Abstract: Various apparatuses, methods, and systems are provided for cooling electronic components. For example, an apparatus includes an electronics enclosure having multiple ribs configured to separate electronic components. The apparatus also includes at least one fluid transport structure encased within the electronics enclosure. Each fluid transport structure includes multiple pipes and multiple flow channels. The flow channels are located within the ribs of the electronics enclosure, and the pipes are configured to transport cooling fluid to and from the flow channels. The fluid transport structure(s) and the electronics enclosure are formed from different materials. The at least one fluid transport structure can be resistant to corrosion caused by the cooling fluid, and the electronics enclosure can be susceptible to corrosion caused by the cooling fluid.

Abstract: Various apparatuses, methods, and systems are provided for cooling electronic components. For example, an apparatus includes an electronics enclosure having multiple ribs configured to separate electronic components. The apparatus also includes at least one fluid transport structure encased within the electronics enclosure. Each fluid transport structure includes multiple pipes and multiple flow channels. The flow channels are located within the ribs of the electronics enclosure, and the pipes are configured to transport cooling fluid to and from the flow channels. The fluid transport structure(s) and the electronics enclosure are formed from different materials. The at least one fluid transport structure can be resistant to corrosion caused by the cooling fluid, and the electronics enclosure can be susceptible to corrosion caused by the cooling fluid.

Abstract: A spectrometer system with structure defining an entrance aperture, dispersing structure, structure defining a plurality of exit apertures, detector structure associated with each exit aperture and a post disperser assembly disposed between an exit aperture and its detector structure.

Abstract: A positioning mechanism support structure mounted for movement between first and second predetermined positions in a spectroanalytical system includes relative to a reference member by a plurality of stabilizing coupling assemblies, and drive structure for producing motion of the support structure relative to the reference structure between first and second stop structures that define the first and second predetermined positions, respectively. Interlock structure responds to the drive force generated by the drive structure and de-energizes the drive structure in response to the drive force applied to that support structure exceeding a predetermined threshold value.

Abstract: A spectroanalytical system with a plurality of radiation sources and structure defining an analysis region that includes means for thermally energizing a sample material to be analyzed. Analysis beam path defining structure includes means for passing a radiation beam from a radiation source along the analysis beam path through the analysis region for modification by sample material in the analysis region. Analysis structure includes radiation dispersing structure arranged to disperse radiation in the analysis beam path with a spectrum and a radiation sensor. First transducer structure moves the dispersing structure relative to the beam path to apply a selected portion of the radiation dispersed by the dispersing structure to the radiation sensor.