Patents by Inventor Bruce C. NOLL

Bruce C. NOLL has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of conducting an X-ray diffraction-based crystallography analysis
    Patent number: 9372163
    Abstract: A method of X-ray diffraction-based analysis for determining the structure of a crystal sample is provided. The method comprises conducting pre-experiment to collect a first set of diffraction images including reflections at corresponding intensities. The method also comprises conducting a main experiment to collect a second set of diffraction images, the diffraction images of the second set including the reflections with higher relative intensities than those produced during the first experiment, at least some of the diffraction images of the second set including topped reflections resulting from detector saturation. The method also includes a step of replacing intensities of the topped reflections from the second set of images with intensities obtained for the corresponding reflections from the first set of images.
    Type: Grant
    Filed: January 28, 2014
    Date of Patent: June 21, 2016
    Inventors: Michael Ruf, Joerg Kaercher, Bruce C Noll
  • METHOD OF CONDUCTING AN X-RAY DIFFRACTION-BASED CRYSTALLOGRAPHY ANALYSIS
    Publication number: 20150276629
    Abstract: A method of X-ray diffraction-based analysis for determining the structure of a crystal sample is provided. The method comprises conducting pre-experiment to collect a first set of diffraction images including reflections at corresponding intensities. The method also comprises conducting a main experiment to collect a second set of diffraction images, the diffraction images of the second set including the reflections with higher relative intensities than those produced during the first experiment, at least some of the diffraction images of the second set including topped reflections resulting from detector saturation. The method also includes a step of replacing intensities of the topped reflections from the second set of images with intensities obtained for the corresponding reflections from the first set of images.
    Type: Application
    Filed: January 28, 2014
    Publication date: October 1, 2015
    Inventors: Michael RUF, Joerg KAERCHER, Bruce C. NOLL