Abstract: The invention provides for protection of life safety, property and the liability thereof, by means of a intrinsically safe unpressurized storage tank water heater while producing hot pressurized water. The design addresses, with effect, convection, radiation, conduction and evaporative heat energy losses. Heat lost returned as usable hot water resulting in ultra-low standing loss. The stationary water medium prevents sedimentation, fouling of the heating element and gases expelled. Being dielectrically isolated, the medium may also be treated to further reduce corrosion. The design allows for a quick recovery rate and provides adjustable volume of hot water, being stackable, stage able, renewable, repairable and recyclable.

Abstract: The invention provides for protection of life safety, property and the liability thereof, by means of a intrinsically safe unpressurized storage tank water heater while producing hot pressurized water. The design addresses, with effect, convection, radiation, conduction and evaporative heat energy losses. Heat lost returned as usable hot water resulting in ultra-low standing loss. The stationary water medium prevents sedimentation, fouling of the heating element and gases expelled. Being dielectrically isolated, the medium may also be treated to further reduce corrosion. The design allows for a quick recovery rate and provides adjustable volume of hot water, being stackable, stage able, renewable, repairable and recyclable.

Abstract: Packaged integrated circuit devices include an oscillator circuit having a resonator (e.g., quartz crystal, MEMs, etc.) associated therewith, which is configured to generate a periodic reference signal. A built-in self-test (BIST) circuit is provided, which is selectively electrically coupled to first and second terminals of the resonator during an operation by the BIST circuit to test at least one performance characteristic of the resonator, such as at least one failure mode. These test operations may occur during a built-in self-test time interval when the oscillator circuit is at least partially disabled. In this manner, built-in self-test circuitry may be utilized to provide an efficient means of testing a resonating element/structure using circuitry that is integrated within an oscillator chip and within a wafer-level chip-scale package (WLCSP) containing the resonator.

Abstract: An integrated circuit device includes a pair of serially-connected crystal resonators arranged as a first crystal resonator, which is configured to preferentially support a fundamental resonance mode in response to an input signal, and a second crystal resonator, which is configured to preferentially support a third or higher overtone resonance mode in response to a signal generated at an output terminal of the first crystal resonator. A negative impedance converter (NIC) is also provided, which has an input terminal electrically connected to an input terminal of the first crystal resonator and an output terminal electrically connected to one of the output terminal of the first crystal resonator and the output terminal of the second crystal resonator. The NIC may be a CMOS-based NIC that is devoid of inductive reactance from a passive inductor.