Patents by Inventor Bruker Nano, Inc.

Bruker Nano, Inc. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method And Apparatus Of Tuning A Scanning Probe Microscope
    Publication number: 20130125269
    Abstract: An apparatus and method of automatically determining an operating frequency of a scanning probe microscope such as an atomic force microscope (AFM) is shown. The operating frequency is not selected based on a peak of the amplitude response of the probe when swept over a range of frequencies; rather, the operating frequency is selected using only peak data corresponding to a TIDPS curve.
    Type: Application
    Filed: November 12, 2012
    Publication date: May 16, 2013
    Applicant: Bruker Nano, Inc.
    Inventor: Bruker Nano, Inc.