Abstract: Automatic semiconductor part handler. In one aspect the handler includes a source of parts and a transfer mechanism for transferring a part from the source to a belt assembly. The belt assembly includes a belt, a belt displacement controller, and an image forming device for forming an image of the part with respect to a desired end point. The belt displacement controller is coupled to the belt to move the belt based upon the image of the part with respect to the desired end point, thereby positioning the part in a precise location with respect to the direction of motion of the input belt.

Abstract: Automatic seminconductor part handler. In one aspect the handler includes a source of parts and a transfer mechanism for transferring a part from the source to a belt assembly. The belt assembly includes a belt, a belt displacement controller, and an image forming device for forming an image of the part with respect to a desired end point. The belt displacement controller is coupled to the belt to move the belt based upon the image of the part with respect to the desired end point, thereby positioning the part in a precise location with respect to the direction of motion of the input belt.

Abstract: Substantial improvements in photorefractive device lifetimes are provided by control of electron migration which results in the decay of gratings in photorefractive materials due to diffusion and other effects. A new class of photorefractive devices using compensating electronic and ionic gratings having relatively low efficiency but nonetheless usable gratings is provided by arranging the gratings to be reflective in a wavelength band outside the photo-excitation band of the photorefractive material, as by using an infrared operating wavelength. Longer lifetimes in high efficiency gratings are achieved by constant or periodic illumination of photorefractive materials to assure uniform charged distribution of electrons and maintenance of the ionic backbone grating.

Abstract: A transport medium for orderly, in-process transportation of assembled electrical devices during backend processing. A carrier tray is comprised of a plurality of carrier units held in coplanar relationship by a frame. Preferably the carrier units are polyethersulfone inserts latchable into a coordinate matrix of carrier unit holes defined by a metallic sheet. Each carrier unit carries one or more electrical devices in device seats which expose a top and a bottom of each device sufficiently to eliminate any necessity for removing the devices from the medium during all backend processing. Each carrier unit has a standardized perimeter but a core which is adapted to a particular device size and form, and there can be as many different carrier units as there are different device forms and sizes, but all carrier units fit into a standard carrier unit hole. The frames and carrier units are robotically manipulable.

Abstract: A station for testing electrical devices under elevated and depressed temperature conditions, said devices being transported through and tested in the station while held in coordinated planar sets. The planarly arranged sets of devices are sequentially placed upon a platen movable along three mutually orthogonal axes. A test head has a plurality of electrical device contactors in planar arrangement corresponding to the arrangement of the devices sets. At least one axis along which the platen moves is orthogonal to a general plane of the contactors for establishing parallel contact between the devices and the contactors. During testing each of the leads of the devices resting upon the platen are electrically contacted by a contactor. The leads of the full set of electrical devices can be contacted simultaneously, or the leads can be contacted in subsets depending upon the capacity of the test head.

Abstract: An involuted track is defined by a spiralled wall normal to a planar surface. The planar surface is rotated coaxially with respect to the wall while the wall remains stationary with respect to the surface. Objects are loaded into the track through entrance, conducted along the track by means of the rotating planar surface, and leave the track via an exit. En route, the heat level of the objects are altered to bring them to a desired temperature by the time they reach the exit. The objects are preferably heated or cooled by a forced fluid of suitable temperature.

Abstract: A plurality of shuttle means receive untested devices from a feed track and position the devices in electrical contact with a contactor for testing. The shuttle means also discard tested devices via an exit track. Each shuttle means has a test track and a by-pass track. When all the shuttle means are in a load position, each track acts as a segment in a continuous track between the feed track and the exit track. When all the shuttle means are in a test position, each by-pass track acts as a segment in a continuous track between the feed track and the exit track. As long as each shuttle is either in its load position or test position, there is a continuous track between the feed track and the exit track, the segments of the track comprising either by-pass tracks, test tracks or any combination thereof. Defective devices can be pulled from test and discarded while others are undergoing testing.