Patents by Inventor Bruce R. Kowalski

Bruce R. Kowalski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5559728
    Abstract: A method for calibrating two-dimensional responses measured on multiple instruments or on a single instrument under different operating conditions. The method calculates two separate banded diagonal transformation matrices using the responses of a common standard sample to simultaneously correct for the response channel shift and intensity variations in both dimensions or orders. The two transformational matrices are estimated from a set of simultaneous non-linear equations via the Gauss-Newton method. The effects of noise and transformation matrix bandwidth on the standardization performance were studied through computer simulation. From computer simulation and experimental data, it was found that the design of the standard sample is crucial for the parameter estimations and response standardization.
    Type: Grant
    Filed: May 3, 1994
    Date of Patent: September 24, 1996
    Assignee: University of Washington
    Inventors: Bruce R. Kowalski, Yongdong Wang
  • Patent number: 5459677
    Abstract: A technique for transferring a multivariant calibration model from a reference analytical instrument to a target analytical instrument that may be a different instrument, or the same instrument at a later time. In a "direct" approach, a plurality of transfer samples are selected, and a plurality of measurements are made for each transfer sample using the reference instrument, producing a reference instrument response for each sample. These measurements are repeated for the target instrument, to produce a target instrument response for each transfer sample. One then generates transfer coefficients capable of performing a multivariate estimation of the reference instrument responses for the transfer samples from the target instrument responses for those samples. The transfer coefficients may then be used to convert a target instrument response for an unknown sample into the equivalent response for the reference instrument.
    Type: Grant
    Filed: June 24, 1991
    Date of Patent: October 17, 1995
    Assignee: Board of Regents of the University of Washington
    Inventors: Bruce R. Kowalski, David J. Veltkamp, Yong D. Wang
  • Patent number: 4631687
    Abstract: A method and apparatus for analyzing an unknown sample to produce information corresponding to individual components of the sample. The information may then be used to identify and quantify the components. The method of the present invention contemplates subjecting the sample to a plurality of separation processes to produce a corresponding plurality of distinct spatial distributions of the sample. The separation processes could include two or more chromatographic processes in which the stationary phases have different separating characteristics. For each distribution, a set of properties (sample set) is determined at a plurality of positions along that distribution. In one embodiment, the set of properties comprises the absorbance of electromagnetic radiation at a plurality of wavelengths. The sample sets for each process are analyzed to determine one or more basic sets capable of representing all the sample sets for that process.
    Type: Grant
    Filed: November 3, 1983
    Date of Patent: December 23, 1986
    Assignee: Rohrback Technology Corporation
    Inventors: Bruce R. Kowalski, Gilson H. Rohrback