pressure Ion (API) source interfaced to a mass analyzer. Sample solutions introduced through curved or bent sample introduction Electrospray (ES) probes configured in an API source are sprayed from the ES probe tip at an angle which differs from centerline of the ES probe body. Single or multiple curved ES probes can be configured in an Atmospheric Pressure Ion source interfaced to mass analyzers. Curved ES probes can also be configured in an API source which includes Atmospheric Pressure Chemical ionization.Type: GrantFiled: October 15, 1998Date of Patent: December 4, 2001Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., Michael A. Sansone, Allan G. Burt, Craig M. Whitehouse
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Patent number: 6207954Abstract: Multiple sample introduction means have been configured in Atmospheric Pressure Ion sources which are interfaced to mass analyzers. Different samples can be introduced through multiple Electrospray (ES) or Atmospheric Pressure Chemical Ionization (APCI) probes individually or simultaneously and ionized. The gas phase ion mixture resulting from individual solutions sprayed from multiple ES or APCI probe inputs is mass analyzed. In this manner a calibration solution can be introduced through one ES or APCI probe while one or more sample solutions are spray from additional probes. Simultaneous spraying of calibration and sample solutions, results in an acquired mass spectrum containing peaks of ions with known molecular weights as well as sample related peaks. The calibration peaks can be used as an internal calibration standard during data analysis.Type: GrantFiled: September 11, 1998Date of Patent: March 27, 2001Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., Craig M. Whitehouse, Shida Shen, Michael A. Sansone
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Patent number: 6127680Abstract: An Electrospray probe which includes a replaceable or disposable micron size diameter Electrospray tip used for low flow rate Electrospray has been developed. The Electrospray probe assembly combines the use of a low pressure gas and electric fields to initiate and sustain the Electrospray process at low liquid flow rates. The operational flow rates of this probe range from below 25 nL/min to over 1 .mu.L/min, with total sample volume loaded ranging from less than 1 .mu.L to over 20 .mu.L. The Electrospray probe assembly includes axial and radial adjustment of the Electrospray tip position relative to the sampling orifice into vacuum and that tip position can be locked in place. The replaceable microtip can be safely removed from the Electrospray (ES) chamber without turning off high voltage within the ES chamber. Telescoping support ways have been included to prevent ES tip damage by guiding the Electrospray probe tip during removal from and insertion into the ES chamber.Type: GrantFiled: March 13, 1998Date of Patent: October 3, 2000Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., Craig M. Whitehouse, Michael A. Sansone, Denise M. Sauro, Glenn P. Whitehouse
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Patent number: 6040575Abstract: A Time-Of-Flight mass spectrometer is configured with a pulsing region and electronic controls to cause the directing of ions to a surface in the Time-Of-Flight pulsing region. The population of ions resulting from the collecting of said ions on or near said surface is subsequently accelerated into the Time-Of-Flight tube for mass to charge analysis. Ions produced away from said surface located in the pulsing region of a Time-Of-Flight mass spectrometer can be directed to the surface with high or low surface collisional energies. Higher energy ion collisions with the surface can result in Surface Induced Dissociation fragmentation and the resulting ion fragment population can be accelerated into Time-Of-Flight tube where the ions are mass to charge analyzed. Ion mass to charge selection can occur prior to directing ions to the pulsing region surface allowing MS/MS Time-Of-Flight mass analysis with SID.Type: GrantFiled: January 22, 1999Date of Patent: March 21, 2000Assignee: Analytica of Branford, Inc.Inventors: Craig M. Whitehouse, Bruce A. Andrien, Jr.