Abstract: Polarization dependent loss (PDL) of an optical component is computed in a deterministic method that requires only four measurements, each having a unique input state of polarization.

Abstract: Previous efforts to measure polarization dependent loss of optical components have been limited in uncertainty to more than 0.01 dB. This is because the power meter used in a test set contains polarization dependent loss which adversely affects the final readings. It is here disclosed that an unpumped erbium doped fiber can convert a received polarized signal into unpolarized amplified spontaneous emission of a longer wavelength if the fiber is of sufficient length to absorb the received signal. By locating the inventive unpumped erbium doped fiber upstream of the power meter of a test set, the polarized signal to the power meter is coverted to an unpolarized signal and, therefore, the polarization dependent loss of the power meter can not influence the measurement obtained.

Abstract: In an embodiment for obtaining accurate noise figure measurements for any degree of saturation of an optical amplifier, a polarizer is located at the output of the optical amplifier. The amplified spontaneous noise (ASE) produced by an optical amplifier is not polarized, whereas the amplified signal has a well defined state of polarization which is preferably linear. If the amplified signal is not linearly polarized, it can be rendered linearly polarized in one direction by means of a polarization controller located downstream of the polarizer. By setting the polarizer to have its state of polarization orthogonal to that of the linearly polarized amplified signal, the spectral density of the ASE from the polarizer can be measured without associated distortion due to the signal. By sequentially adjusting the polarization controller to minimize and then maximize the signal which it passes, sequential measurements of the ASE spectral density and gain of the optical amplifier can be obtained.

Abstract: Surface defects on a substrate (11) are detected by raster scanning the surface (10) with a laser beam (12). Light scattered by the substrate at a large angle with respect to a normal to the surface is collected by at least two bundles of light guide fibers (21,22) located nearly in the plane of the substrate surface, one fiber bundle parallel to the laser scan with the other positioned perpendicularly thereto. The light collected by each bundle is separately processed by a computer (20) to determine the size, in three dimensions, and orientation of defects on the substrate surface. In a preferred embodiment, four light guide fiber bundles (31,32,33 and 34) are used around the substrate surface with the outputs being separately processed.