Patents by Inventor Bruce McFadden

Bruce McFadden has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Localizing a temperature of a device for testing
    Patent number: 7330041
    Abstract: Wafers or other structures comprising a plurality of dies or devices are tested at non-ambient temperatures by inducing a first heat flux through a substantial portion of a surface of the structure to modify a temperature of the structure and inducing a second heat flux through a local area of a surface of the structure, proximate the device under test, to modify the temperature the device under test.
    Type: Grant
    Filed: March 21, 2005
    Date of Patent: February 12, 2008
    Assignee: Cascade Microtech, Inc.
    Inventor: Bruce McFadden
  • Localizing a temperature of a device for testing
    Publication number: 20050287685
    Abstract: Wafers or other structures comprising a plurality of dies or devices are tested at non-ambient temperatures by inducing a first heat flux through a substantial portion of a surface of the structure to modify a temperature of the structure and inducing a second heat flux through a local area of a surface of the structure, proximate the device under test, to modify the temperature the device under test.
    Type: Application
    Filed: March 21, 2005
    Publication date: December 29, 2005
    Inventor: Bruce McFadden