Abstract: Apparatus includes an X-ray source 10, a wavelength dispersive X-ray detector for measuring X-ray fluorescence (XRF) and an energy dispersive X-ray detector 14 again for measuring X-ray fluorescence. Selected elements are measured using the wavelength dispersive process to reduce the overall measurement time compared with using only one of the two detectors or compared to a simple approach of measuring low atomic number elements with the wavelength dispersive detector and high atomic number elements with the energy dispersive detector. The selection can take place dynamically, in particular on the basis of the results of the energy-dispersive detector.

Abstract: Apparatus includes an X-ray source 10, a wavelength dispersive X-ray detector for measuring X-ray fluorescence (XRF) and an energy dispersive X-ray detector 14 again for measuring X-ray fluoresence. Selected elements are measured using the wavelength dispersive process to reduce the overall measurement time compared with using only one of the two detectors or compared to a simple approach of measuring low atomic number elements with the wavelength dispersive detector and high atomic number elements with the energy dispersive detector. The selection can take place dynamically, in particular on the basis of the results of the energy-dispersive detector.

Abstract: A device (1; 1a) for the examination of at least one material sample (3; 3a, 3b, 3c) which can be inserted into the device (1; 1a) and is irradiated by means of electromagnetic waves (4), notably X-rays; in the measuring position the material sample (3; 3a, 3b, 3c) can be subjected to irradiation by means of the electromagnetic waves (4) and during a change of sample the beam path (4) can be interrupted by means of a closure element (8) which can be moved into the beam path. The device is constructed in such a manner that the closure element (8) is provided with a reference sample (9) on its side which faces the rays (4) in a manner such that a reference measurement can be performed thereon during a change of sample.

Abstract: A device (1; 1a) for the examination of at least one material sample (3; 3a, 3b, 3c) which can be inserted into the device (1; 1a) and is irradiated by means of electromagnetic waves (4), notably X-rays; in the measuring position the material sample (3; 3a, 3b, 3c) can be subjected to irradiation by means of the electromagnetic waves (4) and during a change of sample the beam path (4) can be interrupted by means of a closure element (8) which can be moved into the beam path. The device is constructed in such a manner that the closure element (8) is provided with a reference sample (9) on its side which faces the rays (4) in a manner such that a reference measurement can be performed thereon during a change of sample.

Abstract: In the case of simultaneous diffraction and fluorescence measurements in an apparatus for X-ray analysis comprising only one X-ray tube, a problem is encountered in that due to the presence of the collimators required for the fluorescence measurements only a very low X-ray power reaches the detectors, so that very long measuring times and/or an unfavorable signal-to-noise ratio occur. As a result, the detection limit for given measurements (low concentration of an element and/or light elements to be detected) becomes too high or the use of a (large and expensive) high-power X-ray tube is required. The invention utilizes a line focus tube 10 in combination with a single-slit collimator 14 for irradiating the sample 2, the fluorescence section 40 being constructed so as to have a plane or cylindrical analysis crystal 42 in combination with a location-sensitive detector 44. The diffraction measurements are performed by means of a conventional diffraction arrangement 24.