Abstract: A system is described that analyzes timing of a design and conditionally replaces values of a cell to lower total power within circuit paths having a positive timing margin. The system includes a computing device that includes a memory for storing modules and a processor that is operable to execute the modules. The modules cause the processor to conditionally replace a first semiconductor characteristic with a second semiconductor characteristic associated with a cell in a path of a circuit design and estimating a delay and a slack of the path based upon the first semiconductor characteristic. The modules also cause the processor to determine whether the second semiconductor characteristic causes a timing violation with respect to the path and causes conditional replacement of the second semiconductor characteristic with a third semiconductor characteristic until the timing violation is removed.

Abstract: The disclosure provides leakage power recovery that considers side transition times of multi-input cells. In one embodiment, a leakage power recovery system is disclosed that includes: (1) a power recovery module that considers side transitions when making a first conditional replacement of a cell in a path of a circuit design with a lower leakage cell and estimates delays and slack of the at least one path of the circuit design, and (2) a speed recovery module that makes a second conditional replacement of a slower lower leakage cell of the path with a higher leakage cell when there is a timing violation with respect to the path, determines if any other cells of the at least one path has a slower input transition and makes a third conditional replacement of a driver thereof to a higher leakage cell when the driver is one of the slower lower leakage cells.

Abstract: Methods of designing an integrated circuit and an apparatus for designing an integrated circuit are disclosed herein. In one embodiment, a method includes: (1) generating a block model of the integrated circuit according to a first timing budget, (2) developing a top level implementation of the integrated circuit according to the first timing budget, (3) determining a second timing budget for the integrated circuit based on the block model and (4) modifying the block model and the top level implementation employing the second timing budget to provide a progressive block model and a modified top level implementation.

Abstract: The disclosure provides leakage power recovery that considers side transition times of multi-input cells. In one embodiment, a leakage power recovery system is disclosed that includes: (1) a power recovery module that considers side transitions when making a first conditional replacement of a cell in a path of a circuit design with a lower leakage cell and estimates delays and slack of the at least one path of the circuit design, and (2) a speed recovery module that makes a second conditional replacement of a slower lower leakage cell of the path with a higher leakage cell when there is a timing violation with respect to the path, determines if any other cells of the at least one path has a slower input transition and makes a third conditional replacement of a driver thereof to a higher leakage cell when the driver is one of the slower lower leakage cells.

Abstract: Described embodiments provide a delay cell for a complementary metal oxide semiconductor integrated circuit. The delay cell includes a delay stage to provide an output signal having a programmable delay through the delay cell. The delay cell has a selectable delay value from a plurality of delay values, where the cell size and terminal layout of the delay cell are relatively uniform for the plurality of delay values. The delay stage includes M parallel-coupled inverter stages. Each parallel-coupled inverter stage includes N pairs of stacked PMOS transistors and stacked NMOS transistors. The N transistor pairs have configurable source-drain node connections between a drain node and a source node of each transistor in the pair, wherein the selectable delay value corresponds to a configuration of the configurable source-drain node connections to adjust a delay value of each of the M inverter stages.

Abstract: Described embodiments provide a delay cell for a complementary metal oxide semiconductor integrated circuit. The delay cell includes a delay stage to provide an output signal having a programmable delay through the delay cell. The delay cell has a selectable delay value from a plurality of delay values, where the cell size and terminal layout of the delay cell are relatively uniform for the plurality of delay values. The delay stage includes M parallel-coupled inverter stages. Each parallel-coupled inverter stage includes N pairs of stacked PMOS transistors and stacked NMOS transistors. The N transistor pairs have configurable source-drain node connections between a drain node and a source node of each transistor in the pair, wherein the selectable delay value corresponds to a configuration of the configurable source-drain node connections to adjust a delay value of each of the M inverter stages.

Abstract: A system and method for clock optimization to achieve timing signoff in an electronic circuit and an EDA tool that embodies the system or the method. In one embodiment, the system includes: (1) a clock cell identifier/sorter configured to identify at least some clock cells in a clock network associated with an electronic circuit design and sort the cells according to breadth, (2) a slack analyzer associated with the clock cell identifier/sorter and configured to identify flops that are downstream of the cells and determine a worst setup and hold timing slack thereof and (3) a clock cell delay adjuster associated with the slack analyzer and configured to adjust delays of the cells subject to the worst setup and hold timing slack.

Abstract: A system and method for clock optimization to achieve timing signoff in an electronic circuit and an EDA tool that embodies the system or the method. In one embodiment, the system includes: (1) a clock cell identifier/sorter configured to identify at least some clock cells in a clock network associated with an electronic circuit design and sort the cells according to breadth, (2) a slack analyzer associated with the clock cell identifier/sorter and configured to identify flops that are downstream of the cells and determine a worst setup and hold timing slack thereof and (3) a clock cell delay adjuster associated with the slack analyzer and configured to adjust delays of the cells subject to the worst setup and hold timing slack.

Abstract: A leakage power recovery system and method, and a electronic design automation (EDA) tool incorporating either or both of the system and the method.

Abstract: A leakage power recovery system and method, and a electronic design automation (EDA) tool incorporating either or both of the system and the method. In one embodiment, the timing signoff tool includes: (1) a power recovery module configured to make first conditional replacements of cells in at least one path in a circuit design with lower leakage cells and estimate a delay and a slack of the at least one path based on the first conditional replacement and (2) a speed recovery module associated with the power recovery module and configured to determine whether the first conditional replacements cause a timing violation with respect to the at least one path and make second conditional replacements with higher leakage cells until the timing violation is removed.